A detection unit (231) detects, based on synthesis result data obtained by logic synthesis on design data of a target circuit, a predicted place where a glitch is predicted to occur in the target circuit. An insertion unit (232) inserts a glitch removal circuit in an output side of the predicted place by making a change to at least one of the synthesis result data and the design data.

A method, programming product, and/or system is disclosed for identifying flaws in integrated circuits, e.g., processors, that includes: selecting from a list of a plurality of timing issues in an integrated circuit, where each timing issue on the list is represented by one or more VHDL code lines, a particular timing issue to investigate; tracing back the selected one or more VHDL code lines, corresponding to the selected particular timing issue to investigate, to one or more selected physical design VHDL (PD-VHDL) code lines; logically navigating across the one or more selected PD-VHDL code lines to one or more corresponding normalized VHDL (NVDHL) code lines; and tracing back the one or more corresponding NHVDL code lines to one or more short-hand VHDL (SVHDL) code lines to identify one or more code lines, written by a code designer, responsible for the particular timing issue being investigated.

A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.

A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.

Simulator includes a first core unit corresponding to the first simulation model, a second core unit corresponding to the second simulation model, a slave block unit for communicating with one of the first core unit and the second core unit, the first core unit and the second core unit and a simulation control unit for causing either to execute instructions. The first core unit includes a high-speed mode instruction execution control unit that stops executing subsequent instructions in response to a request for switching from the first simulation model to the second simulation model, and a transaction monitor unit that monitors whether or not the transaction processing between the first core unit and the slave block unit has been completed. The simulation control unit causes the second core unit to execute instructions in response to a notification of completion of the transaction processing from the transaction monitor unit.

A method for providing an integrated circuit design is disclosed. The method includes receiving and synthesizing a behavioral description of an integrated circuit design. The method includes generating, based on the synthesized behavioral description, a layout by placing and routing a plurality of transistor-based cells. The method includes selectively accessing a cell library that includes a plurality of non-transistor-based cells, each of the plurality of non-transistor-based cells associated with a respective delay value. The method includes updating the layout by inserting one or more of the plurality of non-transistor-based cells.

A method for providing an integrated circuit design is disclosed. The method includes receiving and synthesizing a behavioral description of an integrated circuit design. The method includes generating, based on the synthesized behavioral description, a layout by placing and routing a plurality of transistor-based cells. The method includes selectively accessing a cell library that includes a plurality of non-transistor-based cells, each of the plurality of non-transistor-based cells associated with a respective delay value. The method includes updating the layout by inserting one or more of the plurality of non-transistor-based cells.

A system and method for providing timing and placement co-optimization for engineering change order (ECO) cells is described. According to one embodiment, an ECO for a current design of an integrated circuit is accessed. The ECO includes inserting an ECO cell among placed and routed current cells of the current design. A target region in the current design is identified for placement of the ECO cell, but the target region has insufficient open space to place the ECO cell. At least one current cell will have to be moved in order to place the ECO cell in the target region. Timing slacks for current cells in a neighborhood of the target region are determined. Based on the timing slacks of the current cells, at least one of the current cells is moved to a different location to create sufficient open space to place the ECO cell within the target region.

A system and method for performing operating state analysis of an integrated circuit (IC) design is disclosed. The method includes simulating a switching operation from a first operating state to a second operating state for one or more cells of the IC design using a plurality of vectors corresponding to one or more user-specified constraints. The method include generating a time-based waveform for each cell of the one or more cells changing an operating state from the first operating state to the second operating state, and based on the generated time-based waveform, identifying one or more operating state changes corresponding to the operating state analysis and associated timing window and cell information. The method includes verifying the one or more operating state changes by the each cell of the one or more cells of the IC design meet the one or more user-specified constraints for generating an analysis report.

A system and method for performing operating state analysis of an integrated circuit (IC) design is disclosed. The method includes simulating a switching operation from a first operating state to a second operating state for one or more cells of the IC design using a plurality of vectors corresponding to one or more user-specified constraints. The method include generating a time-based waveform for each cell of the one or more cells changing an operating state from the first operating state to the second operating state, and based on the generated time-based waveform, identifying one or more operating state changes corresponding to the operating state analysis and associated timing window and cell information. The method includes verifying the one or more operating state changes by the each cell of the one or more cells of the IC design meet the one or more user-specified constraints for generating an analysis report.