A disclosed example to use an erase-suspend feature with a memory device includes sending, by a memory host controller, an erase-suspend enable setting and an erase segment duration value to the memory device. The erase-suspend enable setting is to cause the memory device to perform an erase operation as a plurality of erase segments and to suspend the erase operation between the erase segments. The erase segment duration value is to specify a length of time for the erase segments. The memory host controller initiates an erase operation to be performed at the memory device. When the erase operation is suspended, the memory host controller initiates a second memory operation to be performed at the memory device. After the memory host controller determines that the second memory operation is complete, the memory host controller initiates resumption of the erase operation.

A storage device including a processor, a controller, and a switch is provided. The processor is configured to control a logic circuit. When a main reset signal is enabled, the processor generates a sub-reset signal according to the operation status of the logic circuit. The controller generates a mask signal according to the main reset signal and the sub-reset signal. When the mask signal is enabled, the switch does not transmit the main reset signal to the logic circuit. When the mask signal is not enabled, the switch transmits the main reset signal to the logic circuit to reset the logic circuit.

A storage device may detect errors during data transfer. Upon detection of one or more data transfer errors, for example, the storage device can begin to scan pages within a plurality of memory devices for uncorrectable error correction codes. Once scanned, a range of pages within the plurality of memory devices with uncorrectable error correction codes associated with a write abort error may be determined. The stage of multi-pass programming achieved on each page within that range is then established. Once calculated, the previously aborted multi-pass programming of each page within the range of pages can continue until completion. Upon completion, normal operations may continue without discarding physical data location.

Apparatuses and methods for protecting transistors through charge sharing are disclosed herein. An example apparatus includes a transistor comprising a gate node and a bulk node, a charge sharing circuit coupled between the gate and bulk nodes, and logic. The charge sharing circuit is configure to equalize charge differences between the gate and bulk nodes, and the logic is configured to enable the charge sharing circuit based at least in part on a combination of first and second signals, which indicate the presence of a condition.

A semiconductor storing apparatus and a flash memory operation method, for shortening a recovery time from a deep power-down (DPD) mode without a dedicated command for the DPD are provided. A flash memory includes: a standard command interface circuit and a DPD controller, operating through an external power voltage; a voltage supply node, for supplying power from the external power voltage via a first current path; a voltage supply node, for supplying power from the external power voltage via a second current path; an internal circuit group, connected to the voltage supply node; and a charge pump circuit, connected to the voltage supply node. When the DPD mode is released, the internal circuit group is enabled after the charge pump circuit is enabled.

A memory device includes a memory array comprising a plurality of planes and a plurality of independent plane driver circuits. The memory device further includes control logic to detect an occurrence of a high noise event associated with a first independent plane driver circuit of the plurality of independent plane driver circuits. The control logic is further to determine whether a quiet event associated with a second independent plane driver circuit of the plurality of independent plane driver circuits is concurrently occurring. Responsive to determining that the quiet event associated with the second independent plane driver circuit is concurrently occurring, the control logic is to manage execution of the high noise event and the quiet event based on respective priorities of the first and second independent plane driver circuits.

The invention relates to a method, and an apparatus for accessing to data in response to a power-supply event. The method, performed by a flash controller, includes steps for: repeatedly detecting whether a voltage supplied to the flash controller is lower than a first threshold; and issuing a program command to a flash module for programming data into the flash module and performing a supervision procedure when the voltage is lower than the first threshold. The supervision procedure includes steps for: repeatedly detecting whether the voltage is lower than a second threshold during a time period when issuing the program command to the flash module until transmitting the data to the flash module completely; and cancelling the program command when the voltage is lower than the second threshold.

A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including detecting a power up event of the memory device, responsive to detecting the power up event, selecting an open block of the memory device, wherein the open block comprises a set of pages, determining, based at least in part on an analysis of the set of pages, whether the open block is valid for programming, and responsive to determining that the open block is valid for programming, keeping the open block open for programming.

Apparatus and methods for recovery after an abort event are described. A data storage system may comprise a non-volatile memory device, having one or more wordlines configured to receive a read level voltage, and a controller. The controller is configured to detect whether a write abort event occurred for the data storage system. The controller is configured to determine a first voltage offset based on one or more of a wear-level indication of the non-volatile memory device, or one or more voltage parameters of the non-volatile memory device. The controller is configured to determine, based on the first voltage offset, an adjusted read level voltage. The controller is configured to apply the adjusted read level voltage to a wordline of the non-volatile memory device. The controller is configured to read data, based on the applied adjusted read level voltage, from the wordline of the non-volatile memory device.

Apparatus and methods for recovery after an abort event are described. A data storage system may comprise a non-volatile memory device, having one or more wordlines configured to receive a read level voltage, and a controller. The controller is configured to detect whether a write abort event occurred for the data storage system. The controller is configured to determine a first voltage offset based on one or more of a wear-level indication of the non-volatile memory device, or one or more voltage parameters of the non-volatile memory device. The controller is configured to determine, based on the first voltage offset, an adjusted read level voltage. The controller is configured to apply the adjusted read level voltage to a wordline of the non-volatile memory device. The controller is configured to read data, based on the applied adjusted read level voltage, from the wordline of the non-volatile memory device.