Protocol analysis can include simulating, using a processor, a circuit design including a protocol analyzer embedded therein. The protocol analyzer can be coupled to low-level signals of an interface of the circuit design. During the simulating, the protocol analyzer detects a transaction from the low-level signals received from the interface. Transaction data is generated by the protocol analyzer specifying the transaction. The transaction data is output from the protocol analyzer.

A semiconductor device inspection apparatus includes: a light sensor that detects light from a semiconductor device as a DUT to which an electric signal has been input; an optical system that guides light from the semiconductor device to the light sensor; and a control device electrically connected to the light sensor. The control device includes: a data reading unit that reads mask data indicating a mask layout of the semiconductor device; a search unit that searches for a position of a transistor in the semiconductor device on the basis of polygon data of a gate layer of the semiconductor device included in the mask data; a setting unit that sets the searched position of the transistor as an optical measurement target position; and a measurement unit that performs optical measurement for the set optical measurement target position to acquire a measurement result.

A method, apparatus, and system to control and test a solar inverter are provided. The method commissions a solar inverter of a solar plant before it is placed into power production. The commissioning process verifies that the inverter to be tested is functioning as intended by connecting a first inverter to the inverter to be commissioned, and using the first inverter to emulate the power grid without being connected to the power grid, and circulate reactive and limited active power between the first inverter and the inverter to be commissioned.

Example test generation systems and methods are described. In one implementation, a hardware test suite generator includes a script reader that receives a test definition script and parses the test definition script. A test generator receives the parsed test definition script from the script reader and creates a test suite. A template reader receives a test definition template and parses the test definition template. A code generator receives the parsed test definition script from the script reader and receives the parsed test definition template from the template reader.

An analog-circuit fault diagnosis method based on continuous wavelet analysis and an ELM network comprises: data acquisition: performing data sampling on output responses of an analog circuit respectively through Multisim simulation to obtain an output response data set; feature extraction: performing continuous wavelet analysis by taking the output response data set of the circuit as training and testing data sets respectively to obtain a wavelet time-frequency coefficient matrix, dividing the coefficient matrix into eight sub-matrixes of the same size, and performing singular value decomposition on the sub-matrixes to calculate a Tsallis entropy for each sub-matrix to form feature vectors of corresponding faults; and fault classification: submitting the feature vector of each sample to the ELM network to implement accurate and quick fault classification. The method of the invention has a better effect on extracting the circuit fault features and can be used to implement circuit fault classification accurately and efficiently.

A fault diagnosis method for power electronic circuits based on optimizing a deep belief network, including steps. (1) Use RT-LAB hardware-in-the-loop simulator to set up fault experiments and collect DC-link output voltage signals in different fault types. (2) Use empirical mode decomposition to extract the intrinsic function components of the output voltage signal and its envelope spectrum and calculate various statistical features to construct the original fault feature data set. (3) Based on the feature selection method of extreme learning machine, remove the redundancy and interference features, as fault sensitive feature data set. (4) Divide the fault sensitive feature set into training samples and test samples, and primitively determine the structure of the deep belief network. (5) Use the crow search algorithm to optimize the deep belief network. (6) Obtain the fault diagnosis result.

Embodiments include apparatuses, methods, and systems for testing an IC of an in-vehicle system of a CA/AD vehicle includes a storage device and processing circuitry coupled with the storage device. A gate level fault group is provided to include one or more gate level faults of a fault model associated to a gate level circuit element of the gate level netlist of the IC with substantially same fault controllability or observability characteristics. A correlated RTL fault group is determined to be associated to a RTL circuit node, where the RTL circuit node of the RTL netlist corresponds to the gate level circuit element. Other embodiments may also be described and claimed.

An example method comprises receiving historical sensor data from sensors of components of wind turbines, training a set of models to predict faults for each component using the historical sensor data, each model of a set having different observation time windows and lead time windows, evaluating each model of a set using standardized metrics, comparing evaluations of each model of a set to select a model with preferred lead time and accuracy, receive current sensor data from the sensors of the components, apply the selected model(s) to the current sensor data to generate a component failure prediction, compare the component failure prediction to a threshold, and generate an alert and report based on the comparison to the threshold.

An actuator simulator card that is programmable with one or more actuator simulation models is provided. The actuator simulator card may include a first interface configured to communicate with a programmable computer, a second interface configured to communicate with an actuator controller, and a simulation module in communication with each of the first interface and the second interface. The simulation module may be configured to receive at least one actuator simulation model corresponding to at least one actuator from the first interface, receive excitation signals and command signals for operating the actuator from the second interface, and determine simulated feedback signals based on the excitation signals, the command signals, and the actuator simulation model.

An inspection system includes a plurality of inspection apparatuses, and a data processing apparatus capable of communicating with the plurality of inspection apparatuses. The data processing apparatus includes a storage part storing a model that determines a causal relationship between an apparatus parameter related to setting of the plurality of inspection apparatuses and index data obtained when the plurality of inspection apparatuses are operated, a collection part collecting the apparatus parameter and the index data, a determination part determining whether or not the index data is included in a predetermined allowable range, and a calculation part calculating an adjustment amount for adjusting the apparatus parameter, based on the apparatus parameter and the index data, and the model, when it is determined that the index data is not included in the predetermined allowable range.