A method performed at least partially by a processor includes performing a test sequence. In the test sequence, a test pattern is loaded into a circuit. The test pattern is configured to cause the circuit to output a predetermined test response. A test response is unloaded from the circuit after a test wait time period has passed since the loading of the test pattern into the circuit. The unloaded test response is compared with the predetermined test response.

Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

Embodiments of the present disclosure relate to solutions for introducing personalization data in nonvolatile memories of a plurality of integrated circuits, comprising writing in the nonvolatile memory of a given integrated circuit a static data image, corresponding to an invariant part of nonvolatile memory common to the plurality of integrated circuits, and a personalization data image representing data specific to the given integrated circuit.

Embodiments of the present disclosure relate to solutions for introducing personalization data in nonvolatile memories of a plurality of integrated circuits, comprising writing in the nonvolatile memory of a given integrated circuit a static data image, corresponding to an invariant part of nonvolatile memory common to the plurality of integrated circuits, and a personalization data image representing data specific to the given integrated circuit.

The present disclosure generally relates to an embedded physical layer (EPHY) for a field programmable gate array (FPGA). The EPHY for the FPGA is for a testing device that can receive and transmit in both the high speed PHYs, as well as low speed PHYs, such as MIPI PHYs (MPHYs), to meet universal flash storage (UFS) specifications. The testing device with the EPHY for the FPGA provides flexibility to support any specification updates without the need of application specific (ASIC) production cycles.

Techniques include configuring a sequential circuit monitor having been generated by applying a quantifier elimination to each random bit position of random inputs associated with a formal verification driver and selecting a value for random inputs to drive a next stage logic of sequential circuit simulation monitor, a state of the next stage logic being used by sequential circuit simulation monitor to generate sequential inputs to match those permitted by formal verification driver, formal verification driver being specified for a DUT input interface. An equivalence check between sequential circuit simulation monitor and original formal driver matches the same set of sequential inputs permitted original formal driver. The sequential circuit simulation monitor is coupled to a simulation environment and the DUT in simulation environment, sequential circuit simulation monitor being configured to flag an input sequence from the simulation environment not permitted by formal verification driver based on the sequential inputs.

The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer’s system. Additional embodiments are also provided and described in the disclosure.

A multiple-level driver circuit, such as for providing several different signals to a device under test (DUT) in an automated test system, can include multiple diode bridge circuits. In an example, a first diode bridge circuit is configured to receive a multiple-valued input voltage signal, having at least two different DC voltage signal levels, at an input node and, in response, to selectively provide a corresponding multiple-valued output voltage signal at an output node. The first diode bridge circuit can operate in a conducting and non-commutated state when it is used to selectively provide the multiple-valued output voltage signal at the output node.

The present disclosure provides an electronic tester comprising at least one test fixture that couples to a device under test, at least one test instrument coupled to at least one of the test fixtures that measures signals in the device under test, a test controller that controls the device under test while the test is performed, and an adapter module comprising a general control interface that is coupled to the test controller, and a DUT-specific communication interface that couples to the device under test to communicate with the device under test, wherein the test controller controls the device under test with generic control signals sent to the general control interface, and wherein the adapter module translates the general control signals into DUT-specific control signals and transmit the DUT-specific control signals to the device under test. Further, the present disclosure provides a respective method.

Approaches for simulating a circuit include receiving simulation input data from a testbench executing on a computer system by a simulator interface executing on the computer system. The simulator interface receives simulation output data the according to a hardware bus protocol specified by a simulated circuit for communication and simulates handshaking with the simulated circuit according to the hardware bus protocol in response to receiving the simulation input data and simulation output data. The simulator interface provides the simulation input data to the simulated circuit by according to the hardware bus protocol and provides the simulation output data to the testbench.