Disclosed are exemplary embodiments of electrostatic discharge (ESD) pulse generators that may provide improved system level ESD robustness characterization and qualification analysis.

There is provided an attenuation amount setting unit that sets, in a case where signals are simultaneously output from all output ports of a plurality of interface units at the same signal level, one of the plurality of interface units as the reference interface unit, and adds a difference between an attenuation amount of a second attenuator stored in a storage unit of the reference interface unit and an attenuation amount of another second attenuator stored in another storage unit of the other interface unit to an attenuation amount of each of a plurality of third attenuators of the other interface unit to correct the attenuation amount.

A high-frequency 5 measurement method includes generating a test signal (TS), which is a sine-wave signal having a predetermined frequency, in which a period (τ) during which the power level is at a first power level and a period (T-τ) during which the power level is at a second power level lower than the first power level 10 are periodically repeated, inputting the test signal (TS) to a device under test (10) as an input signal, and measuring the difference between an output signal (OUT) of the device under test (10) and an ideal value of the output signal (OUT).

Testing of at least one source by a destination is provided, which comprises: (i) the destination supplies a test signal towards the at least one source; (ii) at the at least one source, determining a second output signal based on a first output signal and the test signal via a first function; (iii) conveying the second output signal to the destination; (iv) at the destination, determining a received signal based on the second output signal received from the at least one source and based on the test signal via a second function; and (v) determining whether an error occurred based on the received signal. Also, an according system is provided.

A device for testing a group of radio-frequency (RF) chip modules and a method for using the same is disclosed. The device includes a signal analyzer, a power divider, control ICs, a signal controller, and a power combiner. The power divider receives an RF signal and transmits RF input signals to the RF chip modules and the control ICs in response to the RF signal. The signal controller controls each control IC to adjust at least one of the power and the phase of the corresponding RF input signal, thereby generating an RF output signal. The power combiner receives the RF output signal from each control IC to generate a test signal. The signal analyzer receives the test signal and obtains RF properties corresponding to at least one of the power and the phase of each RF output signal.

A method for measuring (and controlling) a characteristic performance parameter Γ.sub.s of a device under test (DUT) having an input port (at the minimum). The method involves connecting the input port of the DUT to a signal generator, subjecting the DUT to a large signal input test signal, and executing a first measurement of the incident wave and reflected wave at a DUT input reference plane. The method further involves subjecting the DUT to a perturbation signal combined with the large signal input test signal, and executing a second measurement of the incident wave and reflected wave at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

To provide a lightweight and robust voltage amplifier and current amplifier for a test device for testing an electrical component, an amplifier is designed to output a test signal at a signal output between a positive output terminal and a negative output terminal. The amplifier includes a first half bridge and a second half bridge. A switching unit is provided, which is designed to connect the first half bridge and the second half bridge in parallel to the signal output in a first operating mode and to connect the first half bridge and the second half bridge in series with the signal output in a second operating mode.

An artificial intelligence (AI)-based constrained random verification (CRV) method for a design under test (DUT) includes: receiving a series of constraints; obtaining a limited constraint range according to the series of constraints; generating a series of stimuli according to the limited constraint range; and verifying the DUT by the series of stimuli; wherein at least one of the step of obtaining the limited constraint range according to the series of constraints and the step of generating the series of stimuli according to the limited constraint range employs an AI algorithm.

Disclosed is a testing device for an automotive controller, which includes a plurality of Device Under Test (DUT) lines for connection to respective DUT lines in the automotive controller, and first and second multiplexers for selecting individual DUT lines. First and second measurement modules are connected to the multiplexers for measuring signal characteristics on the selected DUT lines. An interconnect circuit is operable for selectively connecting stimulation modules to the measurement modules for stimulating electrical signals on the selected DUT lines. A controller is provided to control the switching of the multiplexers and the interconnect circuit and for receiving the measured signal characteristics from the first and second measurement modules for testing the respective DUT lines in the automotive controller. Also disclosed are methods and software for controlling testing devices.