There is presented a system and method for detecting mobile device fault conditions, including detecting fault conditions by software operating on the mobile device. In one embodiment, the present invention provides for systems and methods for using a neural network to detect, from an image of the device, that the mobile device has a defect, for instance a cracked or scratched screen. Systems and methods also provide for, reporting the defect status of the device, working or not, so that appropriate action may be taken by a third party.

Provided is a display apparatus including: a display module; a housing accommodating the display module; a transparent substrate disposed on a front surface of the display module and installed in the housing; a transmitter disposed on one end of the transparent substrate and generating light; a receiver installed on the other end of the transparent substrate to face the transmitter in a first direction, and receiving the light emitted from the transmitter; and a receiver installed on the other end of the transparent substrate to face the transmitter in a first direction, and receiving the light emitted from the transmitter; and a control unit driving the display module, and determining whether the transparent substrate is damaged based on a signal received from the receiver.

The present invention provides an array substrate and a display panel. The array substrate includes a fan-out region, an array test region having multiple array test pads and multiple test switches, and a cell test region having multiple cell test pads and a dummy pad. A control end of each test switch is connected to the dummy pad, and the array test pads are connected to the first signal lines through the test switches. According to a high-level signal or a low-level signal received by the dummy pad, the test switch is turned on or off to conduct an array test or a cell test.

A display device failure detection method, device and system are disclosed. The display device failure detection method includes that: at least one detection picture image acquired by an image acquisition device when a target display device regularly displays a detection picture sequence is received, and at least one image to be detected is determined from the at least one detection picture image (S11); at least one region to be detected corresponding to at least one display region of the target display device in the at least one image to be detected is determined, and image data of the at least one region to be detected is processed to obtain at least one image processing result (S13); and whether a display exception occurs to the target display device is judged according to the image processing result (S15).

A method of detecting defects in a structure sample comprising a thin film layer and a sacrificial later is disclosed. The method comprises exposing the thin film layer to a vapour phase etchant, obtaining an image of the thin film layer and analysing the image. The vapour phase etchant enhances any defects present in the thin film layer by passing through the defect and etching a cavity within the sacrificial layer. The cavity undercuts the thin film layer resulting in a stress region surrounding the defect. Defects which were not originally detectable may be made detectable after exposure to the vapour phase etchant. A vapour phase etchant has the advantage of being highly mobile such that it can access defects that a liquid phase etchant might not. Furthermore, unlike a liquid phase etchant, a vapour phase etchant can be used to test a sample non-destructively.

A method of inspecting a display substrate including pixel patterns provided in pixel areas disposed in a display area in a first direction and a second direction may include obtaining a captured image of the pixel patterns of the display substrate, grouping pixels included in the captured image by grouping at least two pixels disposed in the first direction into a pixel group, designating each pixel group included in the captured image as a target pixel group, comparing pixel patterns of the target pixel group with pixel patterns of an adjacent pixel group positioned in a third direction with respect to the target pixel group, and determining whether the pixel patterns of the target pixel group are defective.

A display panel inspection jig includes a stage comprising a seating area in which a display panel is to be disposed for inspection thereof, and a peripheral area surrounding the seating area, and comprising an uneven upper surface and a lower surface, the seating area of the stage being provided with an opening, a first supporter disposed on a first portion of the uneven upper surface of the stage, and a first barrier disposed on a second portion of the uneven upper surface of the stage. The first portion of the uneven upper surface being at the seating area and spaced apart from the opening, and the second portion of the uneven upper surface is at the peripheral area. The first barrier has an uneven lower surface such that the uneven lower surface of the first barrier and the uneven upper surface of the stage are fitted with each other.

A display inspection system for inspecting a light beam emitted from a panel with pixels positioned at several focal planes is provided. The display inspection system includes a focus tunable lens adjustable in a focal distance for focusing at the panel, a first sensing unit for receiving the light beam, a reduced aberration optical system arranged between the focus tunable lens and the first sensing unit for focusing at the first sensing unit, and one or more optical elements placed within a back focal length of the reduced aberration optical system. The reduced aberration optical system comprises a first serial cascade lens group of a first aplanatic lens and a first doublet lens for correcting an optical aberration. The first aplanatic lens and the first doublet lens are co-configured that the back focal length is extended in a manner that the light beam is incident to the first sensing unit.

The present invention relates to an automatic display pixel inspection system and method and, particularly, to an automatic inspection system and method for inspecting defects occurring in the process of assembling semiconductor light emitting devices in a fluid.

A system for analyzing a sample includes an illumination source with a plurality of transmitting optical fibers optically coupled to the illumination source and a detector with a plurality of receiving optical fibers optically coupled to the detector. The system further includes a plurality of probes coupled to respective ones of the plurality of transmitting optical fibers and respective ones of the plurality of receiving optical fibers. The plurality of probes are configured to illuminate respective portions of a surface of the sample and configured to receive illumination reflected, refracted, or radiated from the respective portions of the surface of the sample. The system may further include one or more switches and/or splitters configured to optically couple respective ones of the plurality of transmitting optical fibers to the illumination source and/or configured to optically couple respective ones of the plurality of receiving optical fibers to the detector.