A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device. A method of operating a combined static and dynamic device characterization platform includes receiving, through a user interface on a measurement device, a user input selecting between static and dynamic characterization of one or more devices under test (DUTs), sending the user input through a connection between the measurement device and a power device, receiving the user input at a power device, controlling signals to the one or more DUTs in the power device to perform one of static or dynamic characterization of the one or more DUTs, and sending output data resulting from the characterization to the measurement device.

A control unit comprises a processing device with an electrical connection; a diagnostic circuit, which is electrically connected to the connection; and a sheathing, which completely insulates the connection electrically. At the same time, the diagnostic circuit comprises an electrical interface and is configured to sample an electrical signal at the connection and provide the result via the interface.

There is described a method for assembling or repairing an electrical cable in an environment. The method comprises obtaining a unique identifier of an origin connector of the electrical cable to be assembled or repaired. A computing device receives a reading of the unique identifier of the origin connector of the electrical cable to be assembled or repaired and identifies a connection between the origin connector of the electrical cable to be assembled or repaired and a destination electrical component. At the computing device, there is made a determination of the connection that was identified with a connectivity list required for the electrical cable, from a database, to determine a next step of the assembling or the repairing which depends on the connection identified by the computing device.

An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.

The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme.

A system includes a power supply configured to adjust a voltage supplied to a device under test (DUT) based on one of an input voltage of the DUT supplied to a power supply sense input of the power supply and a feedback signal indicative of an internal voltage of the DUT supplied to the power supply sense input, and a relay circuit configured to transition between supplying the input voltage to the power supply sense input and supplying the feedback signal to the power supply sense input. When supplying the feedback signal to the power supply sense input, the relay circuit establishes an electrical path between the input voltage and the power supply sense input to prevent the power supply sense input from floating during the transition.

A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

A circuit and a method for reducing interference of power on/off to hardware test. The circuit includes: a power unit, a voltage processing unit, a PSU and a to-be-tested hardware. An input terminal of the voltage processing unit is connected to the power unit, an output terminal of the voltage processing unit is connected to an input terminal of the PSU, and an output terminal of the PSU is connected to the to-be-tested hardware; the power unit is configured to provide an operating voltage; the voltage processing unit is configured to eliminate electric sparks caused by instability of the operating voltage at an instant of power on/off; the PSU is configured to convert a stable operating voltage outputted from the voltage processing unit into a direct current voltage required for the to-be-tested hardware; and the to-be-tested hardware is configured to receive the direct current voltage outputted from the PSU.

Presented embodiments facilitate efficient and effective access to a device under test. In one embodiment, a test system comprises: a primitive configured to control testing of a device under test (DUT) and a device interface board (DIB). The device interface board comprises: a loadboard, an environmental control component and a device under test access interface. The loadboard is configured to selectively couple with a device under test and a primitive. The environmental control component is configured to control environmental conditions. The device under test access interface is configured to allow robotic manipulation of the device under test. The manipulation can include selectively coupling the device under test to the loadboard. The device under test access interface can be configured to enable unobstructed access for robotic manipulation of the device under test.

A testing apparatus comprises a test interface board comprising a plurality of socket interface boards, wherein each socket interface board comprises: a) an open socket to hold a DUT; b) a discrete active thermal interposer comprising thermal properties and operable to make thermal contact with the DUT; c) a superstructure operable to contain the discrete active thermal interposer; and d) an actuation mechanism operable to provide a contact force to bring the discrete active thermal interposer in contact with the DUT.