Method for Measuring Phase Currents of a Device Under Test, in Particular of an Inverter
20230176154 · 2023-06-08
Inventors
- Andreas Brenneis (Renningen, DE)
- Tino Fuchs (Tuebingen, DE)
- Felix Michael Stuerner (Illerkirchberg, DE)
- Robert Roelver (Calw-Stammheim, DE)
Cpc classification
G01R15/245
PHYSICS
G01R15/207
PHYSICS
G01R33/1284
PHYSICS
G01R33/323
PHYSICS
G01R15/14
PHYSICS
International classification
G01R33/32
PHYSICS
G01R33/02
PHYSICS
Abstract
A method is for measuring phase currents of a device under test, in particular of an inverter, in which a sensor arrangement, which has a component including a crystal lattice with a defect, is arranged in a region of the device under test. The method includes using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, the magnetic fields each in turn being brought about by one of the phase currents of the device under test, and calculating a vector of the phase currents from the vector of the magnetic fields based on a coefficient matrix.
Claims
1. A method for measuring phase currents of a device under test in which a sensor arrangement, which has a component comprising a crystal lattice with at least one defect, is arranged in a region of the device under test, the method comprising: using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, which in turn are induced by one phase current of a plurality of phase currents of the device under test; and calculating a vector of the plurality of phase currents from the vector of the magnetic fields based on a coefficient matrix.
2. The method as claimed in claim 1, wherein the device under test has three phases and the method further comprises: positioning the sensor arrangement at approximately the same distance to the three phases of the device under test.
3. The method as claimed in claim 1, wherein the at least one defect has a fluorescent effect and the method further comprises: determining the magnetic field using an optically detected magnetic resonance (“ODMR”).
4. The method as claimed in claim 1 wherein the at least one defect induces a magnetic resonance and the method further comprises: determining the magnetic field using a photoelectric detection of the magnetic resonance (“PDMR”) measurement.
5. The method as claimed in claim 1, further comprising: determining the coefficient matrix using a calibration.
6. The method as claimed in claim 1, further comprising: determining the coefficient matrix using a trained neural network (550).
7. A sensor arrangement for measuring phase currents of a device under test, the sensor arrangement comprising: a component comprising a crystal lattice with at least one defect, the component arranged in a region of the device under test and the component is configured to (i) use the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, which in turn are induced by one phase current of a plurality of phase currents of the device under test, and (ii) calculate a vector of the plurality of phase currents from the vector of the magnetic fields based on a coefficient matrix.
8. The sensor arrangement as claimed in claim 7, wherein the crystal lattice is a diamond.
9. The sensor arrangement as claimed in claim 8, wherein the at least one defect is formed as a nitrogen defect or a nitrogen-vacancy center (“NV center”).
10. The sensor arrangement as claimed in claim 7, further comprising: at least one microwave source.
11. The sensor arrangement as claimed in claim 7, wherein the device under test includes an inverter.
12. The method as claimed in claim 1, wherein the device under test includes an inverter.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0024]
[0025]
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
[0032]
EMBODIMENTS OF THE INVENTION
[0033] The invention is illustrated schematically in the drawings by reference to embodiments and is described in detail below with reference to the drawings.
[0034]
[0035] The method presented uses a magnetic field sensor in the following. An example of a magnetic field sensor is a magnetometer. This is a sensing device for measuring magnetic flux densities. Magnetic flux densities are measured in the Tesla (T) unit. Common magnetometers are, for example, Hall sensors, Förster probes, proton magnetometers, Kerr magnetometers, and Faraday magnetometers.
