A support frame is provided that includes an upper plate, a lower plate, side support members, an upper support structure, and a lower support structure. The upper plate defines a first inner surface and an opposed first outer surface. The lower plate defines a second inner surface and an opposed second outer surface. A TEM test space is defined between the first inner surface and the second inner surface. The side support members are disposed between the upper plate and the lower plate proximate a periphery of the test space. The upper support structure is coupled to and supports the upper plate. The upper support structure extends from the first outer surface of the upper plate. The lower support structure is coupled to and supports the lower plate. The lower support structure extends from the second outer surface of the lower plate.

A high-speed RSE automated test system includes a RSE test chamber and a computer. The RSE test chamber includes a turntable disposed therein and a DUT is disposed on the turntable. The RSE test chamber further includes a receiving antenna configured to receive a RSE test signal from the DUT. The RSE test chamber further includes a movable stirrer configured to simulate the measurement environment of semi/fully anechoic chamber. The computer is connected to an I/O control box configured to control the movable stirrer and the turntable. The computer is further connected to a filter switch box configured to transmit the RSE test signal to a spectrum analyzer to obtain a measured value. The computer includes a test module with all necessary parameters for the RSE test and the test module is configured to generate an integrated test result.

A source assembly is provided for a transverse electromagnetic (TEM) system. The source assembly includes a first guide and a second guide. The first guide is configured to receive a signal from a supply, and includes a first shell defining a first cavity. The first guide is configured to extend proximate an upper plate of the TEM system. The second guide is configured to receive a reference signal from the supply. The second guide includes a second shell defining a second cavity. The second guide is configured to extend proximate a lower plate of the TEM system, and is spaced a distance from the first guide to define a gap having a gap width. At least one of the first guide or second guide includes an access opening configured to provide access to at least one of the first cavity or the second cavity.

An assembly is provided for a transverse electromagnetic (TEM) system. The assembly includes a support frame and at least one resistive sheet. The support frame includes an upper plate and a lower plate. The upper plate defines a first inner surface and an opposed first outer surface. The lower plate defines a second inner surface and an opposed second outer surface. The at least one resistive sheet is coupled to at least one of the upper plate or the lower plate, and extends parallel to the upper plate and lower plate from an exterior of the support frame. The resistive sheet has an inner end disposed proximate the at least one of the upper plate or lower plate and an outer end disposed opposite the inner end, and has a variable resistance that is greater at the outer end than at the inner end.

A method for preparing an object to be tested, having a given relative permittivity, intended to be illuminated by an incident electromagnetic wave. The method includes: providing a part including a cavity for housing the object and at least one extension element made from a material having a relative permittivity that is preferably equal to that of the object, the extension element at least partially delimiting the cavity and extending to either side of the cavity in a passage direction of the cavity, over a length at least equal, on either side of the cavity, to one third of the length of the cavity in the passage direction, and placing the object in the cavity, such that the object is in contact with the extension element in the passage direction.

A support frame is provided that includes an upper plate, a lower plate, side support members, an upper support structure, and a lower support structure. The upper plate defines a first inner surface and an opposed first outer surface. The lower plate defines a second inner surface and an opposed second outer surface. A TEM test space is defined between the first inner surface and the second inner surface. The side support members are disposed between the upper plate and the lower plate proximate a periphery of the test space. The upper support structure is coupled to and supports the upper plate. The upper support structure extends from the first outer surface of the upper plate. The lower support structure is coupled to and supports the lower plate. The lower support structure extends from the second outer surface of the lower plate.

An assembly is provided for a transverse electromagnetic (TEM) system. The assembly includes a support frame and at least one resistive sheet. The support frame includes an upper plate and a lower plate. The upper plate defines a first inner surface and an opposed first outer surface. The lower plate defines a second inner surface and an opposed second outer surface. The at least one resistive sheet is coupled to at least one of the upper plate or the lower plate, and extends parallel to the upper plate and lower plate from an exterior of the support frame. The resistive sheet has an inner end disposed proximate the at least one of the upper plate or lower plate and an outer end disposed opposite the inner end, and has a variable resistance that is greater at the outer end than at the inner end.

A source assembly is provided for a transverse electromagnetic (TEM) system. The source assembly includes a first guide and a second guide. The first guide is configured to receive a signal from a supply, and includes a first shell defining a first cavity. The first guide is configured to extend proximate an upper plate of the TEM system. The second guide is configured to receive a reference signal from the supply. The second guide includes a second shell defining a second cavity. The second guide is configured to extend proximate a lower plate of the TEM system, and is spaced a distance from the first guide to define a gap having a gap width. At least one of the first guide or second guide includes an access opening configured to provide access to at least one of the first cavity or the second cavity.

An anechoic chamber and a construction method thereof are provided, the anechoic chamber includes a top surface, being a polygon; trapezoid surfaces, corresponding to edges of top surface, upper edge lengths of trapezoid surface being equal to edge lengths of top surface, trapezoid surfaces being connected to edges of top surface through the upper edges, the trapezoid surfaces being sequentially connected along a circumferential direction of top surface, and being at angle to the top surface; rectangular surfaces, corresponding to the trapezoid surfaces, upper edge lengths of rectangular surface being equal to lower edge lengths of trapezoid surface, rectangular surfaces being connected to the trapezoid surfaces through the upper edges, the rectangular surfaces being sequentially connected along a circumferential direction of the lower edges of trapezoid surfaces, and being perpendicular to the top surface; and an absorbing material, disposed on the top surface, the trapezoid surfaces and the rectangular surfaces.

Provided is a gigahertz transverse electromagnetic (GTEM) cell for measuring an insertion loss and an insertion loss measurement method using the GTEM cell. The GTEM cell may include an output port configured to measure an insertion loss of a test object occurring when an electromagnetic field having specific intensity is applied to the test object, and may measure the insertion loss of the test object from the GTEM cell based on a change in the intensity of the electromagnetic field measured using the output port.