An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.

The disclosure provides a method for detecting a display screen peripheral circuit, by receiving a quality detection request sent by a console deployed on a production line of the display screen peripheral circuit, where the quality detection request includes an image of the display screen peripheral circuit captured by an image capturing device on the production line of the display screen peripheral circuit; enlarging or reducing the image of the display screen peripheral circuit to obtain an image to be detected, where the defect detection model is obtained by using a historical image of a defective display screen peripheral circuit to perform object detection FAST RCNN algorithm training; inputting the image to be detected into the defect detection model to obtain a defect detection result; and determining, according to the defect detection result, quality of a display screen peripheral circuit corresponding to the image of the display screen peripheral circuit.

Provided are a panel adsorption device and an automatic adsorption method using the same. A position of a liquid crystal panel on a platform is determined by providing a plurality of image capture devices above the platform, and then correspondingly sets the vacuum adsorption hole to a negative pressure state to firmly locate the liquid crystal panel on the platform. Meanwhile, the platform can be compatible with panels of various models and sizes.

Embodiments of the present disclosure relate to measurement systems and methods for diffracting light. The measurement system includes a stage, an optical arm, and one or more detector arms. The method of diffracting light includes a method of diffracting light is provided, including projecting light beams having wavelength .sub.laser to a first zone of a first substrate at the fixed beam angle .sub.0 and the maximum orientation angle .sub.max, obtaining a displacement angle , determining a target maximum beam angle .sub.t-max, wherein .sub.t-max=.sub.0+, and determining a test grating pitch P.sub.t-grating by a modified grating pitch equation P.sub.t-grating=.sub.laser/(sin .sub.t-max+sin .sub.0). The measurement system and method allow for measurement of nonuniform properties of regions of an optical device, such as grating pitches and grating orientations.

Exemplary embodiments of the present invention provide an optical film attachment system which is connected to a downstream device and includes a panel conveyance path, the optical film attachment system including: a connection unit which connects the panel conveyance path and the downstream device and conveys the panel; a first inspection unit which is positioned on the panel conveyance path and finds out whether the panel with the attached optical film has a defect; and a second inspection unit which is positioned at a position spaced apart from the panel conveyance path and re-inspects a defect-determined panel determined as a defective panel by inspection by the first inspection unit; in which the connection unit includes a main conveyance path in which a first conveyance unit and a second conveyance unit are sequentially arranged in a conveyance direction of the panel conveyance path, a first auxiliary conveyance path which connects the first conveyance unit and the second inspection unit and is bypassed from the main conveyance path, and a second auxiliary conveyance path which is connected to the second conveyance unit and bypassed from the main conveyance path, the control unit controls the connection unit so that the defect-determined panel is conveyed from the first conveyance unit to the second inspection unit along the first auxiliary conveyance path when the panel inspected by the first inspection unit is determined as a defective panel, and a good-quality-determined panel determined as a good-quality panel by the first inspection unit is conveyed from the second conveyance unit along the second auxiliary conveyance path when it is difficult to convey the good-quality-determined panel to the downstream device.

Embodiments of the present disclosure relate to measurement systems and methods for diffracting light. The measurement system includes a stage, an optical arm, and one or more detector arms. The method of diffracting light includes a method of diffracting light is provided, including projecting light beams having wavelength .sub.laser to a first zone of a first substrate at the fixed beam angle .sub.0 and the maximum orientation angle .sub.max, obtaining a displacement angle , determining a target maximum beam angle .sub.t-max, wherein .sub.t-max=.sub.0=, and determining a test grating pitch P.sub.t-grating by a modified grating pitch equation P.sub.t-grating=.sub.laser/(sin .sub.0). The measurement system and method allow for measurement of nonuniform properties of regions of an optical device, such as grating pitches and grating orientations.

An image acceleration processing device including a field programmable gate array (FPGA) processing platform; and a personal computer (PC). The FPGA processing platform includes: a first fiber interface configured to receive configuration parameters and test commands, and to output test results; a second fiber interface configured to exchange data with the PC; a third fiber interface configured to receive image data and output the configuration parameters and the test commands; a fourth fiber interface configured to control the generation of a screen lighting signal; and a fifth fiber interface configured to control an input/output (IO) light source.

Provided are a panel adsorption device and an automatic adsorption method using the same. A position of a liquid crystal panel on a platform is determined by providing a plurality of image capture devices above the platform, and then correspondingly sets the vacuum adsorption hole to a negative pressure state to firmly locate the liquid crystal panel on the platform. Meanwhile, the platform can be compatible with panels of various models and sizes.

A detecting device and a detecting method thereof and a detecting apparatus are provided. The detecting device includes a stage, a light detection unit and a first, light, source, the stage includes a bearing surface for bearing an object to be detected, the light detection unit is located on a side of the stage, the first light source is located on a side of the stage that is opposite to the light detection unit, and light emitted from the, first light source is at least partially emitted to the light detection unit.

Systems and methods for measuring characteristics of an electronic visual display are disclosed herein. A method configured in accordance with embodiments of the present technology for measuring an electronic visual display can include, for example, analyzing a region of interest (ROI) in an image taken of at least a portion of the electronic visual display. The method determines a center and bounds of the ROI that are, in general, floating point values rather than whole pixel locations. The method then samples whole imaging device pixels and/or fractional imaging device pixels within the bounds of the ROI and determines whether the pixels and/or fractional pixels fall within, outside, or partially within the ROI. Depending on the position of the pixels and/or fractional pixels relative to the ROI, the pixels and/or fractional pixels can be weighted and/or summed to determine an overall image characteristic for the ROI.