Patent classifications
G
PHYSICS
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G11
INFORMATION STORAGE
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G11C
STATIC STORES
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29/00
Checking stores for correct operation; ; Subsequent repair; Testing stores during standby or offline operation
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G11C29/04
Detection or location of defective memory elements; , e.g. cell constructio details, timing of test signals
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G11C29/08
Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
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G11C29/12
Built-in arrangements for testing, e.g. built-in self testing [BIST]; or interconnection details
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G11C29/12015
comprising clock generation or timing circuitry
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