[0036] In addition to these types of magnetometer, it is also known to use diamonds, in the lattices of which defects or discontinuities are provided, which show a detectable behavior depending on an applied magnetic field. In these, a negatively charged color center consisting of nitrogen and a defect (nitrogen vacancy center, NV center) in a diamond is used for highly sensitive measurements of magnetic fields, electrical fields, mechanical stresses, and temperatures. Reference is made to
[0037] The left-hand side of
[0038] On the right hand side, the energy level diagram 30 of the negatively charged NV center 14 is shown. A ground state .sup.3A.sub.2 32 is a spin triplet with total spin s = 1. The states 34 with magnetic spin quantum number m.sub.s = +- 1 are energetically shifted compared to state 36 with m.sub.s = 0. A state .sup.3E 38 and an intermediate state 40 are also shown. A microwave frequency of 2.87 GHz, corresponding to a splitting energy or zero-field splitting D.sub.gs, is shown in the bracket 42. The zero-field splitting is an intrinsic variable that is independent of the irradiated MW field or the MW frequency. It is approximately 2.87 GHz and is, in particular, temperature-dependent. The following relationship applies to the determination of the resonance frequency:
where ΔT indicates the deviation from room temperature, β the temperature-induced shift of the zero-field splitting with β approximately -74.2 kilohertz/Kelvin, y.sub.NV is the gyromagnetic ratio of the NV center, and B.sub.0 is the field strength of an external magnetic field.
[0039] The quantum technologies used in the magnetic field sensors presented offer crucial advantages over classical sensor principles, which underline the disruptive potential of quantum technology. With nitrogen defects, the following specific advantages are obtained: [0040] ultra-high sensitivities (1 pT/√Hz), [0041] vector magnetometry, i.e. a direction determination of the magnetic field is possible, [0042] high measurement range (> 1 Tesla), [0043] linearity (Zeeman effect), [0044] no degradation, as the measurement is based on quantum mechanical states, similar to those in the hydrogen atom, where the Rydberg constant is a fixed energy which is a constant for all atoms independent of location and time, [0045] it is possible to determine external magnetic fields vectorially at the same time based on the four possible spatial directions of the NV axes present in the diamond.
[0046] In order to read out a sensor based on NV centers, the magnetic resonance of the triplet of the ground state is optically detected, see .sup.3A state in
[0047]
[0048]
[0049]
[0050] A first curve 110 shows the resonance at B = 0, a second curve 112 shows the resonance at B = 2.8 mT with the negative peaks ω.sub.1 114 and ω.sub.2 116, a third curve 120 shows the resonance at B = 5.8 mT and a fourth curve 122 shows the resonance at 8.3 mT.
[0051]
[0052] On the right-hand side a graph 430 is shown in which the microwave frequency [GHz] is plotted on the abscissa 432 and the fluorescence [arb. units] is plotted on the ordinate 434. The graph 430 shows fluorescence dips, a first dip 440 for the first bond a 410, a second dip 442 for the second bond b 412, a third dip 444 for the third bond c 414, and a fourth dip 446 for the fourth bond d 416.
[0053] In this unit cell 400, the NV center 404 has four possible ways of arranging itself in the crystal. Since the angle between the magnetic field direction and crystal axis is different for each crystal axis, different degrees of frequency splits occur in the NV centers, depending on the respective crystal direction. This results in up to four associated pairs of fluorescence dips in the fluorescence spectrum, as can be seen on the right-hand side of graph 430. By evaluating the resonance frequency for each crystal direction, the magnetic field direction and strength can be extracted.
[0054]
[0055] The fluorescent light, red-shifted with respect to the excitation light, see
[0056] Since the NV center in the single-crystalline diamond has four possible ways of arranging itself in the crystal lattice, see
[0057] In order to be able to obtain vector information even in the case of weak external magnetic fields, suitable technical measures should be taken to ensure that the contributions of all four possible NV orientations in the diamond crystal can be distinguished in the ODMR spectrum even without a magnetic field acting externally on the sensor. This can be effected by a static magnetic bias field, which is provided within the sensor by appropriate technical measures. However, this bias field should have a field strength that is as homogeneous as possible within the sensitive diamond volume, as inhomogeneities of the bias field affect the sensitivities of the sensor.
