Disclosed is a device for detecting a short circuit of an H bridge, the device including a printed circuit including a power trace connecting the H bridge to a first connection area intended to be connected to a first multipin connector connected to a power supply terminal of a power source, and an earth trace connecting the H bridge to a second connection area intended to be connected to a second multipin connector connected to a reference terminal of the power source. The device further includes a measurement unit for measuring two potentials at two different points of the first connector, as well as two potentials at two different points of the second connector, and a processor configured to detect a short circuit of the H bridge by comparison of the potentials.

An inspection device with improved inspection accuracy of electrical characteristics of a component, including a holding table, a pair of measuring elements configured to grip a component held on the holding table 32 and measure electrical characteristics of the component; and a relative movement device configured to relatively move the holding table and the pair of measuring elements. In a state in which component is clamped by the pair of measuring elements, by moving holding table, component and the holding table are separated by at least a set value, and in that state the electrical characteristics are measured. Therefore, even if the holding table is made of a conductive material, effects on the component are reduced, and the electrical characteristics can be measured accurately.

There is provided an intermediate connection member which is provided between a first member having a plurality of first terminals and a second member having a plurality of second terminals and electrically connects the plurality of first terminals and the plurality of second terminals, respectively, the intermediate connection member including: a pogo block including a main body and a plurality of pogo pins provided in the main body, the pogo block configured to connect the plurality of first terminals and the plurality of second terminals, respectively; and a pogo frame having an insertion hole into which the pogo block is inserted, wherein the pogo block has a positioning pin, and the pogo frame has a positioning hole into which the positioning pin is inserted, and wherein the pogo block is positioned with respect to the pogo frame when the positioning pin is inserted into the positioning hole.

An adapter for testing electrical equipment can include a first receptacle end having at least one first coupling feature, where the at least one first coupling feature is configured to couple to a power source and a first electrical device, where the first receptacle end is configured to receive from the power source at least one first test signal and send the at least one first test signal to the first electrical device. The adapter can also include a sensing device configured to receive at least one first response signal from the first electrical device, where the at least one first response signal is in response to and based on the first electrical device receiving the at least one first test signal.

A method for insulating an RC voltage divider includes installing at least one part of an active part of the voltage divider within an inner housing and insulating the at least one part of the active part with an insulating oil within the inner housing, hermetically sealing the inner housing, enclosing the inner housing in an outer housing and filling a space between the inner housing and the outer housing with an insulating gas. A system for insulating an RC voltage divider is also provided.

A contact-making device (10) is used for a resistance measurement on a test object (30). The test object (30) comprises a threaded hole (31), which has an internal thread (32). The contact-making device (10) is designed to be mechanically coupled to the internal thread (32) of the threaded hole (31). The contact-making device (10) comprises a first contact (11) and a second contact (12), in order to make electrical contact with the test object (30) at, at least, two points when the contact-making device (10) is mechanically coupled to the internal thread (32). The first contact (11) and the second contact (12) are electrically insulated from one another by an insulating material (15-17) in the contact-making device (10).

An electrical panel adapter for an enclosure that is formed of at least one panel includes a main unit having a front portion and a rear portion. The rear portion is positioned inside the enclosure and includes a first plurality of electrical connections adapted to connect to electrical wires and/or equipment located inside the enclosure. The front portion extends through an aperture in the at least one panel and includes a second plurality of electrical connections adapted to connect to one or more electrical devices located outside the enclosure for measurement of both voltage and current inside the enclosure. The second plurality of electrical connections are electrically coupled to the first plurality of electrical connections. The electrical panel adapter enables electrical devices outside the enclosure to be electrically coupled to the electrical wires and/or equipment inside the enclosure without requiring the enclosure to be opened.

After measuring electrical characteristics, a component favorably drops from a measuring element. An inspection device includes a pair of measuring elements configured to measure electrical characteristics of a component by gripping the components due to being capable of approaching and separating from each other; and air supply device configured to supply air to at least one of a pair of opposing surfaces that oppose each of the pair of measuring elements, and by supplying air to at least one of the opposing surfaces from air supply device, a component s adhered to the at least one opposing surface can be caused to drop favorably.

A method for inspecting electronic components and an electronic device are provided. The electronic device includes electronic elements, signal lines, an inspection structure, a substrate and a first driving element electrically connected to the signal lines. The signal lines include a first and a second signal lines. The electronic components include a first group of electronic components electrically connected to the first signal line and a second group of electronic components electrically connected to the second signal line. The first signal line has a first portion overlapping a first inspection region and a second portion overlapping the first driving element. The second signal line has a third portion overlapping a second inspection region and a fourth portion overlapping the first driving element. A distance between the second portion and the fourth portion is smaller than a distance between the first portion and the third portion.

A test socket assembly which can stably transmit a signal at high communication speed comprises: a test socket having a plurality of conductive parts for electrically connecting a device terminal of the device to be tested and a board terminal of the tester board; a guide housing including a housing body having a housing opening into which the device to be tested can be inserted, and a socket supporting section disposed beneath the housing opening so as to protrude from one surface of the housing body; and a socket frame including a frame body, which is coupled to the test socket so as to be secured to the socket supporting section so that the test socket is supported beneath the housing opening, and a frame wing which is bent from the frame body toward the housing body so as to be secured to the housing body.