Patent classifications
G06F11/2635
CONTROLLER WITH ROM, OPERATING METHOD THEREOF AND MEMORY SYSTEM INCLUDING THE CONTROLLER
A controller may include: a ROM code register configured to generate and store a ROM code including a plurality of firmware images; and a ROM controller configured to change an operation setting of a ROM based on an operation firmware image of the plurality of firmware images, wherein each of the plurality of firmware images includes an image header including attribute information on a corresponding firmware image and image data, and wherein the operation firmware image includes, as its image header, an operation image header, which includes an operation mode field indicating whether the operation setting of the ROM is changed, and, as its image data, operation image data including information on the operation setting of the ROM.
Systems and methods to provide security to one time program data
A method includes: reading a plurality of words from a one-time program (OTP) memory of a processing chip, wherein each of the words includes secure data for the chip and bits corresponding to a check pattern; comparing the bits corresponding to the check pattern to a preprogrammed check pattern; detecting an error based on comparing the bits corresponding to the check pattern to the preprogrammed check pattern; and performing an action by the processing chip in response to detecting the error.
Managing memory in an electronic system
An example system includes first memory, second memory having a greater areal density than the first memory, and a logic circuit configured to move some test data from the second memory to the first memory while at least one of (i) reading other test data from the first memory or (ii) processing the other test data. The logic circuit is configured to process the other test data prior to output along a test channel. The test channel leads to a device under test (DUT) to be tested.
Persistent command parameter table for pre-silicon device testing
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
System and method for simulation results analysis and failures debug using a descriptive tracking header
The present disclosure relates to system(s) and method(s) for simulation results analysis and failures debug using a Descriptive Tracking Header. The method may comprise processing a set of input packets by a Design Under Verification or System Under Verification (DUV/SUV) and mimicking, by a prediction unit corresponding to the DUV/SUV, functionality of the DUV/SUV. The prediction unit may be a part of a testbench and is configured to process a set of input packets to predict a set of expected output packets. In one embodiment, each expected output packet from the set of expected output packets may be attached with a Descriptive Tracking Header. The Descriptive Tracking Header corresponds to metadata associated with the expected output packet. The Descriptive Tracking Header is further updated based on the result of the comparison of the expected output packet against the corresponding actual output packet and used for the generation of simulation results summary for the purpose of simulation results analysis and failures debug.
CONTROLLER, STORAGE DEVICE AND TEST SYSTEM
A storage device operates in host mode or device mode, and the storage device operating in host mode may transmit and receive various information units with the storage device operating in device mode to perform tests on the storage device operating in device mode, thereby performing the test of a storage device in development.
Testing speculative instruction execution with test cases placed in memory segments with non-naturally aligned data boundaries
Test cases for testing speculative execution of instructions are replicated into a memory with non-naturally aligned data boundaries to create a non-contiguous instruction stream to efficiently test a processor. Placing test cases with test code and test data in the non-naturally aligned data boundaries as described herein allows test code to test speculative execution of branches. The test case includes a branch with a hint bit set to cause the hardware to mispredict the path of the branch to cause speculative execution of test code, bad code or erroneously execute data. The processor can then be tested to see if it properly flushes the speculatively executed code upon taking the opposite branch of the mispredicted path.
EFFICIENT TESTING OF DIRECT MEMORY ADDRESS TRANSLATION
A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.
EFFICIENT TESTING OF DIRECT MEMORY ADDRESS TRANSLATION
A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.
Mobile device and chassis with contactless tags to diagnose hardware and software faults
Diagnosing faults in a hardware appliance. Information is read by a hand-held reader from one or more contactless tags associated with one or more components in a hardware appliance. One or more component faults and/or issues are identified based on the read information. A query is formed based on the identified one or more component faults and/or issues. A diagnostic database in the hand-held reader is queried, based on the formed query, and one or more query results are displayed in a ranked order on a display of the hand-held reader. In one aspect of the embodiments, the information read from the one or more contactless tags includes a pointer to a datastore in one of the one or more components. An ad hoc wireless network connection is established with the hardware appliance, and information in the datastore is downloaded over the connection.