A glitch detector includes an input flip-flop clocked by a clock signal and having a non-inverting data output, an inverting data output, and a data input receiving input from the inverting data output, the input flip-flop generating a divided version of the clock signal at the non-inverting data output. A configurable delay chain receives the divided version of the clock signal and generates a delayed version of the divided version of the clock signal as a delay output. An intermediate flip-flop clocked by the clock signal has a data input receiving the delay output, the intermediate flip-flop generating an intermediate output as a function of the delay output. A logic circuit receives the divided version of the clock signal and the intermediate output, and generates a glitch detect signal by performing a logical operation on the divided version of the clock signal and the intermediate output.

An apparatus is provided to measure vulnerability of a circuit to transient errors. The circuit includes processing circuitry and a plurality of flops. The apparatus includes categorisation obtaining circuitry that obtains a vulnerability categorisation of the flops. The vulnerability categorisation indicates whether each flop is vulnerable, conditionally vulnerable, or isolated. Analysis circuitry determines, for at least one cycle of the processing circuitry, a set of the flops that are currently vulnerable, based on the vulnerability categorisation of the flops.

A latch is provided. The latch includes a plurality of storage nodes including a plurality of data storage nodes configured to store a data bit having one of two states and a plurality of complementary data storage nodes configured to store a complement of the data bit. The latch includes a plurality of supply voltage multi-dependency stages respectively corresponding to the plurality of storage nodes. Each supply voltage multi-dependency stage has an output coupled to a storage node and at least two control inputs respectively coupled to at least two other storage nodes of the plurality of storage nodes. The supply voltage multi-dependency stage is configured to cause a state of the data bit stored in the storage node to change from a first state to a second state in response a change in both states of two data bits respectively stored in the at least two other storage nodes.

A glitch detector includes an input flip-flop clocked by a clock signal and having a non-inverting data output, an inverting data output, and a data input receiving input from the inverting data output, the input flip-flop generating a divided version of the clock signal at the non-inverting data output. A configurable delay chain receives the divided version of the clock signal and generates a delayed version of the divided version of the clock signal as a delay output. An intermediate flip-flop clocked by the clock signal has a data input receiving the delay output, the intermediate flip-flop generating an intermediate output as a function of the delay output. A logic circuit receives the divided version of the clock signal and the intermediate output, and generates a glitch detect signal by performing a logical operation on the divided version of the clock signal and the intermediate output.

A flip flop includes a data input, a clock input, a test chain input, a test chain output, a monitoring circuit, and an alert transmission circuit. The monitoring circuit is adapted to generate an alert if the time between arrival of a data bit and a clock edge is less than a threshold. The alert transmission circuit is adapted to apply during a monitoring phase an alert level to the test chain output in the event of an alert generated by the monitoring circuit, and to apply the alert level to the test chain output when an alert level is received at the test chain input.

An apparatus including a chamber is provided herein. The chamber includes: a radiation source; a load board slot configured for: (i) holding a load board; and (ii) connecting the load board to an automatic testing equipment. The chamber further includes at least one movable device for positioning the load board slot relative to the radiation source or positioning the radiation source relative to the load board slot; and a controller for receiving instructions and controlling the at least one movable device according to the received instructions. The chamber, including the automatic testing equipment, is configured for constructing and operating soft errors testing by positioning the load board slot, which holds a DUT (Device Under Test), relative to the radiation source or by positioning the radiation source relative to the load board slot, and counting the number of DUT datum errors, which are the soft errors.

A latch is provided. The latch includes a plurality of storage nodes including a plurality of data storage nodes configured to store a data bit having one of two states and a plurality of complementary data storage nodes configured to store a complement of the data bit. The latch includes a plurality of supply voltage multi-dependency stages respectively corresponding to the plurality of storage nodes. Each supply voltage multi-dependency stage has an output coupled to a storage node and at least two control inputs respectively coupled to at least two other storage nodes of the plurality of storage nodes. The supply voltage multi-dependency stage is configured to cause a state of the data bit stored in the storage node to change from a first state to a second state in response a change in both states of two data bits respectively stored in the at least two other storage nodes.

Systems and methods are provided for testing a threshold energy required to cause a latchup on an electronic component. An exemplary method includes applying a series of laser pulses to a testing object with a pulsed laser unit. The testing object is connected to a testing circuit which can measure the energy of each of the series of laser pulses, and detect whether a pulse of the series of laser pulses resulted in a latchup on the testing object. Upon detecting the pulse, the method provides for logging the energy of the pulse using a recording unit and logging the latchup status of the test device. If a latchup is detected, the testing circuit automatically mitigates the latchup event.

Disclosed are exemplary embodiments of transient scanning data visualization methods and systems. Also disclosed are exemplary embodiments of embedded transient scanning systems and methods.

Digital testing is performed on an integrated circuit while radiation upsets are induced at locations of the integrated circuit. For each digital test, a determination is made as to whether there is a variation in the output of the digital test from an expected output of the digital test. If there is variation, a time of the variation is indicated. In one example, a location of a defect in the digital circuit can be determined from the times of the variations. In other embodiments, a mapping of the digital circuit can be made from the times.