Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

A method and system for generating a clock distribution circuit for each macro circuit in an ASIC design are disclosed herein. In some embodiments, a method for generating a clock distribution circuit receives the ASIC design specified in a hardware description language (HDL), places each macro circuit in allocated locations on a semiconductor substrate, generates a custom clock skew information for each macro circuit based on a macro clock delay model, generates a clock distribution circuit for each macro circuit placed on the semiconductor substrate based on the generated custom clock skew information, modifies the clock distribution circuit if the generated clock distribution circuit does not meet timing requirements of the ASIC design, and outputs a physical layout of the ASIC design for manufacturing under a semiconductor fabrication process.

An establishing method for the timing model includes: identifying at least one first victim path which is a boundary path in a circuit block; determining whether to remove a first aggressor path corresponding to the first victim path according to a transmission delay on the first victim path; finding a plurality of high-fanout circuit devices with a fanout number greater than a preset value in the circuit block; determining whether to remove each of the high-fanout circuit devices according to a connection position of each of the high-fanout circuit devices; identifying a plurality of second victim paths corresponding to each of the high-fanout circuit devices, and determining whether to keep or remove a second aggressor path corresponding to each of the second victim paths according to a transmission delay of each of the second victim paths.

An establishing method for the timing model includes: identifying at least one first victim path which is a boundary path in a circuit block; determining whether to remove a first aggressor path corresponding to the first victim path according to a transmission delay on the first victim path; finding a plurality of high-fanout circuit devices with a fanout number greater than a preset value in the circuit block; determining whether to remove each of the high-fanout circuit devices according to a connection position of each of the high-fanout circuit devices; identifying a plurality of second victim paths corresponding to each of the high-fanout circuit devices, and determining whether to keep or remove a second aggressor path corresponding to each of the second victim paths according to a transmission delay of each of the second victim paths.

For each circuit element in a pair of launch and capture paths, a parameter value of the circuit element may be modified by a variation amount that is assigned to a class of circuit elements to which the circuit element belongs. Next, a timing slack may be computed for the pair of launch and capture paths.

For each circuit element in a pair of launch and capture paths, a parameter value of the circuit element may be modified by a variation amount that is assigned to a class of circuit elements to which the circuit element belongs. Next, a timing slack may be computed for the pair of launch and capture paths.

Disclosed is an IC voltage determining method including: executing a static timing analysis according to a circuit design to obtain data of a critical path and then generating a netlist; executing a circuit parameter simulation and Monte Carlo simulation with the netlist according to a regular voltage and prescribed parameters to obtain a circuit parameter reference value and a variance of circuit parameter values; executing an adaptive voltage scaling analysis according to a voltage range to obtain a voltage-versus-parameter relation indicative of the number of times that each of circuit parameter deviations that are respectively associated with predetermined voltages within the predetermined voltage range is of the variance; and testing an IC according to the regular voltage to obtain a circuit parameter test value and determining the IC voltage according to the voltage-versus-parameter relation and a difference between the circuit parameter test value and the circuit parameter reference value.

A standard cell establishment method is disclosed. The standard cell establishment method includes the following operations: setting a first implant split case; obtaining a plurality of characteristic parameters according to the first implant split case; applying the plurality of characteristic parameters to a device delay metric so as to obtain a speed parameter; optimizing a channel parameter if the speed parameter is better than a previous speed parameter; and establishing a standard cell if the channel parameter is optimized successfully.

A method and apparatus for preforming engineering change order scenario compression by applying a hybrid of live and static timing views to an integrated circuit design. A plurality of operational scenarios are identified with at least one operational condition. The operational status for a plurality of operational features is determined under conditions associated with the identified scenarios. The operational scenarios are divided into live and static views. Margins are then associated with the operational features within at least one scenario of a static view. Information is transferred from at least one scenario of a static view to a merged live view through the margin.

A method and apparatus for preforming engineering change order scenario compression by applying a hybrid of live and static timing views to an integrated circuit design. A plurality of operational scenarios are identified with at least one operational condition. The operational status for a plurality of operational features is determined under conditions associated with the identified scenarios. The operational scenarios are divided into live and static views. Margins are then associated with the operational features within at least one scenario of a static view. Information is transferred from at least one scenario of a static view to a merged live view through the margin.