Patent classifications
G
G01
G01N
33/00
G01N33/0004
G01N33/0009
G01N33/0062
G01N33/0067
G01N33/0067
System and method for performing industrial processes across facilities
12613231
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2026-04-28
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A system and method is described herein for performing at least one industrial process at each facility of a plurality of facilities based on an industrial process standard generated by reducing functional, and trend line outlier bias in data of one or more process parameters as measured by one or more sensors. Outliers are removed from the data set through an objective method. Bias is determined based on absolute, relative error, or both. Error values are computed from the data, model coefficients, or trend line estimates. Outlier data records are removed when the error values are greater than or equal to one or more criteria.