An example contact head includes coaxial contacts configured for transmission of radio frequency (RF) signals or digital signals between a test system and a device under test (DUT). Each of the coaxial contacts is configured to target a specific impedance. Each of the coaxial contacts includes a coaxial structure having an open-curve shape. The coaxial structure includes a spring material that bends in response to applied force and that returns to the open-curve shape absent the applied force. The coaxial structure includes a center conductor terminating in a contact pin and a return conductor separated by a dielectric from the center conductor. At least part of the center conductor and the return conductor include an electrically-conductive material. Flexible contacts on the coaxial contact include the electrically-conductive material.

A transducer for high-voltage measuring technology, including a housing having a parallelepipedal basic contour, input connections arranged on the housing and carrying input measurement signals in the high-voltage range, output connections arranged on the housing and carrying output signals in the low-voltage range, a transducer circuit arranged in the housing and implemented on a printed circuit board and being contact-connected to the input and output connections. The parallelepipedal basic contour of the housing is designed as an upright construction. The printed circuit board is arranged upright between opposite side walls of a dome formed in the housing. The input connections are arranged facing away from one another on the outer sides of the side walls within the basic contour of the housing, and in a manner engaging through the respective side wall of the dome are in contact with contact elements of the transducer circuit on the printed circuit board.

An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a second terminal (212) provided to be connected with a testing equipment. The test prod (210) also has a first stopper (213) between the first terminal (211) and the second terminal (212). The tube (220) has an internally extending stopper (221). The tube (220) is mounted around the test prod (210) in a longitudinal direction of the test prod (210). The elastic element (230) is accommodated between the first stopper (213) of the test prod (210) and the internally extending stopper (221) of the tube (220). The tube (220) and the test prod (210) can have a relative movement within an elastic range of the elastic element (230). The area of a cross section of the test prod (210) is much larger than the area of the cross section of the elastic element (230). A power module testing system (600) which comprises at least one electrical test probe (200) is also presented.

A voltage detector is presented. The voltage detector is a rod that has a handle at the proximal end. The distal end of the rod has a voltage probe. The voltage detector has an energy source and an indicator.

A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.

A test probe includes an electrically insulating handle, an electrically conducting blade extending from the handle, an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the electrically conducting blade. A housing is attached to the handle such that the first portion of the shroud is disposed within the housing, and the second portion of the shroud extends from an aperture formed in the housing. A spring disposed between the handle and the shroud biases the shroud toward the aperture formed in the housing. The shroud protects the electrically conducting blade from unintentional contact with a conductor during testing. When the test probe is correctly positioned on a device being tested, the shroud retracts into the housing exposing the electrically conducting blade. When the test probe is moved away from the device, the shroud returns to its original position.

A high voltage line post sensor for a high voltage power distribution system having a high voltage power transmission line for transmitting electrical power at a high voltage includes a voltage line sensor. The voltage line sensor includes a high voltage high resistance circuit including a first high voltage high resistance resistor coupled to the high voltage power transmission line and a second high voltage high resistance resistor coupled to the high voltage power transmission line in parallel to the first resistor; and a low voltage low resistance circuit coupled in series between the high voltage high resistance circuit and a reference voltage. The line post sensor also includes a body surrounding and encasing the high voltage high resistance circuit and the low voltage low resistance circuit.

A test assembly for testing a device under test includes a probe card assembly and a cap secured to the probe card assembly. The probe card assembly includes a probe tile having a plurality of openings. The probe tile includes a plurality of probe wires including a probe needle portion and a probe tip portion. A seal is disposed on a surface of the probe tile and forms an outer perimeter of a pressurized area. The probe tile includes an insulation layer formed within the pressurized area that is configured to separate the probe needle portion from the device under test. The insulation layer includes an aperture through which the probe tip portion extends to contact the device under test. The cap includes a fluid inlet and a fluid return outlet that are in fluid communication with the plurality of openings of the probe tile.

A test device includes a power compensation module and a test module. The power compensation module receives AC power generated by a device under test to generate DC power to the device under test. The test module provides a plurality of test signals and a test mode to the device under test for testing the device under test.

Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or the chuck and an instrumentation package configured to detect contact between the probe system and a device under test (DUT) and to test operation of the DUT. The instrumentation package includes a continuity detection circuit, a test circuit, and a translation structure control circuit. The continuity detection circuit is configured to detect electrical continuity between a first probe electrical conductor and a second probe electrical conductor. The test circuit is configured to electrically test the DUT. The translation structure control circuit is configured to control the operation of the translation structure. The methods include monitoring continuity between a first probe and a second probe and controlling the operation of a probe system based upon the monitoring.