An exchangeable contact unit which can be attached to or detached from a main body of an inspection jig, includes: a flexible board which is provided with a contact part with respect to an object to be inspected; and a coaxial connector which is directly and electrically connected to the flexible board.

Embodiments are directed to microscale and millimeter scale multi-layer structures (e.g., probe structures for making contact between two electronic components for example in semiconductor wafer, chip, and electronic component test applications). One or more layers of the structures include shell and core regions formed of different materials wherein the core regions are offset from a symmetric, longitudinally extending position.

Disclosed is an electrode lead gripper for a pressure activation device, and, in particular, an electrode lead gripper for a pressure activation device in which a current electrode terminal is configured to be stacked and mounted onto an electrode terminal base separately from a voltage electrode terminal and thus improved in contact reliability and increased in contact area in terms of contact with an electrode lead of a pouch type battery cell, thereby having advantages of decreasing contact resistance, reducing the amount of heat generated during charging/discharging, and resulting in further enhancing a charging/discharging efficiency.

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.

A method for testing a multicore cable that includes a single common shield covering plural insulated wires. The testing method includes inputting a test signal, by capacitive coupling, to an end portion of the insulated wire under test among end portions of the insulated wires exposed at one end of the multicore cable, and measuring voltages of output signals output by capacitive coupling respectively from end portions of the insulated wires exposed at the other end of the multicore cable, and identifying the other end portion of the insulated wire under test based on the measured voltages. The voltages of output signals are measured in a state that an output variation reduction capacitive element is connected in series with a coupling capacitance generated by the capacitive coupling.

The connection apparatus of the invention comprises a platform (200), a plug connector (15) having a plug connector part (19) secured to the platform (200) and electrically connected to the circuit of the field device and a plug connector part (20) connectable with the connection cable and complementary to the first plug connector part (19), as well as a lid (16) held movably relative to the platform (200) for at least partially covering the plug connector (15) formed by connecting the plug connector parts (19, 20). The lid (16) is swingable between a first end position, in which the lid (16) at least partially covers the plug connector, and a second end position, and is additionally adapted in at least one open position located between the first end position and the second end position to expose the plug connector such that the plug connector part (20) can be separated from the plug connector part (19), as well as at least in the first end position to secure the plug connector part (20) connected with the plug connector part (19).

The present invention provides a surface treated metal material for burn-in test socket wherein contact resistance between the contact of the socket and other metal materials being inserted is excellently suppressed when used for the contact for burn-in test socket.

The surface treated metal material for burn-in test socket, comprising a base material, a lower layer being constituted with one or two or more selected from the constituent element group A, the constituent element group A consisting of Ni, Cr, Mn, Fe, Co and Cu, an intermediate layer formed on the lower layer, the intermediate layer being constituted with one or two or more selected from the constituent element group A and one or two selected from a constituent element group B, the constituent element group B consisting of Sn and In, and an upper layer formed on the intermediate layer, the upper layer being constituted with one or two selected from the constituent element group B and one or two or more selected from a constituent element group C, the constituent element group C consisting of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir, wherein the thickness of the lower layer is 0.05 m or more and less than 5.00 m, the thickness of the intermediate layer is 0.01 m or more and less than 0.40 m, and the thickness of the upper layer is 0.02 m or more and less than 1.00 m.

The present invention relates to a test socket heating module and a device test apparatus including the same, and more particularly, to a test socket heating module for performing a high-temperature test on a device, and a device test apparatus including the same. The present invention discloses a test socket heating module (200) including: a support plate (210) installed to be spaced apart a distance from a bottom surface of a test board (100) which is provided with one or more test sockets (20) for performing a test on a device (10) mounted on the test sockets; and one or more heater units (220) which are coupled to the support plate (210) between the test board (100) and the support plate (210), and heat the corresponding test sockets (20), respectively.

A method for testing a multicore cable including a single common shield covering plural insulated wires to identify a correspondence relation between one end portion and the other end portion of the insulated wires exposed from both ends of the multicore cable. The testing method includes allowing the common shield to have a same potential as a measurement system ground, inputting a test signal, by capacitive coupling, to an end portion of the insulated wire under test among end portions of the insulated wires exposed at one end of the multicore cable, and measuring voltages of output signals output by capacitive coupling respectively from end portions of the insulated wires exposed at the other end of the multicore cable, and identifying the other end portion of the insulated wire under test based on the measured voltages.

A method for testing a multicore cable including not less than three insulated wires to identify a correspondence relationship between one end portion and an other end portion of the insulated wires exposed from both ends of the multicore cable. The method includes inputting a test signal, by capacitive coupling, to an end portion of the tested insulated wire among end portions of the insulated wires exposed at one end of the multicore cable, inputting a phase-inverted test signal in an opposite phase to that of the test signal, by capacitive coupling, to an end portion of the insulated wire, other than the end portion of the tested insulated wire, and measuring voltages of output signals output respectively from end portions of the insulated wires exposed at the other end of the multicore cable to identify an other end portion of the tested insulated wire based on the measured voltages.