A light emitting element driving semiconductor integrated circuit constitutes at least a part of a light emitting element driving device arranged to drive a series connection unit including a plurality of light emitting elements. The light emitting element driving semiconductor integrated circuit includes a single-element short-circuit detection unit arranged to detect that one of the plurality of light emitting elements is short-circuited, and a control unit arranged to control a power element of the light emitting element driving device so that current supplied from the light emitting element driving device to the series connection unit is increased, when the single-element short-circuit detection circuit detects that one of the plurality of light emitting elements is short-circuited.

A pulse signal generation circuit includes a clock frequency division component, a time delay component and a selection component. The clock frequency division component is configured to perform frequency division on a clock signal to generate a clock frequency division signal; the time delay component is configured to generate a time delay signal based on the clock frequency division signal; and the selection component is configured to receive the clock frequency division signal and the time delay signal at the same time, and select the clock frequency division signal and the time delay signal according to a preset condition to generate a pulse signal.

An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.

An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.

Methods and apparatus for optimizing a quantum circuit. In one aspect, a method includes identifying one or more sequences of operations in the quantum circuit that un-compute respective qubits on which the quantum circuit operates; generating an adjusted quantum circuit, comprising, for each identified sequence of operations in the quantum circuit, replacing the sequence of operations with an X basis measurement and a classically-controlled phase correction operation, wherein a result of the X basis measurement acts as a control for the classically-controlled correction phase operation; and executing the adjusted quantum circuit.

Methods and apparatus for optimizing a quantum circuit. In one aspect, a method includes identifying one or more sequences of operations in the quantum circuit that un-compute respective qubits on which the quantum circuit operates; generating an adjusted quantum circuit, comprising, for each identified sequence of operations in the quantum circuit, replacing the sequence of operations with an X basis measurement and a classically-controlled phase correction operation, wherein a result of the X basis measurement acts as a control for the classically-controlled correction phase operation; and executing the adjusted quantum circuit.

Disclosed herein is a semiconductor device that includes an access control circuit generating an internal command based on a verification result signal and an external command. The external command indicates at least one of a first command that enables the access control circuit to access a first circuit and a second command that enables the access control circuit not to access the first circuit or enables the access control circuit to maintain a current state of the first circuit. The access control circuit, when the verification result signal indicates a first logic level, generates the internal command based on the external command. The access control circuit, when the verification result signal indicates a second logic level, generates the internal command that corresponds to a second command even if the external command indicates a first command.

Disclosed herein is a semiconductor device that includes an access control circuit generating an internal command based on a verification result signal and an external command. The external command indicates at least one of a first command that enables the access control circuit to access a first circuit and a second command that enables the access control circuit not to access the first circuit or enables the access control circuit to maintain a current state of the first circuit. The access control circuit, when the verification result signal indicates a first logic level, generates the internal command based on the external command. The access control circuit, when the verification result signal indicates a second logic level, generates the internal command that corresponds to a second command even if the external command indicates a first command.

Systems, apparatuses, and methods related to a neuron built with posits are described. An example system may include a memory device and the memory device may include a plurality of memory cells. The plurality of memory cells can store data including a bit string in an analog format. A neuromorphic operation can be performed on the data in the analog format. The example system may include an analog to digital converter coupled to the memory device. The analog to digital converter may convert the bit string in the analog format stored in at least one of the plurality of memory cells to a format that supports arithmetic operations to a particular level of precision.

Systems, apparatuses, and methods related to a neuron built with posits are described. An example system may include a memory device and the memory device may include a plurality of memory cells. The plurality of memory cells can store data including a bit string in an analog format. A neuromorphic operation can be performed on the data in the analog format. The example system may include an analog to digital converter coupled to the memory device. The analog to digital converter may convert the bit string in the analog format stored in at least one of the plurality of memory cells to a format that supports arithmetic operations to a particular level of precision.