In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.

A test device includes: a plurality of signal test pads electrically connected to pads of an input sensing unit; a power test pad electrically connected to a power pattern of a display unit; a test circuit configured to apply a test signal to the signal test pads; a voltage generator configured to generate a sensing power voltage; and a ripple controller configured to change a voltage level of the sensing power voltage to apply the sensing power voltage to the power test pad.

A detection device and a detection method for an elevator display module, an elevator including the detection device, and a computer storage medium. The detection device includes: memory; a processor; an I/O interface, configured to be coupled with one or more electroluminescent devices of the elevator display module; a communication module; and a computer program stored on the memory and running on the processor, the running of the computer program causes: receiving a detection request signal for the elevator display module via the communication module; in response to the detection request signal, applying a detection signal on at least one of the electroluminescent devices via the I/O interface; obtaining an operating level associated with the detected electroluminescent device via the I/O interface; and determining whether the detected electroluminescent device is working normally according to a polarity of the operating level.

Disclosed are an facilitating debugging electronic device, system and method, reasonably integrates the power-supply interface and the signal interface of the electronic device, matches the conventional output end of the electronic device with the master device, realizes the debugging of electronic devices including semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, partly overcomes the technical problem of the increase of product volume and cost, which caused by setting different interfaces on electronic devices for various testing, burning and correcting purposes. The present disclosure also partly realizes the debugging of electronic devices with fewer external interfaces, which contributes to the miniaturization of electronic devices such as semi-finished products of PACKAGE (SMD)/PCBA/COB modules and electronic products, and guarantees the quality of electronic products by implementing the waterproof, dustproof and pleasing design of the housing structure of devices and achieves economic and social benefits.

An image processing method includes the steps of lighting up at least a part of light emitting units of a light emitting device; capturing a plurality of detection images corresponding to a plurality of sections of the light emitting device respectively, wherein each section includes a plurality of lighted-up light emitting units, each detection image includes a plurality of light spots respectively corresponding to the light emitting units of the associated section, and every two adjacent sections have an overlap area including at least one lighted-up light emitting unit; and stitching the detection images of the adjacent sections together by taking the light spots corresponding to at least one lighted-up light emitting unit of the overlap area as alignment reference spots, so that the light emitting statuses of all the light emitting units are presented by a single image.

The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

A device for measuring oxygen saturation includes circuitry configured to determine a measured difference of forward voltage based on a first forward voltage at a first light emitting diode and a second forward voltage a second light emitting diode and determine that the first and second light emitting diodes are valid based on a calibrated difference of forward voltage and the measured difference of forward voltage. In response to the determination that the first and second light emitting diodes are valid, the circuitry is configured to determine an oxygen saturation level.

A device for measuring oxygen saturation includes circuitry configured to determine a series resistance for a light emitting diode based on a first diode voltage at the light emitting diode for a first current, a second diode voltage at the light emitting diode for a second current, and a third diode voltage at the light emitting diode for a third current. The circuitry is further configured to determine an intensity of a received photonic signal corresponding to an output photonic signal output using the light emitting diode. The circuitry is further configured to determine an oxygen saturation level based on the intensity of the received photonic signal and the series resistance.

A method for repairing a display module and a display module repaired by the method are provided. The method for repairing a display module includes: detecting light-emitting diode (LED) missing positions on a target substrate; loading the target substrate onto a first stage; loading a transfer substrate onto a second stage; arranging the target substrate and the transfer substrate by operating the first stage and the second stage; and transferring a laser consecutively to the LED missing positions by moving the target substrate and the transfer substrate at a constant speed by operating the first stage and the second stage in a row direction or a column direction.

Spatially resolved Fourier Transform Impedance Spectroscopy (FTIS) is disclosed to spatially map and quickly build the frequency response of optoelectronic devices using optical probes. The transfer function of a linear system is the Fourier transform of its impulse response, which may be obtained from transient photocurrent measurements of devices such as photodetectors and solar cells. We apply FTIS to a PbS colloidal quantum dot (QD)/SiC heterojunction photodiode and corroborate results using intensity-modulated photocurrent spectroscopy. The cutoff frequencies of the QD/SiC devices were as high as ˜10 kHz, demonstrating their utility in advanced flexible and thin film electronics. The practical frequencies for FTIS lie in the mHz-kHz range, ideal for composite or novel materials such as QD films that are dominated by interfacial trap states.