An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

The present document describes methods and systems for the automatic inspection of material quality. A set of lights with a geometric pattern is cast on a material to be analyzed. Depending on the material being inspected, same may act as a mirror and the reflected image is captured by a capture device, or the light passes through the material being inspected and the image is captured by a capture device. Defects in the material can be detected by the distortion caused by same in the pattern of the reflected image or passing through. Finally, software is used to identify and locate these distortions, and consequently the defects in the material. This classification of defects is carried out using artificial intelligence techniques.

A glass sheet optical inspection system installed online in a glass sheet processing system includes an apparatus for measuring small optical or obstructive defects in a first selected area of the glass sheet by acquiring and developing a first set of image data, and an apparatus for measuring transmitted optical distortion in a second selected area of the glass sheet by acquiring and developing a second set of image data. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet based upon the part-shape analysis.

A method and installation of inspecting a fragmentation pattern of a tempered glass panel by deflectometry, following a fragmentation test, the method including: (i) positioning the tempered glass panel in contact with a support; (ii) projecting by a display device a structured light pattern on the surface of at least one portion of the tempered glass panel; (iii) capturing an image reflected by the surface of the first portion of the tempered glass panel using an image capture device; and (vi) processing the images to determine the fragmentation pattern by an image processing device.

A small defect detection apparatus installed online in a glass sheet processing system includes a line scan camera, a background screen including contrasting elements arranged in a pre-defined pattern, an upstream conveyor and a downstream conveyor, wherein the upstream conveyor and downstream conveyor are positioned end-to-end, spaced apart by a selected size gap such that the camera may acquire multiple images of the background screen as the unsupported portion of the glass sheet is conveyed over the gap, and a computer programmed to execute logic for receiving the set of image data comprising multiple images of the background screen and identifying small defects in the glass from the data. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and selecting an area of interest on the glass sheet for the analysis.

An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

A measuring apparatus includes a light receiving device, a housing, an optical window, an electrical connection line, and a line enclosure. The light receiving device receives light and output a signal. The housing, made of a conductive material, covers the light receiving device. The optical window transmits the light. The optical window includes a conductive part having conductivity. The electrical connection line transmits the signal. The line enclosure is disposed around the electrical connection line and electrically connected to the conductive part and the housing.

A visual inspection system (100, 200) for optical fibers (150) includes at least a pattern source (120, 220A, 220B, 220C, 520); at least a first illumination source (130, 230A, 230B, 230C, 510, 522) to direct light towards an optical fiber (150); and at least a first camera (140, 240A, 240B, 240C, 540) positioned at an opposite side of the fiber (150) from the pattern source (120, 220A, 220B, 220C, 520). At least one image (170, 180, 190) of the optical fiber (150) is taken and a pattern visible through the optical fiber (150) in the image (170, 180, 190) may be analyzed to detect distortions in the pattern.

An optical inspection system for capturing images of backlit test objects on a detector at two or more aperture settings includes a telecentric imaging system having a first setting associated with a first size aperture stop and a second setting associated with a second larger size aperture stop. An illumination system includes a substage illuminator incorporating (a) a first set of one or more light sources surrounded by a first barrier that defines a first size aperture stop of the illumination system and (b) a second set of one or more light sources located beyond the first barrier and surrounded by a second barrier that defines a second larger size aperture stop of the illumination system. The first size aperture stop of the illumination system images to the first size aperture stop of the telecentric imaging system at the first setting and the second larger size aperture stop of the illumination system images to the second larger size aperture stop of the telecentric imaging system at the second setting.

A glass sheet optical inspection system installed online in a glass sheet processing system includes an apparatus for measuring small optical or obstructive defects in a first selected area of the glass sheet by acquiring and developing a first set of image data, and an apparatus for measuring transmitted optical distortion in a second selected area of the glass sheet by acquiring and developing a second set of image data. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet based upon the part-shape analysis.