A lighting for defect inspection of sheet-shaped objects includes: an elongated light application unit configured to apply illumination light to a sheet-shaped object, the light application unit extending in a second direction that is orthogonal to a first direction on a surface of the sheet-shaped object; a first light shielding unit that is located on a light path from the light application unit to the sheet-shaped object, the first light shielding unit having light shielding sections and opening sections alternately arranged; and a second light shielding unit that is located between the first light shielding unit and the sheet-shaped object, the second light shielding unit having light shielding sections and opening sections alternately arranged in a direction parallel to the second direction.

This application discloses an inspection method and an inspection machine for a display panel. The inspection method includes the steps of: taking a picture of a to-be-inspected display panel to obtain a to-be-inspected image of the to-be-inspected display panel; removing high-frequency information in the to-be-inspected image to obtain a high-frequency-removed image; calculating a difference between the to-be-inspected image and the high-frequency-removed image to obtain a difference image; making a determination regarding the difference image by comparing the difference image with a preset threshold, determining that the display panel fails the inspection if the difference image exceeds the preset threshold, and determining that the display panel passes the inspection if the difference image does not exceed the preset threshold.

A surface inspection system for inspecting the surface of sheet elements present in an inspection area: The system includes two light sources arranged adjacent each other on opposite sides of an illumination plane, and a camera for capturing line images of the inspection area along a viewing plane. The illumination plane and the viewing plane are arranged on opposite sides of a median plane perpendicular to an inspection plane. The angle between the illumination plane and the median plane is the same as the angle between the viewing plane and the median plane. In a method of using the system, the first light source illuminates the sheet element before the second light sources does. An image evaluation unit compares the captured line images with each other.

An optical measurement apparatus including: an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generated, wherein the calculation unit calculates a transmittance spectrum or a reflectance spectrum of the measurement subject based on a first criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is not present on the measurement area, a second criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the non-measurement area, and a measurement spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is present on the measurement area.

In an embodiment an apparatus includes an image acquisition device with at least one camera, the image acquisition device configured to acquire a multi-line section of a recording region and an evaluation device configured to process at least two sub-areas of the multi-line section as one strip image each and compare at least two strip images of a test pattern to each other in a validation mode to check whether deviations of the strip images are detected.

The defect inspection device includes a robot arm including a hold unit for holding an object and a driving unit for moving the object; a first camera unit photographing an exterior of the object; an illumination unit irradiating light to the exterior of the object; and a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit.

A high-speed method and system for inspecting and sorting a stream of unidentified mixed parts are provided. The system includes a pair of inspection stations each of which includes a vision-based robotic subsystem including a robot configured to pick up a self-supporting part and place the part on a fixtureless rotary stage. A second subsystem optically measures a profile and features of the part during part rotation. A processor is operable to compare the profile and features of the part with the profile and corresponding features of stored templates to identify a matching template. A mechanism including a part sorter directs unidentified parts and parts having an unacceptable geometric dimension or defect to a reject part area and directs identified parts having acceptable geometrical dimensions and no significant defects to good part areas.

One pixel unit including at least one light receiving element of a light receiving element array (photodiode array) and a light source have a one-to-one correspondence, and only when the light source emits light, the light beam is detected by at least one light receiving element (one pixel unit) corresponding to the light source. An illumination optical system includes a light guiding means for guiding to an inspection object by reducing an interval between optical axes of light beams emitted from a plurality of light sources in an arrangement direction of a plurality of the light sources.

A lighting device (23) irradiates a web under conveyance with light. The lighting device includes a light source (43), and an irradiation port (61) configured to open linearly in a widthwise direction of the web at an end portion facing the web. The irradiation port (61) is formed between first and second parallel portions (62b, 63b) where a first plate member (62) and a second plate member (63) parallelly face each other. The web under conveyance is irradiated with linear light. It is possible to provide a lighting device capable of irradiating only an inspection region of a sheet or a web with light.

This disclosure is directed to techniques for utilizing various sensors and models to evaluate glass as it progresses through the tempering process in order to ensure that the tempered glass is of a proper quality. If, according to any of the various sensor measurements, the tempered glass is not of a proper quality, the system may automatically adjust one or more settings in any of the various components of the system in order to bring future panes of tempered glass back to having the proper quality. The system can measure for any number of glass characteristics or system characteristics, including edge quality, vertical flatness, haze, washing process variables, thermal imaging, distortion, blower information, production data, and furnace process data.