A wafer testing cassette is provided. The wafer testing cassette includes a first housing, a second housing and a magnetic force generating assembly. The first housing include a probe card, the probe card includes at least one probe having a paramagnetic property. The second housing is combined with the first housing and has a magnetic force generating assembly arranged corresponding to the at least one probe. A wafer located in the second housing, and the at least one probe electrically contacts at least one pad of the wafer with a predetermined contact force. When the magnetic force generating assembly is configured to generate a first magnetic attraction force, the magnetic force generating assembly attracts the at least one probe, so that the at least one probe electrically contacts the at least one pad with a first contact force which is greater than or equal to the predetermined contact force.

The present invention provides an electrically conductive contact pin comprising a first end region, a second end region, and a body region positioned between them, wherein the body region includes at least two beam portions spaced apart by a slit and comprises a functional layer inside the slit to prevent local destruction of the beam and improve the current carrying capacity.

An adapter bracket includes a holder and a fixing element. The holder includes a first strip-shaped body and a second strip-shaped body. The first strip-shaped body is formed with a plurality of first notches linearly arranged on a first coupling surface of the first strip-shaped body. The second strip-shaped body is formed with a plurality of second notches linearly arranged on a second coupling surface of the second strip-shaped body. The fixing element detachably couples the first strip-shaped body and the second strip-shaped body together, so that the first coupling surface and the second coupling surface are in contact with each other, and the first notches and the second notches are jointly combined into a plurality of fastening holes arranged linearly, and each of the fastening holes can hold an object therein.

A testing system to provide feedback on the construction of a length of cable includes a testing apparatus having a cable coupler with ports to accept a connector on the end of the length of cable and a tester unit to send a test signal through the ports and length of cable and generate data based on the test signal; a computing device in communication with the testing apparatus to receive the data, process the data to produce a feedback score, associate the score with a discrete instance, store the score; and a display device configured to receive and display information related to the score. The testing system further includes a timer unit to track a time period and provide the time period to the computing device to be stored, used to further rank scores, and displayed by the display device as part of the information related to the score.

A device for testing a battery, having a transport system, wherein the transport system is configured for receiving the battery, for transporting the battery to a test position, and for transporting the battery out of the test position. The device also includes an interface configured to supply the battery arranged in the test position with electric power and configured to supply the battery arranged in the test position with gas.

The invention relates to a device for measuring (4) at least one electrical quantity of an electrical signal flowing in a contact device (2), the contact device (2) comprising, for each phase from N phases, a contact element (18) connected to an electrical phase conductor (15), the at least one electrical quantity comprising a voltage, the device for measuring (4) being configured to be installed on the front face of said contact device (2), and comprising an electronic control unit (24) comprising N flexible sheets (26), and for each phase: a connection assembly (20) connected to one of said flexible sheets (26), an actuating part (22) of the connection assembly (20), configured to be displaced from a free position in which the connection assembly (20) is electrically insulated from the contact device to a blocked position in which the connection assembly (20) bears against one of said contact elements (18) of the contact device.

A conductive block and a detection mechanism. The conductive block is used for pressing electrode tabs of an electrode assembly for withstand voltage testing, where the conductive block includes a transition surface, and the transition surface matches an inclined surface formed after the electrode tabs are pressed. The detection mechanism for withstand voltage testing of an electrode assembly comprises the conductive block, a first pressing plate and a second pressing plate spaced apart along a first direction and used for clamping a main body of the electrode assembly, and an elastic member with one end of the elastic member being connected to the first pressing plate, and another end of the elastic member being connected to the conductive block.