The present disclosure provides a dual mode detection method, controller and system, which relates to the technical field of radiation detection. The dual mode detection method of the present disclosure includes: determining a ratio of neutron to X-ray differential cross sections of an inspected object, according to X-ray object detection data, X-ray object-free detection data, neutron object detection data, and neutron object-free detection data; determining a substance type of the inspected object according to a correspondence between the ratio of neutron to X-ray differential cross sections of the inspected object and the substance type.

A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.

A scanner comprises an electromagnetic wave source; and a detector positioned to measure emissions from the electromagnetic wave source, wherein the electromagnetic wave source comprises a first technology, and the electromagnetic wave source is interchangeable with a second electromagnetic wave source comprising a second technology and/or wherein the detector comprises a first technology, and the detector is interchangeable with a second detector comprising a second technology. The scanner can comprise a storage medium having instructions stored thereon to perform a method for training the scanner for an inspection application, the method comprising operating the electromagnetic wave source to generate electromagnetic wave emissions at a plurality of combinations of parameters; moving a conveyor belt to expose product having a plurality of contaminants of different sizes to the emissions generated at more than one combination of parameters; recording attenuated emissions that pass through the product at more than one combination of parameters; and selecting a combination of parameters to use when inspecting for the contaminant.

A data processing device is applied to an X-ray system which irradiates an object with continuous X-rays and processes data detected by a photon counting X-ray detection device. An n-dimensional vector corresponding to each of “n” energy regions set a spectrum of the continuous X-rays is calculated for each detector pixel based on the data. For each search region virtually set up based on one or more detector pixels, the n-dimensional vectors at the detector pixels belonging to each search pixel are mutually vector added in the n-dimensional space. The n-dimensional representative vector representing each of the plurality of search regions is calculated. Based on the representative vectors and an unit region having a desired size virtually set in a material space with coordinate information of the degree of attenuation of the X-rays, the information indicating the amount, type and properties of the material of the object is obtained.

Provided is a tube weld X-ray inspection device for inspecting an abnormality, such as a tube welding part crack, of a heat exchanger by using X-rays.

An X-ray inspecting apparatus, with which X-rays of a broad energy band can be detected while manufacturing costs are suppressed, comprises an X-ray radiation device, a line sensor assembly, and other components. The line sensor assembly has a plurality of detection units and other components. Each detection unit has a scintillator, a detection main body including a plurality of elements disposed thereon, and a ceramic substrate supporting the scintillator and detection main body. In the line sensor assembly, the plurality of detection units etc. are aligned in a forward-backward direction so that the scintillators and the detection main bodies of the detection units etc. are aligned without gaps with the scintillators and detection main bodies of adjacent detection units.

A computed tomography (CT) imaging apparatus includes a radiation source configured to emit X-rays; a plurality of photon-counting detectors configured to detect X-rays emitted by the radiation source and generate a photon counting signal based on the detected X-rays; and processing circuitry to obtain a kV-waveform used by the radiation source to generate the X-rays during a scan of an object, and adjust at least one energy threshold dividing the photon counting signal into a plurality of spectra bins in accordance with the obtained kV-waveform.

A computed tomography (CT) imaging apparatus includes a radiation source configured to emit X-rays; a plurality of photon-counting detectors configured to detect X-rays emitted by the radiation source and generate a photon counting signal based on the detected X-rays; and processing circuitry to obtain a kV-waveform used by the radiation source to generate the X-rays during a scan of an object, and adjust at least one energy threshold dividing the photon counting signal into a plurality of spectra bins in accordance with the obtained kV-waveform.

An imaging control apparatus obtains a plurality of images at different radiation energies, the images having been obtained as a result of irradiating a subject with radiation whose energy changes during one shot, and detecting, a plurality of times, the radiation that has passed through the subject during the one shot; generates an energy subtraction image by performing energy subtraction processing using a plurality of images; and generates a difference image using a plurality of generated energy subtraction images.

An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.