A connector inspection apparatus includes a first main body part, a terminal, and a connector module. The connector module includes a second main body part, a contact part, and a connector. The connector is a counterpart connector of a connector to be inspected. In a state in which the connector module is attached to the first main body part, the terminal and the contact part are in contact with each other and the terminal is electrically connected with a contact pin of the connector via the contact part.

A medium or high voltage electrical device includes a housing, a central conductor provided within the housing, and a sacrificial cap configured for mounting on the housing. The sacrificial cap includes an outer housing, an insulated body, and a sacrificial conductor provided within the insulated body, wherein the sacrificial conductor electrically communicates with the central conductor within the housing when the sacrificial cap is mounted on the housing. A voltage test point terminal is provided within the insulated body and accessible via the outer housing of the sacrificial cap to capacitively couple with the sacrificial conductor. The sacrificial cap includes a portion configured to be physically severed to confirm that the electrical connector is de-energized.

A transmission line arrangement having a first end and a second end, the transmission line arrangement being configured to transmit a signal between the first end and the second end, the transmission line arrangement comprising a signal conductor extending between the first end and the second end of the transmission line arrangement, a first conducting sheet and a second conducting sheet positioned on two opposing sides of the signal conductor, an insulating material separating the first and second conducting sheets from the signal conductor and a plurality of pieces of conducting material extending between the first and second conducting sheets and arranged at different positions between the first and second ends of the transmission line arrangement, wherein the pieces of conducting material and the conducting sheets are arranged to substantially surround the signal conductor for at least part of its length between the first and second ends of the transmission line arrangement.

An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.

A test plug has a housing with a first side that has inputs for receiving various connection types, a second side having blades and fingers extending thereform, and a base. The first side extends at an oblique angle from the base, providing accessibility to the input connections thereon. The second side is capable of a removable connection to a test switch in which the fingers separate the current jack contacts before the electrical connection between the test plug blades and test switch jaws is made.

A wafer test system includes a cabinet housing multiple instruments, a test head having multiple pin modules, and cable connecting at least some of the instruments to the pin modules. The cabinet has at least one front door, left and right side panels, a rear door, a ceiling unit, and a bottom unit. Each of the instruments has a front surface, left and right side surfaces, and a rear surface. At least some of the instruments each include at least one first connection terminal. The cabinet further includes a first space defined between the at least one front door and the front surface of each of the instruments, and a second space defined between the rear door and the front surface of each of the instruments. The first space and the second space are separated in the cabinet to separate intake air and exhaust air of the instruments.

A testing apparatus includes a pressing device and a chip carrying device. The chip carrying device includes a circuit board and a plurality of electrically connecting units. Each electrically connecting unit includes a main body disposed on the circuit board to form an accommodating slot, a lift structure, a supporting structure, an elastic assembly sandwiched between the lift structure and the supporting structure, and a plurality of probe assemblies, the latter four of which are arranged in the accommodating slot. The lift structure has a chip receiving slot for receiving a chip. When the chip receiving slot receives the chip and the lift structure is not pressed, the probe assemblies are not connected to the chip. When the chip receiving slot receives the chip and the lift structure is pressed by the pressing device to move toward the accommodating slot, the probe assemblies are connected to the chip.

Disclosed is a device for detecting a short circuit of an H bridge, the device including a printed circuit including a power trace connecting the H bridge to a first connection area intended to be connected to a first multipin connector connected to a power supply terminal of a power source, and an earth trace connecting the H bridge to a second connection area intended to be connected to a second multipin connector connected to a reference terminal of the power source. The device further includes a measurement unit for measuring two potentials at two different points of the first connector, as well as two potentials at two different points of the second connector, and a processor configured to detect a short circuit of the H bridge by comparison of the potentials.

The methods and apparatus allow one user to test cable continuity using a wire-configurable directional connector. The methods and apparatus may transmit a first and second voltage pulse through a first and second wire of a cable under test, respectively, having a wire-configurable directional connector attached. Both voltage pulses travel through the wire-configurable directional connector. The first voltage pulse selectively leaves at least one of the second wire and a third wire of the cable under test and the second voltage pulse selectively leaves the third wire. The methods and apparatus may store a pre-determined pattern of a returning voltage pulse specific to the cable under test, and determine a state of the first, second, and third wires in response to receiving the first and second voltage pulses.

The present disclosure relates to a measurement arrangement including a sensor, an electronics module, a signal cable having a cable circuit, and a superordinate unit. The sensor is releasably pluggable to the electronics module which itself is releasably pluggable to the signal cable. The signal cable is connected with the superordinate unit. The plug connections between the sensor and the electronics module and between the electronics module and the signal cable may be galvanically isolated. The sensor outputs digital data in a first format to the electronics module. The electronics module outputs digital data in a second format to the signal cable. The superordinate unit is configured to receive and to process the digital data in the second format.