G02B21/0072

Circular Scanning Technique For Large Area Inspection

Described embodiments provide a method of generating an image of a region of interest of a target object. A plurality of concentric circular scan trajectories are determined to sample the region of interest. Each of the concentric circular scan trajectories have a radius incremented from an inner-most concentric circular scan trajectory having a minimum radius to an outermost concentric circular scan trajectory having a maximum radius. A number of samples are determined for each of the concentric circular scan trajectories. A location of each sample is determined for each of the concentric circular scan trajectories. The locations of each sample are substantially uniformly distributed in a Cartesian coordinate system of the target object. The target object is iteratively rotated along each of the concentric circular scan trajectories and images are captured at the determined sample locations to generate a reconstructed image from the captured images.

Method and device for superresolution optical measurement using singular optics
09846030 · 2017-12-19 · ·

An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the luminous object, or location of the luminous object.

IMAGING METHOD, AND SYSTEM, FOR OBTAINING A SUPER-RESOLUTION IMAGE OF AN OBJECT

Method for obtaining an super-resolution image (22) of an object (5), based upon an optical microscope (21) including a support plate (6) for bearing the object, an illumination source (1) for focusing an illumination beam (14) onto a target region of the support plate, a digital camera (9) including a matrix of sensors, comprising: capturing, by the digital camera, a first image of the target region; extracting, from the first image, a first block of pixel values provided by a sub-matrix (B.sub.0) of the matrix of sensors; displacing, by a sub-diffraction limited distance, the support plate by the displacement block along a displacement axis; capturing, by the digital camera, a second image of the target region; extracting, from the second image, a second block of pixel values provided by the sub-matrix (B.sub.0) of the matrix of sensors; storing said first and second blocks of pixel values as a first and second blocks of pixel values to be placed right next each other in the super-resolution image along the image axis (X, Y) corresponding to the displacement axis.

ELECTROMAGNETIC WAVE FOCUSING DEVICE AND OPTICAL APPARATUS INCLUDING THE SAME

Electromagnetic wave focusing devices and optical apparatuses including the same are provided. An electromagnetic wave focusing device may include a plurality of material members located at different distances from a reference point. The intervals and/or widths of the material members may vary with distance from the reference point. For example, the intervals and/or widths of the material members may increase or decrease with distance from the reference point. The intervals and/or widths of the material members may be controlled to satisfy a spatial coherence condition with the electromagnetic wave.

Scanning luminescence light microscope with gratings of luminescence inhibition light and further light

A scanning luminescence light microscope for spatial high resolution imaging a structure marked with a luminescent marker comprises a light source for luminescence inhibition light and for further light; a light shaping and aligning device; and a detector registering luminescence light emitted by the luminescent marker. The device, by means of two optical gratings and an objective lens, forms two crossing line gratings of the luminescence inhibition light, and two crossing line gratings of the further light so that local intensity minima of an overall intensity distribution of the luminescence inhibition light are delimited in at least two directions, and that local intensity maxima or local intensity minima of an overall intensity distribution of the further light coincide with the local intensity minima of the luminescence inhibition light. Further, the device moves the overall intensity distributions of the further light and the luminescence inhibition light to scan the structure.

RESOLUTION ENHANCEMENT FOR LIGHT SHEET MICROSCOPY SYSTEMS AND METHODS
20170336610 · 2017-11-23 ·

Embodiments of a resolution enhancement technique for a light sheet microscopy system having a three objective lens arrangement in which one objective lens illuminates a sample and the second and third objective lenses collect the fluorescence emissions emitted by the sample are disclosed. The second objective lens focuses a first portion of the fluorescence emissions for detection by a second detection component, while the third objective lens focuses a second portion of the fluorescence emissions through a diffractive or refractive optic component for detection by a first detector component. A processor combines the images resulting from the first and second portions of the fluorescence emissions for generating composite images with increased axial and lateral resolution.

MICROSCOPE SYSTEM AND MICROSCOPE CONTROL DEVICE
20230168481 · 2023-06-01 · ·

A microscope system comprises: a light source; an objective lens; a stage; a two-dimensional image sensor that captures an image of a specimen placed on the stage; a focusing device that changes distance between the objective lens and the stage; and a control circuit, wherein the control circuit executes, during a movement period in which the stage moves in a direction orthogonal to an optical axis of the objective lens, focus control for controlling the focusing device based on focus evaluation information detected during the movement period, and exposure control for controlling an exposure period of the two-dimensional image sensor, and executes light emission control that causes the light source to emit light with different light emission intensities during the exposure period and during a focus evaluation period in which the focus evaluation information is detected.

Optical Measuring Device and Process

An achromatic 3D STED measuring optical process and optical method, based on a conical diffraction effect or an effect of propagation of light in uniaxial crystals, including a cascade of at least two uniaxial or conical diffraction crystals creating, from a laser source, all of the light propagating along substantially the same optical path, from the output of an optical bank to the objective of a microscope. A spatial position of at least one luminous nano-emitter, structured object or a continuous distribution in a sample is determined.

Reconstruction of the sample and its spatial and/or temporal and/or spectral properties is treated as an inverse Bayesian problem leading to the definition of an a posteriori distribution, and a posteriori relationship combining, by virtue of the Bayes law, the probabilistic formulation of a noise model, and possible priors on a distribution of light created in the sample by projection.

PHASE MODULATION DEVICE AND LASER MICROSCOPE
20170302498 · 2017-10-19 ·

The phase modulation device 3 includes a first phase modulation element 11 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of first electrodes in accordance with a first ratio of a second aberration component to a first aberration component of a wave front aberration generated by an optical system including an objective lens 4; a second phase modulation element 12 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of second electrodes in accordance with a second ratio of the second aberration component to the first aberration component; and a control circuit 13 which controls voltages applied to each of first electrodes and each of second electrodes in accordance with a distance from the objective lens to a light focusing position of the light flux.

MACHINE LEARNING ASSISTED SUPER RESOLUTION MICROSCOPY

A method of providing super-resolved images of a photon emitting particle is disclosed, which includes providing a machine-learning (ML) platform, wherein the ML platform is configured to receive pixel-based sparse autocorrelation data and generate a predicted super-resolved image of a photon emitting particle, receiving photons from the photon emitting particle by two or more photon detectors, each generating an electrical pulse associated with receiving an incident photon thereon, generating sparse autocorrelation data from the two or more photon detectors for each pixel within an image area, and inputting the pixel-based sparse autocorrelation data to the ML platform, thereby generating a predicted super-resolved image of the imaging area, wherein the resolution of the super-resolved image is improved by √n as compared to a classical optical microscope limited by Abbe diffraction limit.