Techniques include configuring a sequential circuit monitor having been generated by applying a quantifier elimination to each random bit position of random inputs associated with a formal verification driver and selecting a value for random inputs to drive a next stage logic of sequential circuit simulation monitor, a state of the next stage logic being used by sequential circuit simulation monitor to generate sequential inputs to match those permitted by formal verification driver, formal verification driver being specified for a DUT input interface. An equivalence check between sequential circuit simulation monitor and original formal driver matches the same set of sequential inputs permitted original formal driver. The sequential circuit simulation monitor is coupled to a simulation environment and the DUT in simulation environment, sequential circuit simulation monitor being configured to flag an input sequence from the simulation environment not permitted by formal verification driver based on the sequential inputs.

A test device and method with built-in self-test logic and a communication device. The test device includes at least one generator and at least one checker which are disposed between a physical layer and a medium access control layer. The at least one generator is configured to generate a protocol pattern to form a data path between the physical layer and the medium access control layer, and generate different pseudo random bit sequence patterns in the data path. The at least one checker is configured to test a data stream in the physical layer and/or the medium access control layer according to the pseudo random bit sequence patterns, thereby locating a fault position.

Systems and methods for a sequential decompressor which builds equations predictably provide a first-in, first out (“FIFO”) shift register which is fed by a first XOR decompressor and provides outputs to a second XOR decompressor.

Systems and methods efficiently bring additional variables into a Pseudo-Random Pattern Generator (“PRPG”) in the early cycles of an automatic test pattern generation (“ATPG”) process without utilizing any additional hardware or control pins. Overscanning (e.g., scanning longer than the length of the longest channel) for some additional cycles brings in enough variables into the PRPG. Data corresponding to earlier cycles of the ATPG process is removed.

Accordingly, an improved interposer connection testing technique is provided, employing parallel pseudo-random bit sequence (PRBS) generators to test all the interconnects in parallel and simultaneously detect any correctable defects. In one embodiment, a microelectronic assembly includes an interposer electrically connected in a flip-chip configuration to an originating IC (integrated circuit) die and to a destination IC die, the substrate having multiple conductive traces for a parallel communications bus between the IC dies. The originating IC die has a first parallel PRBS (pseudo-random binary sequence) generator to drive test PRBSs with different phases in parallel across the interposer traces. The destination IC die has a second parallel PRBS generator to create reference PRBSs with different phases, and a bitwise comparator coupled to receive the test PRBSs from the interposer traces and to compare them to the reference PRBSs to provide concurrent fault monitoring for each of the traces.

A system for testing a circuit comprises scan chains, a controller configured to generate a bit- inverting signal based on child test pattern information, and bit-inverting circuitry coupled to the controller and configured to invert bits of a parent test pattern associated with a plurality of shift clock cycles based on the bit-inverting signal to generate a child test pattern during a shift operation. Here, the plurality of shift clock cycles for bit inverting occur every m shift clock cycles, and the child test pattern information comprises information of m and location of the plurality of shift clock cycles in the shift operation.

Techniques include configuring a sequential circuit monitor having been generated by applying a quantifier elimination to each random bit position of random inputs associated with a formal verification driver and selecting a value for random inputs to drive a next stage logic of sequential circuit simulation monitor, a state of the next stage logic being used by sequential circuit simulation monitor to generate sequential inputs to match those permitted by formal verification driver, formal verification driver being specified for a DUT input interface. An equivalence check between sequential circuit simulation monitor and original formal driver matches the same set of sequential inputs permitted original formal driver. The sequential circuit simulation monitor is coupled to a simulation environment and the DUT in simulation environment, sequential circuit simulation monitor being configured to flag an input sequence from the simulation environment not permitted by formal verification driver based on the sequential inputs.

A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT. Methods and a system for testing a DUT with the disclosed margin tester and other testing device are also described.

The disclosed embodiments relate to method, apparatus and system for testing memory circuitry and diagnostic components designed to test the memory circuitry. The memory may be tested regularly using Memory Built-In Self-Test (MBIST) to detect memory failure. Error Correction Code (ECC)/Parity is implemented for SRAM/Register Files/ROM memory structures to protect against transient and permanent faults during runtime. ECC/Parity encoder and decoder logic detect failure on both data and address buses and are intended to catch soft error or structural fault in address decoding logic in SRAM Controller, where data may be read/written from/to different locations due to faults. ECC/parity logic on the memory structures are subject to failures. In certain exemplary embodiments, an array test controller is used to generate and transmit error vectors to thereby determine faulty diagnostic components. The test vectors may be generated randomly to test the diagnostic components during run-time for in-field testing.

A built-in self-test (BIST) method includes providing expanded test patterns to a logic circuit under test, generating a first signature based on a response of the logic circuit to the expanded test patterns, generating a second signature based on the first signature, wherein the second signature is a compressed version of the first signature, selecting one of the first signature or the second signature in response to a control signal, comparing the selected one of the first signature or the second signature to an expected signature, and, based on the comparison of the selected one of the first signature or the second signature to the expected signature, determining that the logic circuit passes or fails BIST.