A wafer test cassette is provided, which includes a first housing, a second housing, and a magnetic barrier assembly. The first housing includes a first magnetic member, and the second housing includes a second magnetic member arranged corresponding to the first magnetic member. The magnetic barrier assembly is configured to be connected to the first housing or the second housing for reducing or eliminating magnetic attraction generated between the first magnetic member and the second magnetic member. The magnetic barrier assembly is configured to reduce or eliminate the magnetic attraction before the first housing and the second housing are in contact with each other. When the first housing and the second housing are correspondingly in contact with each other, an effect of the magnetic barrier assembly is released, so that the first housing and the second housing are tightly coupled to each other through the magnetic attraction.

An apparatus for selectively coupling a load to a grid power source and an inverter that is fed electric power by an alternate power source includes a first node coupled to the load. A grid sensor senses a state of the grid power source. A grid relay couples the grid power source to the first node when in a closed state and decouples the grid power source from the first node when in an open state. An inverter relay couples the inverter to the first node when in a closed state and decouples the inverter from the first node when in an open state. A controller is programmed to: cause the grid relay and the inverter relay to closed when the grid sensor indicates available grid power and cause the grid relay to open when grid power is not available. A communications circuit senses a current state of the controller and wirelessly communicates a change of state of a selected one of the grid sensor and the controller to a remote device.

A notched test signal is generated across a frequency band, the notched test signal includes a plurality of frequency notches, each frequency notch associated with one of a plurality of test frequencies. The notched test signal is provided to a device under test at a plurality of different input power levels. An notched output signal is received from the device under test. The notched output signal is filtered to provide a bandpass response at the plurality of test frequencies to generate a filtered notched output signal. A power level of the filtered notched output signal at each of the plurality of test frequencies is measured. A noise performance metric associated with the device under test is determined based at least in part on the power level of the filtered notched output signal.

Some embodiments relate to a method of an integrated circuit structure having a conductive structure for circuit probe testing. The method includes providing an integrated circuit structure including a substrate, a dielectric structure disposed over the substrate, and a plurality of electrodes disposed over an upper surface of the dielectric structure. The method also includes forming a first dielectric layer over the dielectric structure and the plurality of electrodes, etching the first dielectric layer over each of the plurality of electrodes, forming a conductive layer over the first dielectric layer and the plurality of electrodes, and removing at least a portion of the conductive layer to form a plurality of conductive structures over the plurality of electrodes. Each of the plurality of conductive structures contacts a corresponding subset of the plurality of electrodes.

To provide a connector wherein ground terminals can be designed easily, which not only suppresses the occurrence of impedance mismatch and crosstalk, but which does not lead to interferences between contacting portions. A ground terminal for a connector has a cylindrical main body. A plurality of contacting portions, for contacting a circuit board, are formed on the bottom edge of the cylindrical main body. The ground terminal has, as contacting portions, inner contacting portions and outer contacting portions. The inner contacting portions extend toward the inside of the cylindrical main body and in the downward direction, and the outer contacting portions extend toward the inside of the cylindrical main body and in the downward direction.

A connector for terminating a cable including a compressible fitting and a crimp nut. The compressible fitting has an inner passage to receive a portion of the cable and a threaded outer wall coaxial with and surrounding the inner passage. The outer wall includes a first slot extending radially through the outer wall and axially away from a first end of the outer wall. The crimp nut is configured to thread onto the outer wall of the compressible fitting. The crimp nut is further configured, in a first position, not to constrict the inner passage and, in a second position, to radially compress the outer wall of the compressible fitting to reduce a bore diameter of the inner passage and to electrically connect the outer wall with the portion of the cable received in the inner passage of the compressible fitting. Methods are also disclosed.

An electrical system may include a first electrical connector configured to be coupled to an electrical panel, a second electrical connector configured to be coupled to a testing device that is configured to test components coupled to the electrical panel, and a retaining harness assembly that removably connects to the first and second electrical connectors to maintain a secure mating relationship between the first and second electrical connectors.

A test fixture for testing performance of a trimmed cable and/or antenna components. The test fixture may be connected without the use of solder allowing for accurate testing or tuning of one or more the antenna components.

An electrical contact device includes a tubular element, a crown spring in the tubular element, a solid or hollow cylinder slideably received in the crown spring and a coil spring engaged with the cylinder for applying force while the cylinder is pressed against a test item and tor returning the cylinder to a relaxed position, The crown spring holds the cylinder in the tubular element and allows the cylinder to slide back and forth while providing electrical connectivity between the cylinder and the tubular element. An electrical contact device includes a rod-shaped probe having a contact end and a contact sheet fixed to the probe, where the contact sheet has a plurality of prongs bent over the contact end of the probe for providing a plurality of contact points between the probe and a test item.

Embodiments of the present invention provide an improved cable assembly for connecting an electrical test and measurement probe to a device under test. One end of the probe is connected to a device under test (DUT), while the other end is connected to the instrument through one or more cables. To prevent mechanical stresses to the probe-DUT interface caused by the cables' resistance to bending and twisting, embodiments of the improved cable assembly use one or more pliable spines to hold the cable assembly in position after it has been bent or twisted. This provides a more secure connection to the DUT and prevents damage to the probe-DUT interface. Each spine is anchored to the tip of the probe, and may be further secured by an outer housing or additional anchors. A flexible boot may surround the cable assembly and/or outer housing, further protecting the cables from damage. Alternatively, one or more spines may be placed inside the boot.