G01N23/20033

Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements

The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELECTRODE OF AN ELECTROCHEMICAL CELL, AT OPERATING TEMPERATURE AND UNDER CURRENT
20210109043 · 2021-04-15 ·

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELECTRODE OF AN ELECTROCHEMICAL CELL, AT OPERATING TEMPERATURE AND UNDER CURRENT
20210109043 · 2021-04-15 ·

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

SYSTEM FOR SAMPLE STORAGE AND SHIPPING FOR CRYOELECTRON MICROSCOPY

A system for storing and shipping samples for cryo-electron microscopy. The system comprising a cassette puck and support platform that accepts commercial cryo-EM sample cassettes and is compatible to a substantial extent with tools used in cryocrystallography. The system can also work with existing Cryo-EM storage and transport puck and cane systems. The cassette puck comprising a receptacle for holding one or more cassettes and a plurality of holes and grooves. The holes and grooves being configured for use with other tools such as tongs, support platforms, and canes.

Device for clamping and controlling the temperature of planar samples for x-ray diffractometry

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

Device for clamping and controlling the temperature of planar samples for x-ray diffractometry

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS OR LARGER CONDUCTIVE SAMPLES

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

Modular specimen holders for high pressure freezing and X-ray crystallography of a specimen

A modular specimen holder (10) for high pressure freezing and/or X-ray crystallography of a specimen has a specimen holding element (100) and an extension element (200) connectable with and separable from each other; the specimen holding element (100) including a tubule (120) adapted to hold the specimen and a base element (110) adapted to hold the tubule (120), wherein a distance from a bottom of the base element (110) to a top of the tubule (120) is a first distance (d1); the extension element (200) being connectable with the base element (110), wherein, when the extension element (200) and the base element (110) are connected with each other, a second distance (d2) from a bottom of the extension element (200) to the top of the tubule (120) is larger than the first distance (d1).

Modular specimen holders for high pressure freezing and X-ray crystallography of a specimen

A modular specimen holder (10) for high pressure freezing and/or X-ray crystallography of a specimen has a specimen holding element (100) and an extension element (200) connectable with and separable from each other; the specimen holding element (100) including a tubule (120) adapted to hold the specimen and a base element (110) adapted to hold the tubule (120), wherein a distance from a bottom of the base element (110) to a top of the tubule (120) is a first distance (d1); the extension element (200) being connectable with the base element (110), wherein, when the extension element (200) and the base element (110) are connected with each other, a second distance (d2) from a bottom of the extension element (200) to the top of the tubule (120) is larger than the first distance (d1).

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.