An example system includes a first circuit board having first conductive traces, where a first conductive trace is for conducting an alternating current (AC) digital signal having an edge; a second circuit board having second conductive traces, where a second conductive trace is within a predefined distance of the first conductive trace to produce a contactless coupling with the first conductive trace, and where the contactless coupling enables electrical energy on the first conductive trace to manifest on the second conductive trace as a transient response that is based on the edge; and circuitry to reconstruct the edge based on the transient response from the second conductive trace.

A measuring device may include: a signal generator for generating a test signal; and a measurement control unit that inputs the generated test signal to a radio frequency (RF) chain including at least one circuit element, detects output signals of a first diode, a second diode, and a third diode which receive, as input signals, signals generated on the basis of a coupled signal for an input test signal of a circuit element of the at least one circuit element and a coupled signal for an output test signal of the circuit element, and measures an S-parameter for the circuit element on the basis of a component signal of the third frequency in the output signal of the first diode, a component signal of the third frequency in the output signal of the third diode, and the output signal of the second diode.

A sensor device is provided for detecting electrical defects in a device under test (DUT). The sensor device includes a signal line configured to conduct a stimulus signal through a first conductor in the DUT; an inductor connected in series with the signal line for providing an inductance; and a ground line arranged adjacent to the signal line and configured to provide a ground path through a second conductor in the DUT for the stimulus signal conducted through the signal line and the first conductor. A resonance frequency for the signal line is determined based on the inductance and an effective capacitance of the signal line generated in response to the stimulus signal. An increase in the resonance frequency indicates an open defect in the first conductor and/or the second conductor, and a decrease in the resonance frequency indicates a short defect between the first conductor and the second conductor.

A test method is configured to test a chip on a circuit under test, wherein the circuit under test further includes a DC-DC converter. The test method includes the operations of: generating a test pulse signal; filtering the test pulse signal to generate a first test DC voltage to the DC-DC converter, wherein the DC-DC converter transforms the first test DC voltage to a second test DC voltage and transmits the second test DC voltage to the chip; and extracting an output signal of the chip to determine a performance of the chip, wherein the chip generates the output signal according to the second test DC voltage.

A system and method are disclosed for formulating a sequential equivalency problem for fault (non)propagation with minimal circuit logic duplication by leveraging information about the location and nature of a fault. The system and method further apply formal checking to safety diagnoses and efficiently models simple and complex transient faults.

The present disclosure provides a troubleshooting system for current sensors including a motor, three current sensors and a controller. The three current sensors respectively sense three phase currents of the three-phase current of the motor to obtain three current sensing values. The controller is configured to control the three-phase current of the motor. When the sum of the three current sensing values is greater than a threshold, the controller controls the three phase currents to be zero, and a first offset sensor and a current offset are obtained. When the sum of the three current sensing values equals the current offset, a second offset sensor is obtained. If the first offset sensor and the second offset sensor are the same current sensor, the controller outputs a warning signal, if the first offset sensor and the second offset sensor are different current sensors, the controller controls the motor to stop operating.

A motor inverter is provided. The motor inverter is coupled to an input power source and a motor and controls the mechanical switch to receive or turn off the input power source. The motor inverter includes primary and secondary auxiliary circuits, a microprocessor, a gate driver, and a motor drive circuit. The primary and secondary auxiliary circuits are coupled to the input power source and outputs first and second output voltages respectively. The microprocessor operates the driving switches of the motor drive circuit through the gate driver to switch the input power source for driving the motor. If the microprocessor determines that the first output voltage is abnormal and the motor rotational speed exceeds a safe speed limit, the microprocessor controls the driving switches to form an active short circuit for stopping the motor, and the microprocessor turns off the mechanical switch for protecting the input power source.

A system for inspecting or screening electrically powered device includes a signal generator inputting a preselected signal into the electrically powered device. There is also an antenna array positioned at a pre-determined distance above the electrically powered device. Apparatus collects RF energy emitted by the electrically powered device in response to input of said preselected signal. The signature of the collected RF energy is compared with an RF energy signature of a genuine part. The comparison determines one of a genuine or counterfeit condition of the electrically powered device.

A measuring device may include: a signal generator for generating a test signal; and a measurement control unit that inputs the generated test signal to a radio frequency (RF) chain including at least one circuit element, detects output signals of a first diode, a second diode, and a third diode which receive, as input signals, signals generated on the basis of a coupled signal for an input test signal of a circuit element of the at least one circuit element and a coupled signal for an output test signal of the circuit element, and measures an S-parameter for the circuit element on the basis of a component signal of the third frequency in the output signal of the first diode, a component signal of the third frequency in the output signal of the third diode, and the output signal of the second diode.

An electronic device having a self-diagnosis function is proposed. In the electronic device, a fault detector is provided on a primary side of a power board, so that fault states of a main board and a load may be detected even when the main board is broken or power is not applied to the main board. In addition, as long as commercial alternating power is input, even in a state where a power switch is turned off, the electronic device is supplied with the power, so that various types of faults in the main board and the load may be detected.