A voltage sensor system for determining an abnormal circuit condition in a multi-layer printed circuit board is disclosed. The printed circuit board has a plurality of layers. One of the layers includes a trace network and a sensor circuit. The sensor circuit includes the trace network and a sensing point. The sensor circuit is coupled between a voltage supply and a ground. A controller is coupled to the sensing point. The controller is operable to determine a voltage of the sensing point and compare the voltage to a threshold value to determine an abnormal circuit condition in the printed circuit board.

An apparatus performs methods for device diagnostics based on signals from digital outputs. The apparatus includes an input/output module with a digital output module to be coupled to a device. The input/output module measures one or more characteristics of a digital signal provided by the digital output module, where at least one of the one or more characteristics of the digital signal is associated with an output current of the digital output module. The input/output module also performs one or more diagnostics using the one or more measured characteristics of the digital signal.

Disclosed is a system and method for monitoring a characteristic of an environment of an electronic device. The electronic device may include a printed circuit board and a component. A sensor is placed on the printed circuit board, and may be between the component and the board, and connects to a monitor, or detector. An end user device may be used to store, assess, display and understand the data received from the sensor through the monitor.

Wearable items and methods of monitoring wearable items are disclosed. The wearable item comprises a flexible base material forming at least a portion of the wearable item, plural conductive traces traversing the flexible base material, and conductivity sensing circuitry coupled to the plural conductive traces. The conductivity sensing circuitry is configured to distinguish conductivity from non-conductivity of the plural conductive traces, and configured to generate a conductivity indication for at least one of the plural conductive traces. The plural conductive traces follow indirect paths across the flexible base material, allowing the flexible material to flex and stretch normally without breaking the conductive traces.

Provided is a short-circuit determining apparatus comprising: a sensor configured to detect a time change of a main current flowing between a first main terminal and a second main terminal of a switching device having a control terminal, the first main terminal and the second main terminal; an integration unit configured to integrate an output of the sensor; a polarity determining unit configured to determine a polarity of the output of the sensor; and a short-circuit determining unit configured to determine a short-circuit of the switching device, based on a comparison result of an output of the integration unit and a short-circuit determination reference value according to a determination result of the polarity.

An apparatus and method for testing a circuit board included in a battery management system. The circuit board includes a first test point connected in common to one end of a first resistor, one end of a first capacitor and one end of a second resistor; a second test point connected in common to the other end of the second resistor and one end of a second capacitor; a third test point connected to the other end of the first resistor; and a fourth test point connected in common to the other end of the first capacitor and the other end of the second capacitor. The apparatus determines an open-circuit fault of at least one of the first capacitor and the second capacitor based on a first diagnosis voltage between the first and fourth test points and a second diagnosis voltage between the second and fourth test points.

A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.

A method of testing a self-contained device under test having at least a circuit under test and a power source is provided. The method may include at least temporarily enabling power from the power source to the circuit under test, determining a first voltage across the circuit under test, determining a second voltage across the circuit under test after a test duration, and calculating an average current of the circuit under test based at least partially on the first voltage, the second voltage and the test duration.

A probe assembly for capacitive testing electrical connections of a low profile component to a circuit assembly. The probe assembly is configured to reduce coupling of noise signals from the circuit assembly to the capacitive probe. The probe assembly includes a sensing member with a geometry that allows the probe to preferentially couple to test signals from the pins of a component under test rather than conductive structures on the circuit assembly, such as pads, and signal traces to which those pins are attached. The sensing member may be a vertical capacitive sense plate such that coupling is to an edge of the plate. The sensing member alternatively may be a horizontal capacitive sense plate with an active area of the probe surrounded by an isolation ring. Measurements made with such capacitive probes may provide test measurements that yield a reliable discrimination between a properly attached pin and an open pin.

The present disclosure provides a circuit testing method and a circuit testing system for testing the circuit of a transmissive capacitive touch panel, wherein, the method comprises: when testing a certain induction line in a first electrode matrix or a second electrode matrix, configuring all induction lines in the first electrode matrix and the second electrode matrix except for the induction line to be tested as ground wires, applying a first voltage to the induction line to be tested, and detecting current on the induction line to be tested, and determining that the induction line to be tested is in a short-circuit state when the current is generated on the induction line to be tested; repeating the above step, and testing other induction lines in turn.