Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

A system and method for characterizing a memory instance. Characterizing a memory instance includes obtaining a memory instance comprising a plurality of leaf cells. Each of the plurality of leaf cells comprises components. First channel connected components from the components within each of the plurality of leaf cells are determined, and a first super leaf cell is generated by combining a first two or more leaf cells of the plurality of leaf cells based on the first channel connected components. Further, an updated memory instance is generated based on the first super leaf cell, and a timing model is determined for the updated memory instance.

A method includes receiving a design file for a circuit design and receiving a library that defines a cell that includes one or more inputs, a first combinational logic circuit element, a second combinational logic circuit element, a first output, and a second output. The method also includes replacing a plurality of circuit elements in the circuit design with the cell and compiling the circuit design after replacing the plurality of circuit elements with the cell. The first and second outputs of the cell in the compiled circuit design replace a plurality of outputs of the plurality of circuit elements.

A method includes receiving a design file for a circuit design and receiving a library that defines a cell that includes one or more inputs, a first combinational logic circuit element, a second combinational logic circuit element, a first output, and a second output. The method also includes replacing a plurality of circuit elements in the circuit design with the cell and compiling the circuit design after replacing the plurality of circuit elements with the cell. The first and second outputs of the cell in the compiled circuit design replace a plurality of outputs of the plurality of circuit elements.

A method includes extracting information associated with constraints and clock information from a file of a circuit design; determining a topological cone based on the extracted information for a partition of two or more partitions of the circuit design, and performing timing analysis on the partition of the two or more partitions based on the topological cone. The topological cone includes objects associated with the partition of the two or more partitions of the circuit design.

A method includes extracting information associated with constraints and clock information from a file of a circuit design; determining a topological cone based on the extracted information for a partition of two or more partitions of the circuit design, and performing timing analysis on the partition of the two or more partitions based on the topological cone. The topological cone includes objects associated with the partition of the two or more partitions of the circuit design.

Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.