A measuring apparatus ascertains measurement information relating to an input voltage. The measuring apparatus contains an operational amplifier having first and second inputs, and an output for providing the measurement information. The measuring apparatus further has a first input node for coupling to a first pole of the input voltage, and a first isolation resistor which connects the first input node to the first input of the operational amplifier. Moreover, the measuring apparatus contains a second input node for coupling to a second pole of the input voltage, and a second isolation resistor which connects the second input node to the second input of the operational amplifier. The measuring apparatus further has a feedback resistor which connects the output of the operational amplifier to the first input of the operational amplifier, and a reference resistor which connects the second input of the operational amplifier to a reference potential.

An intermediate disconnect section (100) for mounting on a meter base (10) and an electricity meter (20). A first source coupling (117) mounted on a platform (106) is electrically couplable to a source connector of the meter base (10). A second source coupling (119) is electrically coupled to a source connection of the electricity meter (120). A first load coupling (121) is electrically coupled to a load connector of the meter base (10). A second load coupling (123) electrically coupled to a load connection of the electricity meter (20) and to the first load coupling (121). A switch (110) couples and decouples the first source coupling (117) to and from the second source coupling (119). A switching mechanism (130) opens and closes the switch (110) and includes an external device (138) that allows a user to open and close the switch (110) manually.

An adapter for establishing a high-quality planned test point on a device under testing. The adapter has two laminated portions arranged in a stacked configuration that houses a bridge insert, adapting from an input socket to an output socket. Input and output ports are electromagnetically shielded internally and from external electromagnetic interference, ensuring reliable and low-impedance connections.

An electrical connection apparatus includes: a probe head holding a probe; a wiring sheet including a first connection portion arranged on a first sheet surface facing the probe head and a second connection portion arranged on a second sheet surface; and a wiring board that is arranged facing the second sheet surface. A press-fit pin having an elastically deforming head is embedded in the wiring sheet, and the head is exposed from at least any of the first sheet surface and the second sheet surface. The head of the press-fit pin exposed from the first sheet surface is fitted into a recess formed in the probe head to fix the probe head to the wiring sheet. The head of the press-fit pin exposed from the second sheet surface is fitted into a recess formed in the wiring board to fix the wiring board to the wiring sheet.

A testing apparatus includes a circuit board, a base and a conductive terminal. The circuit board includes a board body, a via portion penetrated through the board body, and an electrical contact located on one surface of the board body and electrically connected to the via portion. The base is located on the circuit board and formed with a limiting groove. The conductive terminal includes a main body held within the limiting groove, an abutment portion extended outwardly from one side of the main body, a conductive portion extended outwardly from the side of the main body and removably contacting with the electrical contact, an elastic piece portion connected to the conductive portion and the abutment portion, and a supporting portion extended outwardly from another side of the main body, arranged opposite to the conductive portion, and removably contacting with the circuit board.

Disclosed is a probe head configured such that a support distance is changed based on variation of a support axis extending through a plate and a spacer, whereby the protrusion length of a probe is adjusted. Since the protrusion length of the probe under a lower plate is adjusted, the number of tests is increased, and therefore the lifespan of the probe head is extended. In addition, work time for replacement and reinstallation of the probe head is shortened, whereby delay of a test process is prevented and process cost is reduced.

A terminal block test adapter releasably attached to a terminal block for releasably connecting electrical wires thereto without breaking or shorting current flowing through the terminal block. The terminal block test adapter includes a plurality of spring biased connector posts within post housings adapted to be linearly aligned with connector posts within post housings of the terminal block. When in use, a proximal end of each connector post of the terminal block test adapter is adapted to be used for releasably connecting a test wire thereto for electrical testing purposes without breaking or shorting current flowing through the terminal block.

A characteristic measuring jig includes a support, an impedance measuring part, and an elevating part configured to elevate the impedance measuring part. The impedance measuring part includes first and second positive electrode contact parts in contact with the positive electrode terminal, first and second negative electrode contact parts in contact with the negative electrode terminal and opposite to the first and second positive electrode contact parts, a first terminal for current connected to the first positive electrode contact part for applying current to the battery cell, a first terminal for voltage connected to the second positive electrode contact part for measuring the voltage of the battery cell, a second terminal for current connected to the first negative electrode contact part for applying current to the battery cell, and a second terminal for voltage connected to the second negative electrode contact part for measuring voltage of the battery cell.

The present invention relates to a manufacturing method of a semiconductor test device. A semiconductor test device according to one embodiment of the present invention, which is a semiconductor test device for testing an electrical connection of a semiconductor, may include: a first membrane portion including a plurality of first aperture patterns in a thickness direction; a second membrane portion connected to the first membrane portion and including a plurality of second aperture patterns in a thickness direction; and a holder portion including a hollow region and being connected to an edge of the first membrane portion.

An electronic device includes a metal housing including a flat plate part, a connector terminal that projects from inside to outside through a through hole of the flat plate part of the metal housing and to which an electrical stress is applied, and a member that surrounds an outer periphery of the connector terminal along a direction in which the connector terminal projects, that is surrounded by an inner periphery of the flat plate part of the metal housing, and that is made of an electrostatic diffusion material.