A connector includes: a casing that has a housing space, a through hole communicating the housing space with an external space, and an electric wire insertion hole, and that holds a connection terminal connected to a counterpart device; a wiring material that has a distal end part inserted into the housing space via the electric wire insertion hole and a conductor part exposed from a covering at the distal end part, the exposed conductor part being curved at a curved part and connected to the connection terminal; and a conductive voltage detection terminal that has a connection part connected to the exposed conductor part at a position closer to the covering than a curved part and a voltage detection part facing the through hole, and that is provided by branching from a conduction path between the connection terminal and the conductor part.

Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a support surface configured to support a device under test. The probe systems further include a lower enclosure extending from the lower surface of the platen and an upper enclosure extending from the upper surface of the platen. The upper enclosure includes a side wall that defines a side wall aperture, and the side wall and the platen define an intersection angle of at least 30 degrees and at most 60 degrees. The probe systems also include a manipulator, a probe shaft arm, a probe assembly, a test head, and an electrical conductor.

The present document describes an assembly for connecting a test unit to a wiring harness or equipment to be tested, and a method for testing using the assembly. The assembly may comprise a test box unit, a generic mate-in interface, and at least one specific mate-in interface. The generic mate-in interface is for connection to the test box unit on one end, and to the at least one specific mate-in interfaces at the other end. The mate-in interfaces are for testing different existing wiring harnesses or equipment. Each one of the generic and specific mate-in interfaces has a specific ID comprised in an ID support on the electrical path of the generic mate-in interface and the specific mate-in interface, for example, on any one of the end connectors of the interfaces or on their wiring. Information relating to the IDs of the connectors and the contact configuration of each mate-in interface is stored in a database of the test unit for identifying the appropriate test contacts that should be used for testing.

An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a first end (23a) and a second end (23b). Suitably, the interconnections elements (23) are made of a conductive elastomer that fills the openings (22) of the support (21), each of the interconnection elements (23) forming a conductive channel between different and opposing faces (Fa, Fb) of the support (21).

In a method of testing a semiconductor wafer including a scribe line and multiple dies, the method includes implementing a first landing pad on the scribe line, and implementing a first interconnect on the scribe line and between the first landing pad and a first cluster of the dies, thereby coupling the first landing pad to the first cluster of dies. The method also includes performing the testing of the first cluster of dies using automated test equipment (ATE) coupled to a probe tip by contacting the first landing pad with the probe tip, and applying an ATE resource to the first cluster of dies.

The present disclosure relates to an automation sensor measuring system comprising a plurality of sensors, wherein for at least one of the sensors a display signal at a connection element display unit can be adapted and/or is adapted to a display signal relating to the respective sensors at the superordinate display/input unit, whereby the respective sensor can be assigned to a display at the superordinate display/input unit. The present disclosure further relates to a method for assigning a sensor in an automation sensor measuring system.

A holder includes a substrate, at least one first fastener and a pressure block. The substrate includes a top surface, a primary recess recessed from the top surface, at least one first side-recess recessed from the top surface, wherein the first side-recess neighbors and communicates with the primary recess, and a channel recess recessed from the top surface, wherein the channel recess neighbors and communicates with the primary recess, and the first side-recess and the channel recess are positioned at opposite sides of the primary recess. The first fastener is disposed in the first side-recess, wherein the first fastener has a top substantially leveled with the top surface of the substrate. The pressure block is disposed in the channel recess, wherein the pressure block has a top substantially leveled with the top surface of the substrate.

A wire connector for a vehicle may include: a male connector having male terminals; a female connector having female terminals into which the male terminals of the male connector are inserted; and a circuit portion through which a current supplied by a continuity tester flows. The continuity tester can detect whether the male connector and the female connector are assembled without error.

An electrical probe structure includes a conductive cylinder, a first electrical connecting port and a probe assembly. The conductive cylinder for being fixed to the base plate has thereinside a sliding tunnel. The first electrical connecting port is electrically connected to the conductive cylinder. The at least one flexible conductive tube is furnished inside the sliding tunnel. The at least one probe assembly includes a first needle cylinder and a first probe. The first needle cylinder, slidably penetrating the conductive cylinder, electrically contacts the at least one flexible conductive tube so as to have the first needle cylinder to electrically connect the first electrical connecting port via the at least one flexible conductive tube and the conductive cylinder. The first probe is mounted and electrically connected to the first needle cylinder.

The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.