The present disclosure relates to a structure including a non-fixed read-cell circuit configured to switch from a first state to a second state based on a state of a memory cell to generate a sensing margin.

An illustrative embodiment disclosed herein is an apparatus including a non-volatile memory cell and multi-bit input circuitry that simultaneously receives a plurality of bits, receives a supply voltage, converts the plurality of bits and the supply voltage into a multiply voltage, and applies the multiply voltage to the non-volatile memory cell. The non-volatile memory cell may pass a memory cell current in response to the multiply voltage. A magnitude of the multiply voltage may represent a multiplier. The memory cell current may represent a product of the multiplier and a multiplicand stored in the non-volatile memory cell.

Various implementations described herein are directed to device having a clock generator that provides write reference signals. The device may include a voltage divider that receives the write reference signals and provides an output reference signal based on write polarity of the write reference signals. The device may include a voltage regulator that receives the output reference signal and provides a regulated voltage to a load based on the output reference signal.

Exemplary methods, apparatuses, and systems include a first die in a power network receiving, from each of a plurality of dice in the power network, a first activity state value indicating that the respective die is in a high current state, a second activity state value indicating that the respective die is a moderate current state, or a third activity state value indicating that the respective die is a low current state. The received activity state values include at least one second or third activity state value. The first die determines, using the received activity state values, a first sum of the activity state values. The first die further selects an activity state based upon the first sum and sends, to the plurality of dice, an activity state value corresponding to the selected activity state.

A MRAM includes a plurality of memory cells, an operation unit, a voltage generator, and an input/output circuit. The operation unit includes multiple groups of memory cells among the plurality of memory cells. The voltage generator is configured to provide a plurality of control signals by voltage-dividing a voltage control signal and selectively output the plurality of control signals to the input/output circuit. The input/output circuit is configured to output a plurality of switching pulse signals to the multiple groups of memory cells according to the plurality of control signals, wherein each switching pulse signal differs in pulse width or level.

MRAM reference voltage generation is disclosed. In one aspect, a reference circuit for generating a reference level includes first and second non-overlapping paths from a first node to a second node, each path having a precision resistor in series with a set of two or more magnetic MRAM elements electrically connected in parallel. The first set of two or more MRAM elements are in a parallel state and the second set of two or more MRAM elements are in an anti-parallel state, or a first portion of the first and second sets of two or more MRAM elements are in a parallel state and a second portion of the first and second sets of two or more MRAM elements are in an anti-parallel state. A measurement circuit receives a first value indicative of a resistance between the first node and the second node and outputs a reference level based at least in part on the first value.

Embodiments of the disclosure provide a system for providing a true random number (TRN) or physically unclonable function (PUF), including: an array of voltage controlled magnetic anisotropy (VCMA) cells; a voltage pulse tuning circuit for generating and applying a stochastically tuned voltage pulse to the VCMA cells in the array of VCMA cells, wherein the stochastically tuned voltage pulse has a magnitude and duration that provides a 50%-50% switching distribution of the VCMA cells in the array of VCMA cells; and a bit output system for reading a state of each of the VCMA cells in the array of VCMA cells to provide a TRN or PUF.

According to one embodiment, a memory device includes first and second lines, a memory cell connected between the first and second lines, and including a resistance change memory element and a switching element, a current supply circuit supplying write current to the memory cell when data is written to the resistance change memory element, a detection circuit detecting an on state of the switching element after supply operation of the write current is enabled, and a control circuit controlling a time required until supplying the write current from the current supply circuit is stopped, wherein a starting point of the controlling the time is a time point at which the on state of the switching element is detected.

An interface circuit that can operate in toggle mode at data high transfer rates while reducing the self-induced noise is presented. The high speed toggle mode interface supplies a data signal to a data line or other transfer line by a driver circuit. The driver circuit includes a pair of series connected transistors connected between a high supply level and a low supply level, where the data line is supplied from a node between the two transistors. A resistor is connected between one or both of the transistors and one of the supply levels, with a capacitor connected between the low supply level and a node between the resistor and the transistor. The resistor helps to isolate the transistor from the supply level while the capacitor can act as current reservoir to boost the current to the transistor during data transition, reducing the noise seen by the voltage supply.

A semiconductor device capable of increasing readout margin in a nonvolatile resistive random access memory is provided. A clamping circuit applies fixed potential to each of a memory element and a reference resistive element. A pre-charge circuit pre-charges first and second nodes to power-source potential. A sense amplifier amplifies the potential difference between the potential of the first node and the potential of the second node generated after a discharge period based on cell current and reference current after pre-charging made by the pre-charge circuit. A third node is coupled to the first and second nodes through a capacitor. An electric-charge supply circuit is connected to the third node, and supplies electric charge to the third node in the discharge period.