A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a tester system diagnostic method includes forwarding test signals to a loopback component; receiving the test signals from the loopback component; and analyzing the test signals to diagnose whether or not the test system is experiencing problems associated with electrostatic discharges, including analysis of eye scan configuration data corresponding to characteristics of the test signals. In one exemplary implementation, analyzing the eye scan configuration data, including analyzing symmetry of a graphical representation (e.g., eye pattern, eye diagram, etc.) of the eye scan configuration data with respect to a horizontal graphical representation axis.

A method and device for testing a memory array structure, and a non-transitory storage medium are provided. The method includes that: respective storage data corresponding to each preset test pattern is written into a to-be-tested memory array, the each preset test pattern being one of preset test patterns in a preset test pattern library; a row aggressing test is repeatedly performed on the to-be-tested memory array until a bit error occurs in the storage data, to obtain row aggressing test times, corresponding to the each preset test pattern, of the to-be-tested memory array, where the bit error characterizes that the storage data has changed; a target preset test pattern corresponding to the to-be-tested memory array is determined from the preset test pattern library based on the row aggressing test times; and an array structure of the to-be-tested memory array is determined based on the target preset test pattern.

A method and device for testing a memory array structure, and a non-transitory storage medium are provided. The method includes that: respective storage data corresponding to each preset test pattern is written into a to-be-tested memory array, the each preset test pattern being one of preset test patterns in a preset test pattern library; a row aggressing test is repeatedly performed on the to-be-tested memory array until a bit error occurs in the storage data, to obtain row aggressing test times, corresponding to the each preset test pattern, of the to-be-tested memory array, where the bit error characterizes that the storage data has changed; a target preset test pattern corresponding to the to-be-tested memory array is determined from the preset test pattern library based on the row aggressing test times; and an array structure of the to-be-tested memory array is determined based on the target preset test pattern.

A system for generating images on a test and measurement device includes a first input for accepting a waveform input signal carrying sequential digital information and an image generator structured to generate a visual image using a segment of the waveform input only when two or more sequential codes of digital information match sequential codes carried in the sequential digital information of the segment of the waveform input. A user-defined state-machine comparator may be used to determine which segments of the waveform input signal are used in the image generation.

An error rate measuring apparatus that measures whether or not an FEC operation of the device under test is possible based on a comparison result of the signal received from the device under test and a test signal includes an operation unit that sets a codeword length and an FEC symbol length of the FEC corresponding to a communication standard of the device under test, a data comparison unit that compares bit string data obtained by converting the signal received from the device under test with error data to detect an FEC symbol error of each FEC symbol length, a display unit that associates the bit string data of the FEC symbol length as one point with one unit region of a display region and performs color-coding display depending on presence or absence of occurrence of the FEC symbol error by each FEC symbol length.

A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.

A method for processing blocks of flash memory to decrease raw bit errors from the flash memory is provided. The method includes identifying one or more blocks of the flash memory for a refresh operation and writing information regarding the identified blocks, to a data structure. The method includes issuing background reads to the identified blocks, according to the data structure, as the refresh operation. The method may be embodied on a computer readable medium. In some embodiments the background reads may be based on a time based refresh responsive to an increase in raw bit error count in the flash memory over time.

Provided is a technique for achieving improvement of usability in setting parameters. An error rate measuring apparatus includes a display unit that displays input boxes for inputting one Codeword length and one FEC Symbol length of FEC on a setting screen, and an operation unit that inputs the one Codeword length and the one FEC Symbol length to the corresponding input boxes according to a communication standard of a device under test. A graphic of one Codeword, a graphic of one FEC Symbol, and a graphic of one Codeword including an error for identifying a configuration relationship of an FEC Symbol to a Codeword of the FEC and a correspondence relationship of an FEC Symbol Error to the Codeword are displayed on the setting screen corresponding to the input box of each of the one Codeword length and the one FEC Symbol length of the FEC.

Compensating for signal loss, including determining a first expected loss at a first frequency and a second expected loss at a second frequency at a receiver associated with a first lane of a PCB; calculating an expected rate of change of signal loss between the first and the second frequencies based on the first and the second expected losses; calculating a first measured loss of a first signal transmitted at the first frequency and a second measured loss of a second signal transmitted at the second frequency from a transmitter to the receiver along the first lane of the PCB; calculating a measured rate of change of signal loss between the first and second frequencies based on the first and the second measured losses; comparing the measured rate of change with the expected rate of change; compensating a gain of a signal transmitted from the transmitter to the receiver.