G01R33/323

Method for Measuring Phase Currents of a Device Under Test, in Particular of an Inverter

A method is for measuring phase currents of a device under test, in particular of an inverter, in which a sensor arrangement, which has a component including a crystal lattice with a defect, is arranged in a region of the device under test. The method includes using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, the magnetic fields each in turn being brought about by one of the phase currents of the device under test, and calculating a vector of the phase currents from the vector of the magnetic fields based on a coefficient matrix.

Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy

A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.

Systems, Apparatus, and Methods of Nonlinear Terahertz (THz) Magnetic Resonance Measurement

A nonlinear terahertz (THz) spectroscopy technique uses a sample illuminated by two THz pulses separately. The illumination generates two signals B.sub.A and B.sub.B, corresponding to the first and second THz pulse, respectively, after interaction with the sample. The interaction includes excitation of at least one ESR transition in the sample. The sample is also illuminated by the two THz pulses together, with an inter-pulse delay τ, generating a third signal B.sub.AB. A nonlinear signal BNL is then derived via B.sub.NL=B.sub.AB−B.sub.A−B.sub.B. This nonlinear signal B.sub.NL can be then processed (e.g., Fourier transform) to study the properties of the sample.

High-frequency magnetic field generating device

A high-frequency magnetic field generating device includes two coils arranged with a predetermined gap in parallel with each other, the two coils (a) in between which electron spin resonance material is arranged or (b) arranged at one side from electron spin resonance material; a high-frequency power supply that generates microwave current that flows in the two coils; and a transmission line part connected to the two coils, that sets a current distribution so as to locate the two coils at positions other than a node of a stationary wave.

Dynamic decoupling in solid state spin ensembles

Long spin coherence lifetimes are realized for ensembles of electronic spin impurities in solid state spin systems, for example NV color centers in diamond, by using spin-control RF pulse sequences to provide dynamic decoupling of the ensembles of spin impurities from environmental sources of decoherence such as dipolar and hyperfine interactions with proximal spin and other paramagnetic impurities in diamond. In this way, the measurement sensitivity of the coherent evolution of ensembles of solid state spin impurities are increased. Using the Carr-Purcell-Meiboom-Gill (CPMG) pulse sequence, the spin coherence lifetimes of NV ensembles can be extended to more than 2 ms in room temperature diamond, and sensitivity of magnetometry that uses NV ensembles can be increased.

MAGNETIC MEASURING DEVICE

A magnetic measuring device includes: a determination part configured to identify four maximum inclination points in an average value in a visual field of a light detection magnetic resonance spectrum and configured to determined a degree of decrease in relative fluorescence intensity and a microwave frequency at each of the maximum inclination points; a setting part configured to set a reference decrease degree of the relative fluorescence intensity in a predetermined area and configured to set operating point frequency initial values at four points at which the reference decrease degree is achieved, near the microwave frequencies at the respective maximum inclination points; a frequency update part configured to update operating point frequencies at the four points; and a frequency correction part configured to input the updated operating point frequencies to a microwave oscillator as corrected operating point frequencies.

Integrated optical nanoscale probe
09779769 · 2017-10-03 · ·

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).

Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
09778329 · 2017-10-03 · ·

A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The probe tip is scanned over an area of a sample with an electric charge, such as a field effect transistor or flash memory. Optically Detected Spin Resonance (ODMR) is measured as the probe tip is scanned over the area of the sample, from which a characteristic of the area of the sample with the electric charge may be determined.

Method and system for controlling neural activity in the brain
11234631 · 2022-02-01 · ·

A method and system for controlling neural activity in the brain, including performing a source localization procedure and a neurostimulation procedure, and using the former as a monitor to provide for feedback control of the latter.

DIAMOND AUTHENTICATION PROCESS AND SYSTEM THEREFORE

A process of determining the type of a diamond of unknown type, said process including the steps of (i) applying a laser input signal to a diamond of unknown type such the NV.sup.− centres or other C centres such that fluorescence is generated from said diamond; (ii) applying a magnetic field to said diamond and applying a variable microwave frequency to said diamond; (iii) acquiring the light intensity of fluorescence as a function of microwave frequency; and (iv) determining the type of the unknown diamond by comparing the light intensity of fluorescence as a function of microwave frequency of (iii) with light intensity versus microwave frequency characteristics diamond of known of a plurality of diamonds known types.