A reconfigurable JTAG includes, in part, a core logic, a boundary scan chain cell, one or more reconfigurable blocks (RBs), and a reconfigurable block (RB) programming module. The RBs may include, in part, one or more reconfigurable boundary scan chain blocks (RBB) adapted to couple the boundary scan chain cell to the core logic and to input/output (I/O) ports of the reconfigurable JTAG. The RBs may also include, in part, one or more additional reconfigurable logic (ARL) blocks to provide enhanced logic for locking operations. The RB programmable module may communicate with a memory storing data for configuring the RBBs and ARLs. The RB programming module may configure the RBBs and ARLs based at least in part on the data stored in the memory to disable access to the I/O ports of the JTAG. The RB programming module may configure the RBBs to encrypt the I/O ports in accordance with a cipher algorithm. The RB programming module may also configure the RBBs and ARLs to compare a counter's count to a predefined time and lock the I/O ports after an expiration of the predefined time.

The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced pin JTAG devices (506), or a mixture of both full pin and reduced pin JTAG devices. The access is accomplished using a single interface (502) between the substrate (408) and a JTAG controller (404). The access interface may be a wired interface or a wireless interface and may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

The present disclosure illustrates a testing circuit board with self-detection function and a self-detection method. A test for a to-be-tested circuit board is executed and a self-detection for a testing circuit board is performed by a JTAG chip. After the self-detection is passed, a first JTAG connection interface and a second JTAG connection interface are conducted by a controller, a multiplexer and a switch chip, to connect test circuit boards in series. Therefore, the efficiency of solving self-detection of JTAG chip with series connection conveniently and quickly may be achieved.

A product self-testing method includes the steps of providing a device under test and a probe tool, connecting a plurality of test points of the device under test with the probe tool, turning on the device under test and executing a testing program on the device under test, outputting a voltage signal through at least one pin of the device under test and reading a voltage feedback signal from at least one another pin through the probe tool, and determining whether the voltage feedback signal is correct.

An optimized JTAG interface is used to access JTAG Tap Domains within an integrated circuit. The interface requires fewer pins than the conventional JTAG interface and is thus more applicable than conventional JTAG interfaces on an integrated circuit where the availability of pins is limited. The interface may be used for a variety of serial communication operations such as, but not limited to, serial communication related integrated circuit test, emulation, debug, and/or trace operations.

An apparatus for performing a scan test of IC chip includes a shift-frequency searching unit that executes first scan test for first scan pattern whole or part of which constituting first scan section and second scan test for second scan pattern whole or part of which constituting second scan section, and searches usable shift frequency for the second scan section. The first scan pattern is scan pattern inputted to scan path right before the second scan pattern. The shift-frequency searching unit shifts the first scan section to the scan path with first shift frequency in the first scan test, shifts the second scan section to the scan path with second shift frequency in the second scan test, and determines, when both results of the first scan test and the second scan test indicate pass, the second shift frequency as the usable shift frequency for the second scan section.

An apparatus for performing a scan test of IC chip includes a shift-frequency searching unit that executes first scan test for first scan pattern whole or part of which constituting first scan section and second scan test for second scan pattern whole or part of which constituting second scan section, and searches usable shift frequency for the second scan section. The first scan pattern is scan pattern inputted to scan path right before the second scan pattern. The shift-frequency searching unit shifts the first scan section to the scan path with first shift frequency in the first scan test, shifts the second scan section to the scan path with second shift frequency in the second scan test, and determines, when both results of the first scan test and the second scan test indicate pass, the second shift frequency as the usable shift frequency for the second scan section.

Embodiments are directed to a semiconductor wafer having on-wafer circuitry. The on-wafer circuitry includes functional circuitry and first drive circuitry communicatively coupled to the functional circuitry. The on-wafer circuitry further includes test-only circuitry communicatively coupled to the functional circuitry, along with second drive circuitry communicatively coupled to the test-only circuitry. The control circuitry is communicatively coupled to the second drive circuitry and the test-only circuitry, wherein the first drive circuitry is configured to drive the functional circuitry in a first manner, and wherein the control circuitry is configured to control the second drive circuitry to drive the test-only circuitry in a second manner that is independent of the first manner.

A dual gate array substrate is disclosed. In two vertically adjacent pixel pairs, two pixel units in each of the pixel pairs are connected to the same data line of the two adjacent data lines respectively, and two adjacent pixel units in the two pixel pairs in an extending direction of the data line are connected to different data lines in the two adjacent data lines respectively; in two adjacent pixel pairs in an extending direction of any set of the dual gate lines, a data line connected to two pixel units in one pixel pair is different from but adjacent to a data line connected to two pixel units in the other pixel pair; and two adjacent pixel units in the extending direction of the data line are connected to their respective adjacent gate lines transmitting different scan signals respectively.

The system includes an integrated sequenced arrangement of parametric type instruments, automated guided prober test instruments, and a test instrument system using analog signature analysis for identifying faults in circuit card assemblies, under control of a software system with a mass interconnect system.