An electronic device includes a housing, which is sized and shaped to fit snugly over a connector containing first electrical contacts at an end of a cable. The electronic device further includes second electrical contacts within the housing and test circuitry. The second electrical contacts are configured and positioned to mate with the first electrical contacts when the housing is fitted over the connector. The test circuitry is contained within the housing and coupled to the second electrical contacts and configured to test a functionality of the cable.

A battery tester housing unit comprising a face plate wherein said face plate faces forwardly and extends in a transverse direction to terminate at a lateral edge, a back plate wherein said back plate faces backwardly and is parallel to said face plate; a surrounding wall which surrounds a peripheral of said base plate and said back plate; a digital display in rectangular shape located on said face plate located on a first end of the face plate; a battery holder apparatus in half cylindrical opening having a positive end and a negative end; said battery holder apparatus is located on a second end of said face plate wherein said second end is located opposite to said first end on said face plate; a first button located in proximity to said digital display; a second button located in proximity to said display and said first button; a third button, a fourth button, a fifth button and a sixth button located in proximity to said battery holder apparatus.

A test point adaptor for coaxial cables includes a main body, a test body, and a cap. The main body has a first longitudinal axis and includes a first end comprising a first interface, a second end comprising a second interface, and a first center conductor extending at least from the first interface to the second interface. The test body has a second longitudinal axis arranged transversely to the main body and includes an outer conductive sleeve, a test body end comprising a third interface, an electrically conductive contact member in electrical contact with the first center conductor, and a gripping arrangement electrically coupled with the electrically conductive contact member. The third interface includes a conical contact surface of the outer conductive sleeve. The cap includes a sleeve configured to matingly engage an outer surface of the outer conductive sleeve. The outer conductive sleeve includes a conical contact surface configured to engage the conical contact surface of the outer conductive sleeve when the cap is matingly engaged with the outer sleeve. The cap includes a terminator configured to be aligned with and received by the gripping arrangement, which electrically couples the terminator to the electrically conductive contact member.

A sensor detects a detected value for a covered wire without metallic contact, and includes: a tubular support that has a male thread and an insertion channel in which the covered wire is inserted and supported; a tubular shell that is inserted into the support from a base end; a pillar-shaped detection electrode that is inserted in and supported by the shell; and a tubular threaded piece that screws onto the male thread, is rotatably attached onto the shell, and is moved, along the axis of the support, together with the shell and the detection electrode by a screwing operation. The detection electrode is configured so that the front surface is pressed onto the covered wire in the support when the detection electrode moves, resulting in the front surface becoming capacitively coupled to a core wire of the covered wire via an insulating covering.

A film test structure and an array substrate are provided. The film test structure includes a conductive film to be tested; a plurality of test leads arranged at a different layer from the conductive film to be tested and electrically connected with the conductive film to be tested respectively; and a plurality of test terminals electrically connected with the plurality of test leads respectively.

An electrical probe structure includes a conductive cylinder, a first electrical connecting port and a probe assembly. The conductive cylinder for being fixed to the base plate has thereinside a sliding tunnel. The first electrical connecting port is electrically connected to the conductive cylinder. The at least one flexible conductive tube is furnished inside the sliding tunnel. The at least one probe assembly includes a first needle cylinder and a first probe. The first needle cylinder, slidably penetrating the conductive cylinder, electrically contacts the at least one flexible conductive tube so as to have the first needle cylinder to electrically connect the first electrical connecting port via the at least one flexible conductive tube and the conductive cylinder. The first probe is mounted and electrically connected to the first needle cylinder.

The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

The embodiments of the present disclosure provide an apparatus, system and method for testing electrical functions. The apparatus for testing electrical functions comprises: at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device; at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped; and at least one multiplex switch. Each multiplex switch has a first terminal comprising multiple ports, and a second terminal comprising at least one port and capable of being connected to a measurement instrument, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between the multiple ports of the first terminal and at least one port of the second terminal.

Disclosed herein is technology of a probe connector for a probing pad structure around a thermal attach mounting hole. A probe connector includes a socket frame including a first channel and an elongated body including a second channel. Socket conductors are disposed in the socket frame around the first channel. The second channel is disposed at a first distal end of the elongated body, and the elongated body is disposed on the socket frame. The socket conductors are to make electrical contact with a probing pad structure disposed on a surface area around a thermal attach mounting hole of a circuit board in response to a loading attachment engaging with the elongated body via the second channel, the socket frame via the first channel, and the circuit board via the thermal attach mounting hole.

A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.