[0058] The sensitivity of a diamond magnetometer is calculated as:
[0059] The input parameters include a noise signal, which in optical sensors is equal to the photon shot noise as a physical limit, as well as the gyromagnetic ratio η.sub.NV, i.e. a material constant, the intensity I.sub.0 of the fluorescence, the contrast C of the ODMR (contrast) and the line width Δν, the FWHM of the optically detectable resonance.
[0060] Since in the sensitive diamond volume any deviation of the bias field from its target value would lead to a different position of the magnetic resonance, a bias-field gradient in the diamond volume leads to a broadening of the resonance and thus a deterioration of the sensitivity.
[0061] For effective splitting of the four NV orientations the strength of the bias field should be between 100 .Math.T and 10 mT, ideally around 1 mT. In order to enable a sensitivity of 1 pT/√Hz, the bias field must not deviate from the target value by more than 1 per mill in the region of the diamond volume, i.e. for 1 mT by a maximum of 1 .Math.T.
[0062] The method presented uses a vector magnetometer based on an ODMR measurement at NV centers in a diamond, which is typically positioned at approximately the same distance to the three phase conductors of an inverter. Reference is made to
[0063]
[0064] Reference number 520 shows a surface plot of the B.sub.y component of the magnetic flux density in Tesla, which is induced by the three phase currents, namely I.sub.1 = 1000 A, I.sub.2 = -500 A, I.sub.3 = -500 A.
[0065] From the linear relationship between the electric current and the magnetic flux density induced thereby on the one hand, and the linear superposition of the magnetic fields of individual current elements on the other, the linear relationship specified in (1) between the vector of the phase currents and the vector of the magnetic flux density is obtained, which is conveyed by the matrix of the coefficients b.sub.ij. If the coefficient matrix is known, the vector of the phase currents can be calculated by multiplying B by the inverse matrix, as indicated in (2).
[0066] The coefficients b.sub.ij are determined according to the method by calibration after the diamond with NV centers is placed at the output of the inverter at an approximately equal distance to the three busbars in the manner described above.
[0067] For this purpose, only one phase is supplied with current at a time, while no current flows in the other two phases. With j as the index of the energized phase, equation (3) then applies, or (4) after solving for b.sub.1j, b.sub.2j and b.sub.3j. By means of three calibration measurements, j = 1, 2, 3, all nine coefficients of b.sub.ij are therefore known. These calibration coefficients are stored in the sensor and used to calculate the individual currents of the three phases of the inverter (I.sub.1, I.sub.2, I.sub.3) from the vector magnetic field B measured in the diamond by ODMR using equation (2).
[0068] As an alternative to the procedure described here, the coefficients b.sub.ij can also be determined as part of the calibration by determining the vector of the magnetic flux density B.sub.x, B.sub.y, B.sub.z for a plurality of arbitrary triples I.sub.1, I.sub.2, I.sub.3 and training a neural network on the basis of this data, which then determines the existing triple of the currents through the phases of the inverter from the measured vector of the magnetic flux density B.sub.x, B.sub.y, B.sub.z when the sensor is applied in the field. Reference is made to
[0069]
[0070] Another component of at least one embodiment of the presented method is the measurement of the magnetic field in the diamond with NV centers based on the photoelectric detection of the magnetic resonance (PDMR) of the NV centers in diamond. PDMR measures an electrical current, a photocurrent, instead of measuring the intensity of the fluorescent light. For this purpose, for example, an electrode structure consisting of an electrode and a counter electrode is applied on one side of the diamond, e.g. in the form of an interdigital structure made of a conductive material, e.g. metal. When an electrical voltage is applied, a photoelectric current flows when the diamond is excited with green light. If the microfield acting simultaneously on the diamond hits a magnetic resonance of the NV centers at approximately 2.87 GHz, plus or minus the frequency splitting by the magnetic field and the Zeeman effect, then the photocurrent collapses. The resonance can be determined from the measurement of the photocurrent and the magnetic field can be determined by means of the gyromagnetic ratio of the NV center.