A portable measurement assembly suitable for a work platform is disclosed. The assembly includes a housing that supports and protects a measurement device. The housing forms a first passage that receives a line-in electrical supply and a second passage that provides a line-out to a load. The measurement device is coupled to the line-in electrical supply. The portable measurement assembly is safe, convenient and enables an operator to determine an electrical condition at a work platform when the supply circuit is under load.

A test fixture includes a plug adaptable to a Universal Serial Bus (USB) Type-C receptacle, a switching circuit, and a control circuit. The plug can be utilized for coupling an electronic device under test. The switching circuit can be utilized for performing switching operations to enable first and second sets of communication paths within the test fixture in turn. The first and the second sets of communication paths are coupled to a first set of communication terminals of the plug and a second set of communication terminals of the plug, respectively. The control circuit can be utilized for controlling the switching operations, to allow a processing circuit to perform first and second sets testing operations on the electronic device through the first and the second sets of communication paths, respectively. A test system and a method for performing testing with aid of the test fixture are also provided.

A jig for a sample for a solar photovoltaic device is disclosed. The jig includes a cradle unit supporting the sample and a contact unit including at least one probe pin coming into contact with a busbar of the sample located in the cradle unit. The contact unit includes a coupling plate coupled with the cradle unit and at least one contact bar including a PCB and connected to the coupling plate, the contact bar having at least one probe pin aligned with the busbar of the sample with interposition of a probe pin connecting block. the jig includes a rotation support unit coupled with the cradle unit by a rotation shaft to allow the cradle unit to be rotated at an angle of 180 or greater so that upper and lower surfaces of the sample supported by the cradle unit are reversed.

A method and system are provided for implementing user configurable probing with magnetic connections and printed circuit board (PCB) features. A first magnet is located at a desired probe point on the PCB, a probe having a second magnet of suitable polarity and an electrical contact is moved to the probe point. The first and second magnets attract each other, and the probe point makes electrical contact with an electrical conductor at the probe point.

An evaluation jig comprises a pair of female terminals connectable to a pair of male terminals of a charging connector, and an adjustment member that can adjust contact resistance of the female terminal and the male terminal. The female terminal is reducible in diameter. The adjustment member can apply an external force to the female terminal to reduce the female terminal in diameter.

A configuration method of configuring a measurement instrument is described. The measurement instrument comprises at least one measurement port being connectable to at least one device under test. The measurement instrument further comprises a control circuit and a measurement circuit. The control circuit is connected to the measurement circuit. The measurement circuit is connected to the at least one measurement port. The configuration method comprises the steps of: comparing a loaded test routine with configuration data stored in the measurement instrument, determining whether the test routine is performable by the measurement instrument based on the comparison of the test routine with the configuration data; and adapting the loaded test routine based on the configuration data.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a testing system comprises: a loadboard including multiple universal interfaces with the same coupling configuration, a plurality of devices under test (DUTs) including a plurality of DUT interfaces respectively, and a plurality of universal adapters including a plurality of matching universal interfaces that match the plurality of universal interfaces in the loadboard and a plurality of matching DUT interfaces that match the plurality of DUT interfaces in the respective DUT. The plurality of universal adapters are selectively coupled to the loadboard and the plurality of universal adapters are selectively coupled to the DUTs, respectively. A first one of the plurality of DUT interfaces includes a different coupling configuration than a second one of the plurality of DUT interfaces.

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes a through-hole for sucking the DUT that is provided to face the DUT and penetrating through the lid member.

An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.

An electrical device testing fixture is disclosed. The electrical device testing fixture includes a stationary base, an electrode holder, a negative electrode and a positive electrode, a stopper holder, and a stopper; the stationary base is provided with two through wire mounting holes in which wires are routed; the electrode holder is provided with two separate long slots; the two electrodes are fixed in the two long slots respectively and movable in the slots respectively; an electrical device is connected between the two electrodes; a restoring spring is provided between the stopper and the stopper holder; and the stopper is configured to fix the electrical device. The electrical device testing fixture can address the high cost problem due to the requirement of different testing fixtures corresponding to different models of electrical devices.