A detection method for a display panel motherboard and a display panel motherboard. The detection method for the display panel motherboard including a plurality of display panels arranged in a matrix includes: dividing the display panel motherboard into a plurality of detection regions, at least one detection region corresponding to at least a portion of each display panel in a same string of display panels; performing a defect detection on patterns in all the display panels in the at least one detection region.

Exemplary embodiments of the present invention provide an optical film attachment system which is connected to a downstream device and includes a panel conveyance path, the optical film attachment system including: a connection unit which connects the panel conveyance path and the downstream device and conveys the panel; a first inspection unit which is positioned on the panel conveyance path and finds out whether the panel with the attached optical film has a defect; and a second inspection unit which is positioned at a position spaced apart from the panel conveyance path and re-inspects a defect-determined panel determined as a defective panel by inspection by the first inspection unit; in which the connection unit includes a main conveyance path in which a first conveyance unit and a second conveyance unit are sequentially arranged in a conveyance direction of the panel conveyance path, a first auxiliary conveyance path which connects the first conveyance unit and the second inspection unit and is bypassed from the main conveyance path, and a second auxiliary conveyance path which is connected to the second conveyance unit and bypassed from the main conveyance path, the control unit controls the connection unit so that the defect-determined panel is conveyed from the first conveyance unit to the second inspection unit along the first auxiliary conveyance path when the panel inspected by the first inspection unit is determined as a defective panel, and a good-quality-determined panel determined as a good-quality panel by the first inspection unit is conveyed from the second conveyance unit along the second auxiliary conveyance path when it is difficult to convey the good-quality-determined panel to the downstream device.

A display device failure detection method, a display device failure detection device, a display device failure detection system and a computer-readable medium are disclosed provided. The display device failure detection method includes that: at least one detection picture image acquired by an image acquisition device when a target display device regularly displays a detection picture sequence is received, and at least one image to be detected is determined (S11); at least one region to be detected corresponding to at least one display region of the target display device in the at least one image to be detected is determined, and image data of the at least one region to be detected is processed to obtain at least one image processing result (S13); and whether a display exception occurs to the target display device is judged according to the image processing result (S15).

An inspecting device includes: an image acquiring unit which acquires a light-emitting surface image as a photographed image of the light-emitting surface; an inspecting unit which sets an inspecting range in a position in the light-emitting surface image in which the failure may appear, generates a one-dimensional luminance profile representing change in a luminance value along the first side in the inspecting range, detects an extreme value in the luminance profile, calculates an evaluation value for evaluating the difference between adjacent extreme values, and determines the presence or absence of the failure on the basis of the evaluation value; and an output unit which output information obtained by the inspecting unit.

The present disclosure relates to an apparatus and method for detecting display panel defects and a microscope. The apparatus for detecting display panel defects comprises: a switch component connected to a microscope; a detection component, which is disposed on the switch component and has a first visual area, the detection component being configured to detect a position of a microscopic defect in a display panel; and a marking component, which is disposed on the switch component and has a second visual area with a smaller area than the first visual area, the marking component being configured to mark the position of the microscopic defect in the display panel, wherein the switch component is configured to rotate the marking component to a position of the detection component and mark a position of the microscopic defect by the marking component after the detection component detects the position.

Systems and methods for automatically grading a user device are provided. Such systems and methods can include (1) a lighting element positioned at an angle relative to a platform, (2) an imaging device positioned at the angle relative to the platform such that light emitted from the lighting element and a field of view of the imaging device form a right angle where the light emitted from the lighting element and the field of view meet at a user device when the user device is positioned at a predetermined location on the platform, and (3) control circuitry that can activate the lighting element, instruct the imaging device to capture an image of a screen of the user device while the user device is at the predetermined location and is being illuminated by the first lighting element, and parse the image to determine whether the screen is damaged.

An inspection method includes: spectroscopically separating light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and imaging spectroscopic images of each of the wavelengths; inspecting a shape of the inspection object using the spectroscopic image of a predetermined wavelength among the wavelengths imaged in the imaging of the spectroscopic images of each of the wavelengths; and inspecting a color of the inspection object using the spectroscopic images of each of the wavelengths imaged. The predetermined wavelength is determined so that a maximum light quantity of the light from the inspection object in the corresponding spectroscopic image at the predetermined wavelength is equal to or higher than maximum light quantities in the other spectroscopic images at the other wavelengths.

A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.

The present disclosure illustrates an inspection apparatus for a display panel and a testing method for display panel. The inspection apparatus includes a platform, a feeding device, a rotatable bearing stage, an optical panel inspection device, a discharging device, a rotation driving device and a transfer device. The platform includes a support frame having a loading-and-unloading area and an inspection area. The feeding device transports the display panel along a feeding direction. The rotation driving device includes a rotation axe and a rotation driving mechanism. The rotation axe has an end fixed at a central part of a bottom surface of the rotatable bearing stage, and the rotation driving mechanism can rotate the rotation axe. The display panel placed on the rotatable bearing stage can be exchanged between the loading-and-unloading area and the inspection area when the rotatable bearing stage is rotated.

The method and apparatus for detecting a peripheral circuit of a display screen provided by the present disclosure receive a quality detection request sent by a console deployed on a production line of the peripheral circuit of the display screen, where the quality detection request includes a peripheral circuit image of the display screen captured by an image capturing device on the production line of the peripheral circuit of the display screen; zoom in or out on the peripheral circuit image of the display screen to obtain an image to be detected a size of which is consistent with an input size requirement of a defect detection model; input the image to be detected into the defect detection model to obtain a defect detection result; and determine quality of the peripheral circuit of the display screen according to the defect detection result.