According to the invention, in an energy accumulator emulation the accuracy of energy accumulator emulation is increased in that a load current demand on the energy accumulator (20) is converted to a cell tester load current (I.sub.Z) of a real reference cell (6) based on the configuration of the energy accumulator (20) and the cell tester load current (I.sub.Z) is applied to the reference cell (6), and thereby the cell voltage (U.sub.Z) of the reference cell (6) is measured and the cell voltage (U.sub.Z) of the reference cell (6) is converted to a first energy accumulator voltage (U.sub.B) based on the configuration of the energy accumulator (20), a second energy accumulator voltage (U.sub.B_Mod) is calculated from the energy accumulator model (10) and the load current demand and the first energy accumulator voltage (U.sub.B) is compared to the second energy accumulator voltage (U.sub.B_Mod) and the energy accumulator model (10) is adjusted if the first energy accumulator voltage (U.sub.B) deviates by a specified tolerance range (TB) from the second energy accumulator voltage (U.sub.B_Mod).

Method for detecting rail switches degradation and failures, the method having the steps of applying a Discrete Wavelet Transform to stored measurement data relative to a switch move to be analysed and obtaining a feature vector associated with said switch move and including Discrete Wavelet Transform coefficients delivered by the applied Discrete Wavelet Transform; comparing the obtained feature vector with feature vectors associated with rail switch moves previously obtained and associating each to a respective health class among several given health classes; and determining a health class for the said switch move to be analyzed by selecting one of the health classes associated with the previously obtained feature vectors based upon the comparison step.

A labeling system for defect classification having a storage unit and a processing unit is provided. The storage unit stores a defect classification module, a defect labeling module, and a catalog generation module. The processing unit performs the modules aforementioned. The defect classification module is configured to provide a defect type information. The defect labeling module marks a defect type label to at least one test object image according to an image feature and the defect type information on the at least one test object image. The catalog generation module receives the labeled test object images and moves test object images having the same defect type label to a corresponding file catalog.

The present disclosure is a battery emulator that permits the development and testing of battery software, firmware, and/or circuitry with lowered risk of shock, explosion, fire, or other dangerous conditions. The battery emulator may include a single input voltage source that provides an input voltage to an adjustable voltage regulator. The battery emulator further includes a user control device coupled to the adjustable voltage regulator and configured to control an output of the adjustable voltage regulator, wherein the output of an adjustable voltage regulator is configured to replicate an output voltage of a single battery cell of a multi-cell battery. The battery emulator further includes voltage isolation circuitry which isolates the input voltage and/or output voltage from an adjustable voltage regulator, preventing them from interfering with the user control device.

The present disclosure relates to a system, an apparatus, and a method for managing health condition of at least one rotating system. The method includes receiving, by a processing unit, operational data associated with the rotating system in real-time, from one or more sensing units. The operational data includes parameter values corresponding to an operation of the rotating system. Further, a virtual replica of the rotating system is configured using the operational data. A behavior of the rotating system is simulated on a simulation instance of the rotating system based on the configured virtual replica. The simulation results are analyzed to determine an abnormality in the health condition of the rotating system. The abnormality corresponds to a health status of an internal component of the rotating system. Further, a notification indicating the abnormality is generated, on a Graphical User Interface.

A device, system, and a computer-implemented method a for identifying an anomaly in an operation of a device includes comparing, by an electrical power analyzer, a current power draw signature of the device with a known power draw signature of the device. There is a determining as to whether at least one anomaly is present in the current power draw signature. A warning is generated in response to determining the at least one anomaly is present in the current power draw signature.

An apparatus for determining a single decision function [d%(x%)] is configured to obtain measurements [x] from a plurality of devices under test corresponding to stimulating signals applied to the plurality of devices under test. The stimulating signals correspond to a set of tests performed on the plurality [N] of devices under test. The apparatus may further determine a subset of tests from the set of tests, such that the subset of tests is relevant for indicating whether the plurality of devices under test pass the set of tests. The apparatus may also determine the single decision function applicable to measurements from an additional device under test tested using the subset of tests, such that the single decision function is adapted to predict a test result [%(x%)] for the set of tests on the basis of the subset of tests.

An apparatus for performing the following. The apparatus maintains, in a memory, information on a computational model for thermal behavior of layers of an insulated-gate bipolar transistor, IGBT, module. The apparatus obtains measurements of the dissipated power at the semiconductors and the ambient temperature and determines one or more current values of one or more temperatures of the IGBT module based on a switching delay of the IGBT module. The apparatus calculates a current estimate of a joint state-parameter space of the computational model using a Bayesian filter and the computational model taking as inputs the dissipated power and the ambient temperature. The joint state-parameter space includes the one or more temperatures, one or more thermal loss parameters and one or more wear parameters. The one or more current values of the one or more temperatures are used as observations in the Bayesian filter.

A simulation apparatus includes a database configured to a set line parameter for a system line configuring a power system; a parameter error detector configured to compare surveyed data measured in the system line and the line parameter to detect error of the line parameter; a system analysis simulator configured to perform a system analysis simulation based on the surveyed data and the line parameter; and a monitor configured to display an error detection result of the line parameter from the parameter error detector and a system analysis simulation result performed in the system analysis simulator.

Disclosed herein are structures and techniques for exposing circuitry in die testing. For example, in some embodiments, an integrated circuit (IC) die may include: first conductive contacts at a first face of the die; second conductive contacts at a second face of the die; die stack emulation circuitry; other circuitry; and a switch coupled to the second conductive contacts, the die stack emulation circuitry, and the other circuitry, wherein the switch is to couple the second conductive contacts to the other circuitry when the switch is in a first state, and the switch is to couple the die stack emulation circuitry to the other circuitry when the switch is in a second state different from the first state.