G01R1/0416

Test circuit, test method, array substrate and manufacturing method thereof

A test circuit, a test method, an array substrate and a manufacturing method thereof are provided. The test circuit includes a plurality of to-be-tested units and plurality of test electrodes connected to the to-be-tested units. The plurality of to-be-tested units are arranged in a matrix. At least one of the test electrodes is multiplexed by the plurality of to-be-tested units in a row direction and at least one of the test electrodes is multiplexed by the plurality of to-be-tested units in a column direction.

Coaxial inspection connector

A coaxial inspection connector comprises an outer conductor including first and second housings having tubular shapes extending in a first direction, and a center conductor including first and second center conductor portions extending in the first direction, with the first conductor portion fixed to the first housing by a first bushing. The first housing supporting the second housing with an end portion of the second housing on one side in the first direction swinging in a second direction perpendicular to the first direction. The second center conductor portion includes a swing portion supported by the first center conductor portion with an end portion of the second center conductor portion on the one side in the first direction swinging in the second direction, and a tip portion including the end portion on the one side in the first direction and movable in the first direction relative to the swing portion.

Electrical connector and contacts thereof

An electric contact used to electrically connecting an IC socket to a PCB, comprises an upper contact, a lower contact and an elastic member between them. The upper contact comprises a first connecting portion to be connected to the IC socket and a first contacting portion with less length than the first connecting portion. The lower contact comprises a second connecting portion and a second contacting portion connecting with the second connecting portion. The second connecting portion includes an expanding portion adjacent to the second contacting portion. The second contacting portion forms a receiving space for the first contacting portion. The first connecting portion also defines a protruding portion projecting along a thickness direction.

Battery monitoring device

A battery monitoring device includes a battery information input terminal, a battery state monitoring unit, an output terminal, a circuit board, and a housing member. The battery information input terminal is electrically connected to a battery state detecting member. The battery state monitoring unit receives a battery state detection signal via the battery information input terminal. The output terminal outputs monitoring information on the battery state corresponding to the battery state detection signal to an external arithmetic processor. The circuit board is provided with the battery information input terminal, the battery state monitoring unit, and the output terminal. The housing member is integrally formed with the battery information input terminal, the battery state monitoring unit, the output terminal, and the circuit board so as to accommodate at least the whole battery state monitoring unit and the whole circuit board and expose terminal connecting portions to the outside.

SCALABLE PLATFORM FOR SYSTEM LEVEL TESTING
20190277907 · 2019-09-12 ·

A scalable test platform can include one or more of a plurality of different device interface boards and a plurality of primitives. The different device interface boards can be configured to provide a uniform interface to couple different types of DUTs and or DUTs with different form factors to the plurality of primitives. The plurality of primitives can be configured to distribute power to the DUTs, and to perform system level testing of the respective DUTs. The plurality of primitives can be configurable by a user to perform any number of system level tests on a number of different types of DUTs and or DUTs with different form factors.

Connection terminal
10411386 · 2019-09-10 · ·

A conductive connection terminal is extensible and compressible in a longitudinal direction, and includes: a first contact member including a first tip portion configured to contact with one electrode of a contact target, and a first base end portion; a second contact member including a second tip portion configured to contact with another electrode of the contact target, and a plurality of tongue parts configured to contact with the first base end portion; an elastic member configured to extend and compress the first contact member and the second contact member in the longitudinal direction; and a load applying unit configured to apply a load to the tongue parts in a direction bringing the tongue parts into contact with an outer circumference of the first base end portion.

Interconnection system with flexible pins

An embodiment includes a system comprising: a polymer substrate including a plurality of voids; and a plurality of metal pins; wherein a first pin, included within the plurality of metal pins, includes: (a)(i) first and second arms that couple to each other by way of an arcuate member, (a)(ii) a middle portion including a middle diameter, a proximal portion including a proximal diameter, and a distal portion including a distal diameter; wherein (b)(i) the middle portion is between the proximal and distal portions, (b)(ii) the middle diameter is less than the proximal and distal diameters, and (b)(iii) the proximal portion, but not the distal portion, is included within one of the plurality of voids. Other embodiments are described herein.

PROBE CONNECTOR FOR A PROBING PAD STRUCTURE AROUND A THERMAL ATTACH MOUNTING HOLE
20190271720 · 2019-09-05 ·

A system includes a probe connector including first traces coupled to first conductors curvilinearly arranged around a first elongated portion of the probe connector. The system further includes a circuit board including second traces coupled to first connector pads curvilinearly arranged around a first hole in the circuit board. The first connector pads are to couple to the first conductors of the probe connector when the first elongated portion is inserted in the first hole. The system further comprises a first integrated circuit disposed on the circuit board, the first integrated circuit being coupled to the second traces.

Limiting translation for consistent substrate-to-substrate contact

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.

CONTACT ASSEMBLY

An electrical contact assembly includes an electrically nonconductive base, a first electrical contact supported by the base and a second electrical contact supported by the base such that the first contact and the second contact are separated by a space. The first electrical contact is configured to engage a first external conductive circuit element and the a second electrical contact is configured to engage a second external conductive circuit element. The first contact and the second contact are configured such that a portion of the first contact and a portion of the second contact converge as the base moves in a first direction relative to the first and second external conductive circuit elements and diverge as the base moves in a second direction relative to the first and second external conductive circuit elements.