Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

A liquid sample analyzing system including an ion analyzer having a first ion source receiving a target sample and a second ion source receiving a reference sample; a liquid sample introduction mechanism 3 including a passage-switching section introducing reference samples into the second ion source; and a controller for repeatedly performing a series of steps in the ion analyzer, the steps including: a pre-measurement step for initiating a measurement; a measurement step for introducing a target sample into the first ion source and performing a measurement on an ion originating from the target sample along with an ion originating from a reference sample introduced into the second ion source by the liquid sample introduction mechanism; and a post-measurement step where the liquid sample introduction mechanism operates concurrently with the predetermined post-measurement step to switch the passage-switching section to a passage having a reference sample for the next analysis.

Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Certain configurations of systems comprising a cell analyzer and a mass spectrometer are described. In some embodiments, the system can be used to determine both a cell phenotype or cellular response and an amount of at least one elemental species in the cell. The phenotype or other cellular characteristic and elemental content of each cell in a cell population can be determined and correlated.

Methods and systems of identifying two or more elements in a single individual particle are described. In some examples, an optical emission from each of an ionized first element and an ionized second element can simultaneously be detected to identify at least a first element in a particle from a plurality of particles using the optical emission from the ionized first element, and to identify at least a second element in the particle from the plurality of particles using the optical emission from the second ionized element. The identified first element and the identified second element can be used to identify a source of the particle from a plurality of particles.

Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

A liquid sample analyzing system including an ion analyzer having a first ion source receiving a target sample and a second ion source receiving a reference sample; a liquid sample introduction mechanism 3 including a passage-switching section introducing reference samples into the second ion source; and a controller for repeatedly performing a series of steps in the ion analyzer, the steps including: a pre-measurement step for initiating a measurement; a measurement step for introducing a target sample into the first ion source and performing a measurement on an ion originating from the target sample along with an ion originating from a reference sample introduced into the second ion source by the liquid sample introduction mechanism; and a post-measurement step where the liquid sample introduction mechanism operates concurrently with the predetermined post-measurement step to switch the passage-switching section to a passage having a reference sample for the next analysis.

Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

The present technology provides methods for increasing sensitivity of detection and/or quantification of a negatively charged analyte, e.g., an oligonucleotide, using an analytical system that comprises liquid chromatography and mass spectrometry. The methods comprise passing an acidic solution through the analytical system, i.e., through a fluidic path from the mobile phase reservoir to the detector to remove or displace, at least in part, metal ions adsorbed to charged sites in the fluidic path.

Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the systems and methods can provide efficient cooling of an ion source probe to prevent overheating and the resulting degradation in ion sampling. In some aspects, such cooling can result in improved consistency and/or efficiency of ion formation. Moreover, ion source cooling in accordance with various aspects of the present teachings can allow for the use of higher temperatures in the ionization chamber (thereby improving desolvation) and/or can enable the use of lower flow rate sample sources than with conventional techniques.