A detection method and device of a display panel are disclosed. The detection method includes: selecting at least two comparison points for a detection point with a set comparison pitch, the detection point corresponding to a separation cell or a pixel cell; detecting a first defect and a second defect of a display substrate according to gray scale values of the detection point and 2 comparison points, wherein the first defect includes a normal separation cell and a pixel defect and the second defect includes a pixel defect and a defected separation cell; and determining the defected separation cell according to the first defect and the second defect.

A method and a system of measuring a display panel, and a display panel. The display panel includes a backlight module and a liquid crystal panel. The method of measuring the display panel includes determining a target position on a display panel that meets a preset condition, wherein the target position includes a first target position and a second target position, and a connecting line of the first target position and the second target position is parallel to a row of sub-pixels. The method further includes measuring brightness information at the target position under a constant applied voltage, wherein the brightness information includes brightness information of the backlight module and brightness information of the display panel, and a display efficiency of the display panel is calculated according to the brightness information.

The present disclosure illustrates an inspection apparatus for a display panel and a testing method for display panel. The inspection apparatus includes a platform, a feeding device, a rotatable bearing stage, an optical panel inspection device, a discharging device, a rotation driving device and a transfer device. The platform includes a support frame having a loading-and-unloading area and an inspection area. The feeding device transports the display panel along a feeding direction. The rotation driving device includes a rotation axis and a rotation driving mechanism. The rotation axis has an end fixed at a central part of a bottom surface of the rotatable bearing stage, and the rotation driving mechanism can rotate the rotation axis. The display panel placed on the rotatable bearing stage can be exchanged between the loading-and-unloading area and the inspection area when the rotatable bearing stage is rotated.

An image acceleration processing device including a field programmable gate array (FPGA) processing platform; and a personal computer (PC). The FPGA processing platform includes: a first fiber interface configured to receive configuration parameters and test commands, and to output test results; a second fiber interface configured to exchange data with the PC; a third fiber interface configured to receive image data and output the configuration parameters and the test commands; a fourth fiber interface configured to control the generation of a screen lighting signal; and a fifth fiber interface configured to control an input/output (IO) light source.

An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit.

An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.

System (100) for measuring the spatial distribution of the spectral emission of a measurement zone (2) of an object (1), comprising: a first objective (202); means (204) for selecting a portion of an image formed by the first objective; a diaphragm (208); light-dispersing means (210) located in the vicinity of the diaphragm and allowing the light coming from the selecting means to be dispersed; a second objective (206) placed between the selecting means and the diaphragm, interacting with the first objective so that the aperture of the diaphragm is optically conjugated with the measurement zone by the first and second objectives and so that the measurement zone. According to the invention, the first objective forms an image on a predetermined Fourier surface on which each point corresponds to an emission direction of the object for one particular wavelength, the selecting means have a selection surface shaped depending on the predetermined Fourier surface, and the selecting means are placed on the predetermined Fourier surface.

The present invention is a test mechanism for structural defect detection of a test object (400). Accordingly, said test mechanism is characterized in that a light source (200) is provided which accommodates pluralities of light elements (210) which can emit light in at least two different colors and which changes the light emitting condition of said light elements (210) in accordance with the signal received from a processor unit (310), an image capturing device (100) is provided which captures the image of the test object (400) positioned on a test surface (220) defined on the light elements (210) and connected to the processor unit (310) in a manner transmitting the captured image to the processor unit (310) as input; the processor unit (310) is configured in a manner providing changing of the light emitting condition of light elements (210) in a manner mentioning approval/defect for the light source (200) in accordance with the difference of the captured image from an object model (329) of the memory unit (320).

Systems and methods for measuring characteristics of an electronic visual display are disclosed herein. A method configured in accordance with embodiments of the present technology for measuring an electronic visual display can include, for example, analyzing a region of interest (“ROI”) in an image taken of at least a portion of the electronic visual display. The method determines a center and bounds of the ROI that are, in general, floating point values rather than whole pixel locations. The method then samples whole imaging device pixels and/or fractional imaging device pixels within the bounds of the ROI and determines whether the pixels and/or fractional pixels fall within, outside, or partially within the ROI. Depending on the position of the pixels and/or fractional pixels relative to the ROI, the pixels and/or fractional pixels can be weighted and/or summed to determine an overall image characteristic for the ROI.

The present invention discloses a display defect detection method, apparatus, and device for a display screen. The method includes: identifying a suspected defective pixel from a first image of a front side of a tested display screen, where the first image is shot when the tested display screen is in a solid-color display state; identifying an external smudgy pixel from a second image of the front side of the tested display screen, where the second image is shot when the tested display screen is in a die-out state and the front side is illuminated by a diffuse reflection light source; detecting, for each suspected defective pixel identified from the first image, whether a pixel at a same location in the second image is the external smudgy pixel; and if no, determining the suspected defective pixel as a display defective pixel.