An example manipulator for transporting a test head includes: a tower having a base and a track, with the track being vertical relative to the base; an arm to enable support for the test head, with the arm being connected to the track to move the test head vertically relative to the tower; one or more motors to drive movement of the arm along the track; and pneumatic cylinders to control movement of the arm to cause the test head to apply an amount of force to a peripheral device.

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.

A package includes a semiconductor chip. The semiconductor chip includes a test pad, and a plurality of microbump pads, wherein each microbump pad of the plurality of microbump pads is electrically connected to the test pad. The package further includes a substrate; and a plurality of microbumps configured to electrically connect the semiconductor chip to the substrate, wherein each microbump of the plurality of microbumps is electrically connected to a corresponding microbump pad of the plurality of microbump pads. The package further includes a package substrate, wherein the package substrate comprises a bump pad, wherein an area of the bump pad is greater than a combined area of the test pad and the plurality of microbump pads. The package further includes a bump configured to electrically connect the substrate to the package substrate.

A test plug block for plugging onto a series terminal block has a plurality of interconnected test plugs and two securing parts which are arranged on both sides of the plurality of test plugs having a plug-in portion and which are connected to each other via a handle. Plugging of the test plug block onto the series terminal block is simplified in that each plug-in portion of the securing parts has two latching elements which, together with corresponding counter latching elements of the securing clamps determine a first latched position and a second latched position of the securing parts in the securing clamp, wherein the two latched positions are arranged one behind the other in the plug-on direction of the test plug block. An unlocking element is movably arranged in the housing of each securing part from a base position into first and second unlocking positions by rotating the handle.

A test instrument probe that encompasses the dual alternate action of a point or a clamp-grip within the same probe. This probe has approximately the same dimensions as a conventional probe, and allows either the point or clamp action to be used without the necessity of removing the probe from the hand. This alternate action requires only using a thumb and finger pressure to change from a point to a clamp or the clamp to a point. One embodiment allows a clamp jaw opening of up to a nominal inch that is usually sufficient to grip onto the leads of an electronic component such as resistor, capacitor or integrated circuit pin. The probes are also designed so that when not in use, the two probes can be connected together by a snap-in action that minimizes the potential loss of a probe and importantly allows the points to become safely enclosed to minimize a sharp point hazard.

A test and measurement probe connection system including an interposer, at least one probe tab connected to the interposer, and a connector that is releasably connectable to the at least one probe tab to measure signals from the interposer.

A testing device for a meter socket assembly, including breaker load lugs, includes a base unit having a plurality of test probes, a ground node, and a breaker node having a plurality of breaker probes. To perform the test, the base unit is inserted into a jaw meter socket such that each of the plurality of test probes are in contact with jaws of the jaw meter socket, at least two of the plurality of breaker probes are in contact with each of a plurality of breaker load lugs of a main breaker, and the breaker node is electrically connected to the base unit. The testing device determines the jaw type of the meter socket assembly and can output results of tests relating to phase to phase, phase to ground, crossed cables, and interruption of electrical paths. The testing device can output results of the test audibly and visually.

A contact-making device (10) is used for a resistance measurement on a test object (30). The test object (30) comprises a threaded hole (31), which has an internal thread (32). The contact-making device (10) is designed to be mechanically coupled to the internal thread (32) of the threaded hole (31). The contact-making device (10) comprises a first contact (11) and a second contact (12), in order to make electrical contact with the test object (30) at, at least, two points when the contact-making device (10) is mechanically coupled to the internal thread (32). The first contact (11) and the second contact (12) are electrically insulated from one another by an insulating material (15-17) in the contact-making device (10).

An adjustable tool configured to facilitate mounting an electromechanical device relative to a tester is contemplated. The adjustable tool may be operable to facilitate adjustably mounting a belt tensioner, pulley or other rotating element of the electromechanical device relative to a belt drive or other rotatable testing element included on the tester in a manner sufficient to enable adjusting tensioning and/or positioning therebetween.

An electronic device includes a housing, which is sized and shaped to fit snugly over a connector containing first electrical contacts at an end of a cable. The electronic device further includes second electrical contacts within the housing and test circuitry. The second electrical contacts are configured and positioned to mate with the first electrical contacts when the housing is fitted over the connector. The test circuitry is contained within the housing and coupled to the second electrical contacts and configured to test a functionality of the cable.