G01R31/2837

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

An exemplary embodiment of the present inventive concept provides a display device including: a display area where an image is displayed; a peripheral area disposed outside the display area; a hole area disposed within the display area; a hole crack detection line disposed adjacent to the hole area to surround the hole area and having a first end and a second end that is separated from the first end; a first detection line extending from the peripheral area and connected to the hole crack detection line to constitute a first closed circuit; a second detection line extending from the peripheral area and connected to the hole crack detection line to constitute a second closed circuit; and a circuit portion connected to the first detection line and the second detection line

Semiconductor device with a data-recording mechanism

An electronic device includes: a detection circuit configured to determine one or more operating data, one or more device sensor data, or a combination thereof associated with operation of the electronic device; a trigger circuit operably coupled to the circuit, the trigger circuit configured to generate a stress input based on detecting one or more target criteria from the one or more operating data, the one or more device sensor data, or a combination thereof; and a degradation sensor operably coupled to the trigger circuit, the degradation sensor having a threshold voltage and being configured to record the target criteria that occurs during operation of the electronic device, wherein the degradation sensor is configured to record the target criteria based on degradation of the threshold voltage according to the stress input.

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

An exemplary embodiment of the present inventive concept provides a display device including: a display area where an image is displayed; a peripheral area disposed outside the display area; a hole area disposed within the display area; a hole crack detection line disposed adjacent to the hole area to surround the hole area and having a first end and a second end that is separated from the first end; a first detection line extending from the peripheral area and connected to the hole crack detection line to constitute a first closed circuit; a second detection line extending from the peripheral area and connected to the hole crack detection line to constitute a second closed circuit; and a circuit portion connected to the first detection line and the second detection line

Frequency response diagnostics for characterizing servo controlled mechanisms
11314232 · 2022-04-26 · ·

A server includes a processor to supply a torque command to an amplifier that controls a motor that drives a linkage; include, in the torque command, an alternating signal wave that is to test a frequency response of the motor and the linkage; receive, from the amplifier, an instantaneous torque value of the motor and an instantaneous mechanical parameter value of the linkage at each time step according to a sampling rate and over a period of time; store an aggregate of both these values; determine, for a first frequency of the alternating signal wave, a magnitude and phase shift between the aggregate of the instantaneous mechanical parameter values and the aggregate of the instantaneous torque values; and generate, using an aggregate of magnitude and phase shift data for multiple frequencies of the alternating signal wave, a fingerprint to be used in performing diagnostics of motor and linkage.

CALIBRATION OF AN ELECTRONIC ASSEMBLY DURING A MANUFACTURING PROCESS

A method for calibrating an electronic assembly during a manufacturing process is provided, including the steps: determining a calibration value for the assembly which for a predefined input value gives a deviation between an actual output value output by the assembly and a predefined desired output value, transmitting the calibration value to the assembly, and storing the calibration value in the assembly, wherein the calibration value of the assembly is determined by a machine learning method executed in a calibration device, and the machine learning method is trained by training data, which include historical calibration values of a plurality of assemblies of the same type and parameters of assemblies of the same type, which are dependent on the manufacturing process and/or express physical properties.

APPARATUS AND METHOD FOR DETECTING DEFECT OF BATTERY PACK
20220026501 · 2022-01-27 · ·

The present disclosure relates to an apparatus and method for detecting a defect of a battery pack, and more particularly, to an apparatus and method for detecting a defect of a capacitor provided in the battery pack. According to the present disclosure, since a defect of a capacitor is detected using a noise signal, the defect of the capacitor in an assembled battery pack may be easily detected. In addition, since the present disclosure includes a compact circuit structure for noise signal output, noise signal filtering and voltage measurement, the cost for detecting a defect of the capacitor may be reduced.

Measuring device and measuring method using iterative trace-based signal analysis

A measuring device for measuring a signal of interest within a measuring signal is provided. It device comprises a trace determiner, which is adapted to consecutively determine a first stack of traces of the measuring signal, a statistics evaluator, adapted to, after each trace of said first stack of traces is determined by the trace determiner, statistically evaluate if a presence of the signal of interest is detected with a first pre-set degree of certainty, wherein the trace determiner is adapted to cease determining said traces of said first stack of traces, when the statistics evaluator has determined that the signal of interest has been detected to the first pre-set degree of certainty. Preferably a parameter determiner is, adapted to determine measuring parameters, based upon the statistical evaluation.

Method for Monitoring the Vitality of Devices of a Distributed System
20220019208 · 2022-01-20 ·

A method for monitoring the vitality of a number of participant devices of a distributed technical system, wherein each of the participant devices has a number of electronic components, comprises: continuously detecting a plurality of physical environmental and/or operating parameters in each of the participant devices and/or in each of the electronic components of the participant devices; storing for retrieval the plurality of physical environmental and/or operating parameters in a vitality data storage device; calculating for each of the electronic components, on the basis of the plurality of physical environmental and/or operating parameters, a number of statistical characteristics that form vitality parameters and that represent at least one of safety, reliability, or the availability of the electronic component; and initiating exception processing in response to a predefined or predefinable threshold value of a statistical characteristic being reached or exceeded.

TESTING ELECTRODE QUALITY

A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including an intrabody electrode. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which is derived from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating a flaw in the electrode. Other embodiments are also described.

DETECTING ASYMMETRY IN A BIDIRECTIONAL SEMICONDUCTOR DEVICE
20210356512 · 2021-11-18 ·

A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including a bidirectional semiconductor device. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which derives from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating that a property of the bidirectional semiconductor device is asymmetric. Other embodiments are also described.