A detector device for the remote analysis of materials, in particular hazardous materials, including at least one laser, which is designed to emit pulsed laser light onto a sample located at a detection distance, and a telescope, which is designed to collect and/or focus laser light scattered on the sample and to forward the scattered laser light into an optical spectrometer. The optical spectrometer is designed for a spectral analysis of the laser light scattered on the sample. The laser is followed by a first beam path with a first reference beam and an additional beam path with a second reference beam for the scattered laser light. A unit is provided for determining a time difference between pulses of the first reference beam and pulses of the second reference beam, wherein the detection distance can be determined from the time difference. The unit is designed to determine the detection distance in real-time.

A magnetic measuring device includes: a determination part configured to identify four maximum inclination points in an average value in a visual field of a light detection magnetic resonance spectrum and configured to determined a degree of decrease in relative fluorescence intensity and a microwave frequency at each of the maximum inclination points; a setting part configured to set a reference decrease degree of the relative fluorescence intensity in a predetermined area and configured to set operating point frequency initial values at four points at which the reference decrease degree is achieved, near the microwave frequencies at the respective maximum inclination points; a frequency update part configured to update operating point frequencies at the four points; and a frequency correction part configured to input the updated operating point frequencies to a microwave oscillator as corrected operating point frequencies.

An apparatus includes a flow cell body with an array of reaction sites positioned along a floor of a channel. An optical filter layer is positioned under the floor of the channel and includes at least a portion spanning uninterruptedly along a length corresponding to the length of the array of reaction sites. Imaging regions are positioned under the optical filter layer. Each imaging region is positioned directly under a corresponding reaction site. The optical filter layer is configured to permit one or more selected wavelengths of light to pass from each reaction site to the imaging region forming a sensing pair with the reaction site. The optical filter layer is configured to reduce transmission of excitation light directed toward the reaction sites; and to reduce transmission of light emitted from each reaction site to imaging regions not forming a sensing pair with the reaction site.

A super-resolution microscope avoids the need for complex phase plate optics normally used to produce a doughnut-shaped depletion beam by employing low-intensity regions of common diffraction patterns such as an Airy disk.

An optical measurement device includes an irradiation optical system, a detection optical system, and a cancel circuit. In a fluorescence detection process, a sample is designated as an irradiation target, the sample is irradiated with irradiation light, measurement target light including fluorescence generated from the sample irradiated with the irradiation light and light scattered from the sample irradiated with the irradiation light is detected as detection light, a signal component corresponding to the scattered light is removed from a measurement signal corresponding to the measurement target light in consideration of a result of performing a calibration process during a preliminary process. In the preliminary process, the calibration process for removing a signal component corresponding to the scattered light from the measurement signal is performed on the basis of a calibration signal having a higher signal intensity than a signal corresponding to the scattered light in the measurement signal.

In an optical measurement device, in a first process, a reference member is irradiated with excitation light, light for a calibration process including scattered light associated with the excitation light from a reference member is detected as detection light, a calibration signal corresponding to the light for the calibration process is designated as a detection signal, and a calibration process for removing a signal component corresponding to the scattered light from the detection signal in a second process is performed. Also, in the optical measurement device, in the second process, a sample is irradiated with the excitation light, measurement target light including fluorescence generated from the sample and light scattered from the sample irradiated with the excitation light is detected as detection light, and a signal component corresponding to the scattered light from a measurement signal.

Optical device for optical fluorescence microscopy, comprising a spatial modulator (1), a microscope objective (2), a beamsplitter (3) and a camera (4), wherein the beamsplitter (3) is placed between the spatial modulator (1) and the microscope objective (2), wherein the beamsplitter (3) is placed between the camera (4) and the microscope objective (2), and wherein a prism (5) is placed between the beamsplitter (3) and the camera (4).

Optical device for optical fluorescence microscopy, comprising a spatial modulator (1), a microscope objective (2), a beamsplitter (3) and a camera (4), wherein the beamsplitter (3) is placed between the spatial modulator (1) and the microscope objective (2), wherein the beamsplitter (3) is placed between the camera (4) and the microscope objective (2), and wherein a prism (5) is placed between the beamsplitter (3) and the camera (4).

The present disclosure provides an array substrate, a microfluidic device, a microfluidic system, and a fluorescence detection method. The array substrate includes at least one recess, the array substrate is located in a plane, and a ratio of an area of an orthographic projection of the at least one recess on the plane to an area of an orthographic projection of the array substrate on the plane is between 0.05 and 0.60.

A system for analysis of a sample at a substrate comprises: a light source to generate first light; and a spatial light modulator to form second light from the first light, wherein the substrate includes at least one sensor to detect an emission emitted based on the second light, wherein at the substrate the second light forms a shape selected based on the at least one sensor, wherein the second light illuminates an area of the substrate corresponding to the shape.