Patent classifications
G01R1/0416
TEST INTERFACE SYSTEM AND METHOD OF MANUFACTURE THEREOF
A redistribution system includes: a probe support base; a homogenous dielectric structure formed on the probe support base; a probe head structure formed on the homogenous dielectric structure, including: a probe conductive connector partially embedded in and extending from the homogenous dielectric structure; a probe head support adjacent to the probe conductive connector and extending from the homogenous dielectric structure; and a deflectable probe head attached to the probe conductive connector and suspended over a deflection gap between the probe conductive connector probe head support.
TEST POINT VOLTAGE SENSOR FOR HIGH VOLTAGE SEPARABLE CONNECTORS
A device to measure the voltage at a test point, also referred to as a test point voltage sensor, comprises a housing formed from a first material and a second material, wherein the first material comprises an insulating material and the second material comprises a conductive or semiconductive material. The housing includes an opening configured to cover a test point of a cable accessory. The device further includes a pressure pad, disposed in the housing, having a conductive mating surface configured to contact a test point of the basic insulation plug or end plug. The device further includes a low side capacitor embedded in the housing and electrically coupled to the conductive mating surface. The device further includes a signal wire electrically coupled to the low side capacitor.
Connector apparatus for a field device as well as field device with such a connector apparatus
The connection apparatus of the invention comprises a platform (200), a plug connector (15) having a plug connector part (19) secured to the platform (200) and electrically connected to the circuit of the field device and a plug connector part (20) connectable with the connection cable and complementary to the first plug connector part (19), as well as a lid (16) held movably relative to the platform (200) for at least partially covering the plug connector (15) formed by connecting the plug connector parts (19, 20). The lid (16) is swingable between a first end position, in which the lid (16) at least partially covers the plug connector, and a second end position, and is additionally adapted in at least one open position located between the first end position and the second end position to expose the plug connector such that the plug connector part (20) can be separated from the plug connector part (19), as well as at least in the first end position to secure the plug connector part (20) connected with the plug connector part (19).
Test arrangement and method for testing a switching system
In order to test substations from different manufacturers and of different types in a simple manner, it is provided that a control unit (6) for a switching device (5) of a substation (4) is connected via an adapter cable (11) to a test device (10), which simulates the switching device (5) for the test and the test device (10) reads configuration-specific data from a memory unit (15) on the adapter cable (11) and the test unit (10) thus configures its signal inputs (BE) and signal outputs (BA, AA) that are required for conducting the test.
Mechanism for securing a connector device to a mating connector device
A mechanism for securing a connector device and a mating connector device to one another and for releasing them from one another, the mechanism having at least one catch arranged on the connector device and a drive with a shaft, the rotation of which is capable of moving the catch to and fro between an open position and a locking position of the catch. The mechanism is constructed such that, during travel between the open position and the locking position, the catch performs a combined pivoting and translational movement, and/or a translational movement on a curved path. The mechanism has a slotted link with a link guide and a link block, wherein the link guide is arranged on the catch and the link block lies on the axis of the shaft or is formed by the shaft. The drive has a crank drive for converting the rotation of the shaft into a movement of the catch between the open position and the locking position and the mechanism has a second slotted link for guiding the catch, wherein a link block of the second slotted link is formed by part of a connecting rod shaft on the catch side with which a connecting rod of the crank drive is coupled to the catch. The catch takes the form of a toggle lever. Furthermore, a connector device with the mechanism and a system consisting of a connector device with a mechanism and a mating connector device having at least one mating catch.
INSPECTION APPARATUS AND INSPECTION METHOD
An inspection apparatus includes: a stage on which an inspection target is mounted; a temperature adjustment mechanism configured to adjust a temperature of the stage; an inspecting part configured to exchange electrical signals for an electrical characteristics inspection with the inspection target; a probe card having terminals in contact with the inspection target; an intermediate connection member having connectors electrically connecting the inspecting part and the probe card; a position adjustment mechanism configured to adjust a relative position between the stage and the probe card; a temperature measurement member configured to measure a temperature of the intermediate connection member; a preliminary temperature adjusting part configured to adjust a temperature of the probe card prior to the electrical characteristics inspection; and a determining part configured to determine whether or not the temperature of the probe card is stabilized, based on the temperature of the intermediate connection member.
Automated waveform analysis methods using a parallel automated development system
A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
REFLECTOMETRY SYSTEM FOR DETECTING FAULTS ON A HARDENED MULTIPOINT CONNECTOR OF AN ELECTRICAL NETWORK
The invention relates to a reflectometry system for detecting faults on a hardened multipoint connector of an electrical network, of the type that comprises a measuring probe, characterized in that it comprises an interfacing and impedance matching part that is electrically suitable for mounting on the connector to be tested and comprises a body provided with at least one element in the form of a collector ring for the contact masses of the connector and a measuring opening for the probe of the reflectometry system.
PROBE CARD INSPECTION WAFER, PROBE CARD INSPECTION SYSTEM, AND METHOD OF INSPECTING PROBE CARD
A probe card inspection wafer includes a base wafer and first and second probe card inspection chips on the base wafer and apart from each other, wherein each of the first and second probe card inspection chips located on the base wafer is divided into a probe vertical-level inspection region, a probe horizontal-position inspection region, and contact inspection regions, wherein the first and second probe card inspection chips include first pad arrays located on the probe vertical-level inspection region and configured for inspecting vertical levels of first and second alternating-current (AC) probes of a probe card to be inspected, and second pad arrays located on the probe vertical-level inspection region and configured for inspecting vertical levels of first and second VSS probes of the probe card to be inspected.
PARASITIC EMULATOR FOR TESTING LIGHTING AND ELECTRIC BRAKE CIRCUITS ON TRAVEL AND FIFTH-WHEEL TRAILERS
A compact and lightweight emulator is provided for parasitic testing individual lighting circuits and the electric brake circuit of travel trailers and fifth-wheel trailers, which are equipped with an on-board rechargeable battery. The emulator is equipped with a flasher circuit that, when activated, flashes the stop/turn lights on the trailer simultaneously in an emergency flasher mode. The emulator includes a housing, which incorporates a 7-blade receptacle for a trailer electrical plug, a digital voltmeter, a circuit selector switch, a keyed ON-OFF switch, which selectively sends power from the trailer battery to device circuitry, and a pair of external terminals, which can be connected to leads from an electrical charger in order to recharge the trailer's on-board battery.