Certain aspects of the present disclosure provide techniques for testing integrated circuit designs based on test cases selected using machine learning models. An example method generally includes receiving a plurality of test cases for an integrated circuit. An embedding data set is generated from the plurality of test cases. A respective embedding for a respective test case of the plurality of test cases generally includes a mapping of the respective test case into a multidimensional space. A plurality of test case clusters is generated based on a clustering model and the embedding data set. A plurality of critical test cases for testing the integrated circuit is selected based on the plurality of test case clusters. The integrated circuit is timed based on the plurality of critical test cases and a hard macro defining the integrated circuit.

Certain aspects of the present disclosure provide techniques for testing integrated circuit designs based on test cases selected using machine learning models. An example method generally includes receiving a plurality of test cases for an integrated circuit. An embedding data set is generated from the plurality of test cases. A respective embedding for a respective test case of the plurality of test cases generally includes a mapping of the respective test case into a multidimensional space. A plurality of test case clusters is generated based on a clustering model and the embedding data set. A plurality of critical test cases for testing the integrated circuit is selected based on the plurality of test case clusters. The integrated circuit is timed based on the plurality of critical test cases and a hard macro defining the integrated circuit.

A method and system for generating a clock distribution circuit for each macro circuit in an ASIC design are disclosed herein. In some embodiments, a method for generating a clock distribution circuit receives the ASIC design specified in a hardware description language (HDL), places each macro circuit in allocated locations on a semiconductor substrate, generates a custom clock skew information for each macro circuit based on a macro clock delay model, generates a clock distribution circuit for each macro circuit placed on the semiconductor substrate based on the generated custom clock skew information, modifies the clock distribution circuit if the generated clock distribution circuit does not meet timing requirements of the ASIC design, and outputs a physical layout of the ASIC design for manufacturing under a semiconductor fabrication process.

Disclosed are methods, systems, and articles of manufacture for implementing electronic design closure with reduction techniques. A timing graph and compact timing data for an analysis view of a set of analysis views may be determined for an electronic design. A reduced set of dominant analysis views may be determined based at least in part upon a result of a timing dominance analysis. Timing data may be loaded for at least the reduced set of dominant analysis views; and a design closure task may be performed on the electronic design using at least the timing data and the reduced set of dominance analysis views.

Disclosed are methods, systems, and articles of manufacture for implementing electronic design closure with reduction techniques. A timing graph and compact timing data for an analysis view of a set of analysis views may be determined for an electronic design. A reduced set of dominant analysis views may be determined based at least in part upon a result of a timing dominance analysis. Timing data may be loaded for at least the reduced set of dominant analysis views; and a design closure task may be performed on the electronic design using at least the timing data and the reduced set of dominance analysis views.

Processing a circuit design includes stabilizing the circuit design by a design tool that performs one or more iterations of implementation, optimization assessment, optimization, and stability assessment until a threshold stability level is achieved. The design tool determines, in response to satisfaction of the threshold stability level, different strategies based on features of the circuit design and likelihood that use of the strategies would improve timing. Each strategy includes parameter settings for the design tool. The design tool executes multiple implementation flows using different sets of strategies to generate alternative implementations. One implementation of the alternative implementations nearest to satisfying a timing requirement is selected. The selected implementation is iteratively optimized to satisfy the timing requirement, while restricting changes to placement of cells and nets on a critical path of the one implementation to less than a threshold portion of cells and nets on the critical path.

A numerical information generating apparatus receives information of a programmable logic integrated circuit that includes a plurality of crossbar switches each including resistance change elements, calculates, for each of the plurality of crossbar switches, a base delay that is a delay in which influence of a load capacitance of other crossbar switch is excluded and a correction delay that is a delay caused by influence of a fanout of other crossbar switch, and further calculates a delay of each of the plurality of crossbar switches based on the base delay and the correction delay corresponding to each of the plurality of crossbar switches.

A numerical information generating apparatus receives information of a programmable logic integrated circuit that includes a plurality of crossbar switches each including resistance change elements, calculates, for each of the plurality of crossbar switches, a base delay that is a delay in which influence of a load capacitance of other crossbar switch is excluded and a correction delay that is a delay caused by influence of a fanout of other crossbar switch, and further calculates a delay of each of the plurality of crossbar switches based on the base delay and the correction delay corresponding to each of the plurality of crossbar switches.

Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.

Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.